Publication Information

{'id': 'https://openalex.org/W2765064521', 'doi': None, 'title': 'Scanning Auger Electron Microscopy Evaluation and Composition Control of Cantilevers for Ultrahigh Vacuum Atomic Force Microscopy ( Scanning Tunneling Microscopy)', 'display_name': 'Scanning Auger Electron Microscopy Evaluation and Composition Control of Cantilevers for Ultrahigh Vacuum Atomic Force Microscopy ( Scanning Tunneling Microscopy)', 'publication_year': 1997, 'publication_date': '1997-06-30', 'ids': {'openalex': 'https://openalex.org/W2765064521', 'mag': '2765064521'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'http://ci.nii.ac.jp/naid/110003947071', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306514835', 'display_name': 'Japanese journal of applied physics. Pt. 1, Regular papers & short notes', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': [], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5073778288', 'display_name': 'Toyoko Arai', 'orcid': 'https://orcid.org/0000-0003-2665-8153'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Toyoko Arai', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5019286037', 'display_name': 'Masahiko Tomitori', 'orcid': 'https://orcid.org/0000-0002-4091-3571'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Masahiko Tomitori', 'raw_affiliation_strings': [], 'affiliations': []}], 'institution_assertions': [], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': False, 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 55}, 'biblio': {'volume': '36', 'issue': '6', 'first_page': '3855', 'last_page': '3859'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 0.9995, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 0.9995, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13552', 'display_name': 'Advanced Materials Characterization Techniques', 'score': 0.9988, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13531', 'display_name': 'Surface and Thin Film Phenomena', 'score': 0.9912, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/scanning-probe-microscopy', 'display_name': 'Scanning Probe Microscopy', 'score': 0.4920954}, {'id': 'https://openalex.org/keywords/auger-electron-spectroscopy', 'display_name': 'Auger electron spectroscopy', 'score': 0.4214821}], 'concepts': [{'id': 'https://openalex.org/C206008964', 'wikidata': 'https://www.wikidata.org/wiki/Q5159384', 'display_name': 'Conductive atomic force microscopy', 'level': 3, 'score': 0.6872156}, {'id': 'https://openalex.org/C6518042', 'wikidata': 'https://www.wikidata.org/wiki/Q175646', 'display_name': 'Scanning tunneling microscope', 'level': 2, 'score': 0.6823557}, {'id': 'https://openalex.org/C147080431', 'wikidata': 'https://www.wikidata.org/wiki/Q1074953', 'display_name': 'Microscopy', 'level': 2, 'score': 0.6460464}, {'id': 'https://openalex.org/C187921700', 'wikidata': 'https://www.wikidata.org/wiki/Q7430074', 'display_name': 'Scanning confocal electron microscopy', 'level': 3, 'score': 0.6342586}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.5832077}, {'id': 'https://openalex.org/C16777580', 'wikidata': 'https://www.wikidata.org/wiki/Q7430068', 'display_name': 'Scanning ion-conductance microscopy', 'level': 4, 'score': 0.5816461}, {'id': 'https://openalex.org/C26771246', 'wikidata': 'https://www.wikidata.org/wiki/Q321095', 'display_name': 'Scanning electron microscope', 'level': 2, 'score': 0.57033277}, {'id': 'https://openalex.org/C82764429', 'wikidata': 'https://www.wikidata.org/wiki/Q7187730', 'display_name': 'Photoconductive atomic force microscopy', 'level': 5, 'score': 0.5536481}, {'id': 'https://openalex.org/C99752389', 'wikidata': 'https://www.wikidata.org/wiki/Q9337610', 'display_name': 'Scanning capacitance microscopy', 'level': 4, 'score': 0.51479435}, {'id': 'https://openalex.org/C2780646311', 'wikidata': 'https://www.wikidata.org/wiki/Q1142501', 'display_name': 'Auger', 'level': 2, 'score': 0.500721}, {'id': 'https://openalex.org/C93877712', 'wikidata': 'https://www.wikidata.org/wiki/Q132560', 'display_name': 'Electron microscope', 'level': 2, 'score': 0.500478}, {'id': 'https://openalex.org/C36628996', 'wikidata': 'https://www.wikidata.org/wiki/Q907287', 'display_name': 'Scanning probe microscopy', 'level': 2, 'score': 0.4920954}, {'id': 'https://openalex.org/C102951782', 'wikidata': 'https://www.wikidata.org/wiki/Q49295', 'display_name': 'Atomic force microscopy', 'level': 2, 'score': 0.4574023}, {'id': 'https://openalex.org/C83898325', 'wikidata': 'https://www.wikidata.org/wiki/Q1324110', 'display_name': 'Kelvin probe force microscope', 'level': 3, 'score': 0.44737402}, {'id': 'https://openalex.org/C25442681', 'wikidata': 'https://www.wikidata.org/wiki/Q28087', 'display_name': 'Auger electron spectroscopy', 'level': 2, 'score': 0.4214821}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.3927216}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.28215292}, {'id': 'https://openalex.org/C184779094', 'wikidata': 'https://www.wikidata.org/wiki/Q26383', 'display_name': 'Atomic physics', 'level': 1, 'score': 0.27525854}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.19736284}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.072001874}, {'id': 'https://openalex.org/C185544564', 'wikidata': 'https://www.wikidata.org/wiki/Q81197', 'display_name': 'Nuclear physics', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'http://ci.nii.ac.jp/naid/110003947071', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306514835', 'display_name': 'Japanese journal of applied physics. Pt. 1, Regular papers & short notes', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W88948087', 'https://openalex.org/W6367907', 'https://openalex.org/W624814569', 'https://openalex.org/W3045886114', 'https://openalex.org/W2743361113', 'https://openalex.org/W2510013900', 'https://openalex.org/W2492142028', 'https://openalex.org/W2489547315', 'https://openalex.org/W2468573684', 'https://openalex.org/W2160085298', 'https://openalex.org/W2087771054', 'https://openalex.org/W2067363274', 'https://openalex.org/W2042249352', 'https://openalex.org/W2041125085', 'https://openalex.org/W2029583819', 'https://openalex.org/W2027111303', 'https://openalex.org/W2014669207', 'https://openalex.org/W1989771773', 'https://openalex.org/W1969380141', 'https://openalex.org/W1605364971'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2765064521', 'counts_by_year': [], 'updated_date': '2024-12-14T22:37:36.499129', 'created_date': '2017-10-27'}