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{'id': 'https://openalex.org/W1993749717', 'doi': 'https://doi.org/10.1063/1.99515', 'title': 'Direct force measurement in scanning tunneling microscopy', 'display_name': 'Direct force measurement in scanning tunneling microscopy', 'publication_year': 1988, 'publication_date': '1988-01-18', 'ids': {'openalex': 'https://openalex.org/W1993749717', 'doi': 'https://doi.org/10.1063/1.99515', 'mag': '1993749717'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1063/1.99515', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S105243760', 'display_name': 'Applied Physics Letters', 'issn_l': '0003-6951', 'issn': ['0003-6951', '1077-3118', '1520-8842'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320257', 'host_organization_name': 'American Institute of Physics', 'host_organization_lineage': ['https://openalex.org/P4310320257'], 'host_organization_lineage_names': ['American Institute of Physics'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5108495905', 'display_name': 'S. L. Tang', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I1283103587', 'display_name': 'AT&T (United States)', 'ror': 'https://ror.org/02bbd5539', 'country_code': 'US', 'type': 'company', 'lineage': ['https://openalex.org/I1283103587']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'S. L. Tang', 'raw_affiliation_strings': ['AT&T Bell Laboratories, Holmdel, New Jersey 07733'], 'affiliations': [{'raw_affiliation_string': 'AT&T Bell Laboratories, Holmdel, New Jersey 07733', 'institution_ids': ['https://openalex.org/I1283103587']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5018019857', 'display_name': 'Jeffrey Bokor', 'orcid': 'https://orcid.org/0000-0002-4541-0156'}, 'institutions': [{'id': 'https://openalex.org/I1283103587', 'display_name': 'AT&T (United States)', 'ror': 'https://ror.org/02bbd5539', 'country_code': 'US', 'type': 'company', 'lineage': ['https://openalex.org/I1283103587']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'J. Bokor', 'raw_affiliation_strings': ['AT&T Bell Laboratories, Holmdel, New Jersey 07733'], 'affiliations': [{'raw_affiliation_string': 'AT&T Bell Laboratories, Holmdel, New Jersey 07733', 'institution_ids': ['https://openalex.org/I1283103587']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5111086621', 'display_name': 'R. H. Storz', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I1283103587', 'display_name': 'AT&T (United States)', 'ror': 'https://ror.org/02bbd5539', 'country_code': 'US', 'type': 'company', 'lineage': ['https://openalex.org/I1283103587']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'R. H. Storz', 'raw_affiliation_strings': ['AT&T Bell Laboratories, Holmdel, New Jersey 07733'], 'affiliations': [{'raw_affiliation_string': 'AT&T Bell Laboratories, Holmdel, New Jersey 07733', 'institution_ids': ['https://openalex.org/I1283103587']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 3.409, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 36, 'citation_normalized_percentile': {'value': 0.783448, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 90, 'max': 91}, 'biblio': {'volume': '52', 'issue': '3', 'first_page': '188', 'last_page': '190'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11449', 'display_name': 'Mechanical and Optical Resonators', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13531', 'display_name': 'Surface and Thin Film Phenomena', 'score': 0.9993, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/scanning-probe-microscopy', 'display_name': 'Scanning Probe Microscopy', 'score': 0.60739756}, {'id': 'https://openalex.org/keywords/electrostatic-force-microscope', 'display_name': 'Electrostatic force microscope', 'score': 0.5232179}], 'concepts': [{'id': 'https://openalex.org/C206008964', 'wikidata': 'https://www.wikidata.org/wiki/Q5159384', 'display_name': 'Conductive atomic force microscopy', 'level': 3, 'score': 0.9162665}, {'id': 'https://openalex.org/C6518042', 'wikidata': 'https://www.wikidata.org/wiki/Q175646', 'display_name': 'Scanning tunneling microscope', 'level': 2, 'score': 0.8200793}, {'id': 'https://openalex.org/C71246147', 'wikidata': 'https://www.wikidata.org/wiki/Q16029538', 'display_name': 'Non-contact atomic force microscopy', 'level': 4, 'score': 0.8089746}, {'id': 'https://openalex.org/C542268612', 'wikidata': 'https://www.wikidata.org/wiki/Q743', 'display_name': 'Tungsten', 'level': 2, 'score': 0.65163827}, {'id': 'https://openalex.org/C120398109', 'wikidata': 'https://www.wikidata.org/wiki/Q175751', 'display_name': 'Quantum tunnelling', 'level': 2, 'score': 0.62582767}, {'id': 'https://openalex.org/C36628996', 'wikidata': 'https://www.wikidata.org/wiki/Q907287', 'display_name': 'Scanning probe microscopy', 'level': 2, 'score': 0.60739756}, {'id': 'https://openalex.org/C2779698641', 'wikidata': 'https://www.wikidata.org/wiki/Q5309', 'display_name': 'Graphite', 'level': 2, 'score': 0.60571885}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.5940233}, {'id': 'https://openalex.org/C16777580', 'wikidata': 'https://www.wikidata.org/wiki/Q7430068', 'display_name': 'Scanning ion-conductance microscopy', 'level': 4, 'score': 0.58660215}, {'id': 'https://openalex.org/C2777289219', 'wikidata': 'https://www.wikidata.org/wiki/Q7632154', 'display_name': 'Substrate (aquarium)', 'level': 2, 'score': 0.57145154}, {'id': 'https://openalex.org/C181635281', 'wikidata': 'https://www.wikidata.org/wiki/Q2799395', 'display_name': 'Magnetic force microscope', 'level': 4, 'score': 0.5455945}, {'id': 'https://openalex.org/C147080431', 'wikidata': 'https://www.wikidata.org/wiki/Q1074953', 'display_name': 'Microscopy', 'level': 2, 'score': 0.5448144}, {'id': 'https://openalex.org/C194577767', 'wikidata': 'https://www.wikidata.org/wiki/Q1651687', 'display_name': 'Scanning tunneling spectroscopy', 'level': 3, 'score': 0.54035854}, {'id': 'https://openalex.org/C83898325', 'wikidata': 'https://www.wikidata.org/wiki/Q1324110', 'display_name': 'Kelvin probe force microscope', 'level': 3, 'score': 0.5362304}, {'id': 'https://openalex.org/C55143465', 'wikidata': 'https://www.wikidata.org/wiki/Q7577411', 'display_name': 'Spin polarized scanning tunneling microscopy', 'level': 4, 'score': 0.5350389}, {'id': 'https://openalex.org/C147230242', 'wikidata': 'https://www.wikidata.org/wiki/Q5358564', 'display_name': 'Electrostatic force microscope', 'level': 3, 'score': 0.5232179}, {'id': 'https://openalex.org/C43826995', 'wikidata': 'https://www.wikidata.org/wiki/Q17014103', 'display_name': 'Atomic force acoustic microscopy', 'level': 5, 'score': 0.5225291}, {'id': 'https://openalex.org/C5408304', 'wikidata': 'https://www.wikidata.org/wiki/Q5357978', 'display_name': 'Electrochemical scanning tunneling microscope', 'level': 4, 'score': 0.51340234}, {'id': 'https://openalex.org/C82764429', 'wikidata': 'https://www.wikidata.org/wiki/Q7187730', 'display_name': 'Photoconductive atomic force microscopy', 'level': 5, 'score': 0.5087107}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.48406592}, {'id': 'https://openalex.org/C99752389', 'wikidata': 'https://www.wikidata.org/wiki/Q9337610', 'display_name': 'Scanning capacitance microscopy', 'level': 4, 'score': 0.48058677}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.37337992}, {'id': 'https://openalex.org/C102951782', 'wikidata': 'https://www.wikidata.org/wiki/Q49295', 'display_name': 'Atomic force microscopy', 'level': 2, 'score': 0.35137147}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.29818016}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.20619681}, {'id': 'https://openalex.org/C26771246', 'wikidata': 'https://www.wikidata.org/wiki/Q321095', 'display_name': 'Scanning electron microscope', 'level': 2, 'score': 0.19853052}, {'id': 'https://openalex.org/C187921700', 'wikidata': 'https://www.wikidata.org/wiki/Q7430074', 'display_name': 'Scanning confocal electron microscopy', 'level': 3, 'score': 0.18231872}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.1458515}, {'id': 'https://openalex.org/C191897082', 'wikidata': 'https://www.wikidata.org/wiki/Q11467', 'display_name': 'Metallurgy', 'level': 1, 'score': 0.067750424}, {'id': 'https://openalex.org/C111368507', 'wikidata': 'https://www.wikidata.org/wiki/Q43518', 'display_name': 'Oceanography', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C32546565', 'wikidata': 'https://www.wikidata.org/wiki/Q856711', 'display_name': 'Magnetization', 'level': 3, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C115260700', 'wikidata': 'https://www.wikidata.org/wiki/Q11408', 'display_name': 'Magnetic field', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C127313418', 'wikidata': 'https://www.wikidata.org/wiki/Q1069', 'display_name': 'Geology', 'level': 0, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1063/1.99515', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S105243760', 'display_name': 'Applied Physics Letters', 'issn_l': '0003-6951', 'issn': ['0003-6951', '1077-3118', '1520-8842'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320257', 'host_organization_name': 'American Institute of Physics', 'host_organization_lineage': ['https://openalex.org/P4310320257'], 'host_organization_lineage_names': ['American Institute of Physics'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 11, 'referenced_works': ['https://openalex.org/W1992358240', 'https://openalex.org/W2000661122', 'https://openalex.org/W2003988271', 'https://openalex.org/W2035501550', 'https://openalex.org/W2048407856', 'https://openalex.org/W2067326868', 'https://openalex.org/W2072620858', 'https://openalex.org/W2074398939', 'https://openalex.org/W2075100732', 'https://openalex.org/W2076111440', 'https://openalex.org/W3150248096'], 'related_works': ['https://openalex.org/W99870850', 'https://openalex.org/W50546085', 'https://openalex.org/W4251270218', 'https://openalex.org/W2278491674', 'https://openalex.org/W2083769693', 'https://openalex.org/W2075902303', 'https://openalex.org/W1993749717', 'https://openalex.org/W1969648757', 'https://openalex.org/W1861838190', 'https://openalex.org/W1486910393'], 'abstract_inverted_index': {'A': [0], 'novel': [1], 'force': [2, 32, 79, 98], 'measurement': [3], 'using': [4], 'a': [5, 10, 20, 24, 29, 50, 67, 78, 89], 'scanning': [6], 'tunneling': [7, 18], 'microscope': [8], 'as': [9, 66], 'forced': [11], 'oscillator': [12], 'is': [13], 'described.': [14], 'Results': [15], 'obtained': [16], 'from': [17], 'between': [19, 60], 'tungsten': [21], 'tip': [22, 61], 'and': [23, 62, 84], 'graphite': [25], 'substrate': [26, 63], 'show': [27], 'that': [28], 'maximum': [30], 'tip-sample': [31, 71], 'about': [33], '10−6': [34], 'N': [35, 83], 'exists': [36], 'during': [37], 'the': [38], 'constant': [39], 'current': [40], 'mode': [41], 'of': [42, 69, 81, 96], 'operation.': [43], 'These': [44], 'results': [45], 'are': [46], 'in': [47], 'agreement': [48], 'with': [49], 'previous': [51], 'model': [52], 'where': [53], 'large': [54, 70], 'contact': [55], 'areas': [56], 'insulated': [57], 'by': [58], 'contaminants': [59], 'were': [64], 'suggested': [65], 'cause': [68], 'interaction': [72], 'forces.': [73], 'This': [74], 'method': [75], 'can': [76], 'achieve': [77], 'sensitivity': [80], '10−8': [82], 'for': [85], 'conductive': [86], 'substrates': [87], 'provide': [88], 'simple,': [90], 'versatile': [91], 'alternative': [92], 'to': [93], 'existing': [94], 'methods': [95], 'atomic': [97], 'microscopy.': [99]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1993749717', 'counts_by_year': [{'year': 2021, 'cited_by_count': 1}, {'year': 2016, 'cited_by_count': 1}], 'updated_date': '2024-12-14T22:17:38.403404', 'created_date': '2016-06-24'}