Title: Magnetic Field Effect in Scanning Tunneling Microscopy
Abstract:1 Introduction Scanning tunneling microscopy (STM) attracts increasing interest in surface information research with atomic resolution. Since the pioneer work of G. Binnig and H. Rohrer, it has been d...1 Introduction Scanning tunneling microscopy (STM) attracts increasing interest in surface information research with atomic resolution. Since the pioneer work of G. Binnig and H. Rohrer, it has been developed rapidly in this field. Many new instruments have been invented such as atomic force microscopy (AFM), scanning tunneling potentiometry (STP), scanning near field optical microscopy (SNOM) and ballistic electron emission microscopy (BEEM).Read More
Publication Year: 1993
Publication Date: 1993-12-15
Language: en
Type: article
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Cited By Count: 1
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