Abstract:A variety of scanning probe techniques are now available to image surfaces on an atomic scale including atomic force microscopy (AFM), scanning tunneling microscopy (STM), and ballistic electron energ...A variety of scanning probe techniques are now available to image surfaces on an atomic scale including atomic force microscopy (AFM), scanning tunneling microscopy (STM), and ballistic electron energy microscopy (BEEM). These combined with other surface science techniques and theory, these scanning probe techniques provide many valuable tools to understand the electronic, chemical, and structural properties of surfaces. AFM is now a widely used technique to measure surface morphology as well as tribological, electrical, and magnetic forces, all on a nanometer scale. STM has had an enormous impact on the study of electronic material surfaces. The STM's tip can also be used to move atoms across surfaces and position them in arrays that display quantum interference and that can be used to construct electrical circuits at the atomic level. BEEM is a scanning probe technique that reveals electronic features of semiconductor surfaces and metal-semiconductor interfaces.Read More
Publication Year: 2016
Publication Date: 2016-05-20
Language: en
Type: other
Indexed In: ['crossref']
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Cited By Count: 2
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