Publication Information

{'id': 'https://openalex.org/W2124030650', 'doi': 'https://doi.org/10.1109/icr.2001.984853', 'title': 'Built-in self-testing based on compressed 2-dimensional signature analysis', 'display_name': 'Built-in self-testing based on compressed 2-dimensional signature analysis', 'publication_year': 2002, 'publication_date': '2002-11-13', 'ids': {'openalex': 'https://openalex.org/W2124030650', 'doi': 'https://doi.org/10.1109/icr.2001.984853', 'mag': '2124030650'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/icr.2001.984853', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'proceedings-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5061637820', 'display_name': 'Cai Chenxi', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I99065089', 'display_name': 'Tsinghua University', 'ror': 'https://ror.org/03cve4549', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I99065089']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'None Cai Chenxi', 'raw_affiliation_strings': ['Department of Electronic Engineering, Tsinghua University, Beijing, China'], 'affiliations': [{'raw_affiliation_string': 'Department of Electronic Engineering, Tsinghua University, Beijing, China', 'institution_ids': ['https://openalex.org/I99065089']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5090278324', 'display_name': 'Xiutan Wang', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I99065089', 'display_name': 'Tsinghua University', 'ror': 'https://ror.org/03cve4549', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I99065089']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'None Wang Xiutan', 'raw_affiliation_strings': ['Department of Electronic Engineering, Tsinghua University, Beijing, China'], 'affiliations': [{'raw_affiliation_string': 'Department of Electronic Engineering, Tsinghua University, Beijing, China', 'institution_ids': ['https://openalex.org/I99065089']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5110123694', 'display_name': 'Peng Yingning', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I99065089', 'display_name': 'Tsinghua University', 'ror': 'https://ror.org/03cve4549', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I99065089']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'None Peng Yingning', 'raw_affiliation_strings': ['Department of Electronic Engineering, Tsinghua University, Beijing, China'], 'affiliations': [{'raw_affiliation_string': 'Department of Electronic Engineering, Tsinghua University, Beijing, China', 'institution_ids': ['https://openalex.org/I99065089']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 2, 'citation_normalized_percentile': {'value': 0.237589, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 64, 'max': 68}, 'biblio': {'volume': None, 'issue': None, 'first_page': '885', 'last_page': '888'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T11032', 'display_name': 'VLSI and Analog Circuit Testing', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/1708', 'display_name': 'Hardware and Architecture'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T11032', 'display_name': 'VLSI and Analog Circuit Testing', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/1708', 'display_name': 'Hardware and Architecture'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T14117', 'display_name': 'Integrated Circuits and Semiconductor Failure Analysis', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13293', 'display_name': 'Engineering and Test Systems', 'score': 0.9974, 'subfield': {'id': 'https://openalex.org/subfields/2207', 'display_name': 'Control and Systems Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/maintainability', 'display_name': 'Maintainability', 'score': 0.8633957}, {'id': 'https://openalex.org/keywords/signature', 'display_name': 'Signature (topology)', 'score': 0.84180844}, {'id': 'https://openalex.org/keywords/built-in-self-test', 'display_name': 'Built-in self-test', 'score': 0.81590956}, {'id': 'https://openalex.org/keywords/isolation', 'display_name': 'Isolation', 'score': 0.45073617}, {'id': 'https://openalex.org/keywords/orthogonal-array-testing', 'display_name': 'Orthogonal array testing', 'score': 0.41931215}], 'concepts': [{'id': 'https://openalex.org/C160713754', 'wikidata': 'https://www.wikidata.org/wiki/Q1389965', 'display_name': 'Maintainability', 'level': 2, 'score': 0.8633957}, {'id': 'https://openalex.org/C2779696439', 'wikidata': 'https://www.wikidata.org/wiki/Q7512811', 'display_name': 'Signature (topology)', 'level': 2, 'score': 0.84180844}, {'id': 'https://openalex.org/C2780980493', 'wikidata': 'https://www.wikidata.org/wiki/Q181142', 'display_name': 'Built-in self-test', 'level': 2, 'score': 0.81590956}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.6708168}, {'id': 'https://openalex.org/C43214815', 'wikidata': 'https://www.wikidata.org/wiki/Q7310987', 'display_name': 'Reliability (semiconductor)', 'level': 3, 'score': 0.5211722}, {'id': 'https://openalex.org/C152745839', 'wikidata': 'https://www.wikidata.org/wiki/Q5438153', 'display_name': 'Fault detection and isolation', 'level': 3, 'score': 0.4684774}, {'id': 'https://openalex.org/C2775941552', 'wikidata': 'https://www.wikidata.org/wiki/Q25212305', 'display_name': 'Isolation (microbiology)', 'level': 2, 'score': 0.45073617}, {'id': 'https://openalex.org/C149635348', 'wikidata': 'https://www.wikidata.org/wiki/Q193040', 'display_name': 'Embedded system', 'level': 1, 'score': 0.44027326}, {'id': 'https://openalex.org/C158324730', 'wikidata': 'https://www.wikidata.org/wiki/Q54862604', 'display_name': 'Orthogonal array testing', 'level': 5, 'score': 0.41931215}, {'id': 'https://openalex.org/C36503486', 'wikidata': 'https://www.wikidata.org/wiki/Q11235244', 'display_name': 'Domain (mathematical analysis)', 'level': 2, 'score': 0.41792625}, {'id': 'https://openalex.org/C200601418', 'wikidata': 'https://www.wikidata.org/wiki/Q2193887', 'display_name': 'Reliability engineering', 'level': 1, 'score': 0.33602226}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.2151101}, {'id': 'https://openalex.org/C154945302', 'wikidata': 'https://www.wikidata.org/wiki/Q11660', 'display_name': 'Artificial intelligence', 'level': 1, 'score': 0.13335878}, {'id': 'https://openalex.org/C2777904410', 'wikidata': 'https://www.wikidata.org/wiki/Q7397', 'display_name': 'Software', 'level': 2, 'score': 0.12584648}, {'id': 'https://openalex.org/C163258240', 'wikidata': 'https://www.wikidata.org/wiki/Q25342', 'display_name': 'Power (physics)', 'level': 2, 'score': 0.08610812}, {'id': 'https://openalex.org/C33923547', 'wikidata': 'https://www.wikidata.org/wiki/Q395', 'display_name': 'Mathematics', 'level': 0, 'score': 0.07722932}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C2524010', 'wikidata': 'https://www.wikidata.org/wiki/Q8087', 'display_name': 'Geometry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C115903868', 'wikidata': 'https://www.wikidata.org/wiki/Q80993', 'display_name': 'Software engineering', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C89423630', 'wikidata': 'https://www.wikidata.org/wiki/Q7193', 'display_name': 'Microbiology', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C172707124', 'wikidata': 'https://www.wikidata.org/wiki/Q423488', 'display_name': 'Actuator', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C86803240', 'wikidata': 'https://www.wikidata.org/wiki/Q420', 'display_name': 'Biology', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C134306372', 'wikidata': 'https://www.wikidata.org/wiki/Q7754', 'display_name': 'Mathematical analysis', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C186846655', 'wikidata': 'https://www.wikidata.org/wiki/Q3398377', 'display_name': 'Software construction', 'level': 4, 'score': 0.0}, {'id': 'https://openalex.org/C199360897', 'wikidata': 'https://www.wikidata.org/wiki/Q9143', 'display_name': 'Programming language', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C149091818', 'wikidata': 'https://www.wikidata.org/wiki/Q2429814', 'display_name': 'Software system', 'level': 3, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/icr.2001.984853', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 4, 'referenced_works': ['https://openalex.org/W150546327', 'https://openalex.org/W2103852339', 'https://openalex.org/W2543916146', 'https://openalex.org/W323249274'], 'related_works': ['https://openalex.org/W94095720', 'https://openalex.org/W4232477441', 'https://openalex.org/W2167371017', 'https://openalex.org/W2129499974', 'https://openalex.org/W2124030650', 'https://openalex.org/W2115073733', 'https://openalex.org/W2102771100', 'https://openalex.org/W1995595470', 'https://openalex.org/W1971099700', 'https://openalex.org/W1957262448'], 'abstract_inverted_index': {'The': [0, 49], 'design': [1, 26], 'of': [2, 51, 55], 'modern': [3], 'electronic': [4], 'systems': [5], 'demands': [6], 'high': [7, 66], 'system': [8], 'reliability': [9], 'and': [10, 19, 53, 83, 94], 'maintainability.': [11], 'In': [12], 'order': [13], 'to': [14, 25, 33], 'perform': [15], 'fault': [16], 'detection,': [17], 'localization': [18], 'isolation': [20], 'effectively,': [21], 'it': [22, 95], 'is': [23, 92], 'necessary': [24], 'a': [27, 40, 65, 75], 'built-in': [28], 'self-testing': [29], '(BIST)': [30], 'module': [31], 'specific': [32], 'the': [34, 62], 'corresponding': [35], 'system.': [36], 'This': [37], 'paper': [38], 'presents': [39], 'BIST': [41], 'method': [42, 91], 'based.': [43], 'on': [44], 'compressed': [45, 78], '2-dimensional': [46], 'signature': [47, 77], 'analysis.': [48], 'principle': [50], 'compression': [52], 'performance': [54], 'test': [56], 'are': [57], 'discussed': [58], 'in': [59, 79, 100], 'detail.': [60], 'Using': [61], 'presented': [63], 'method,': [64], 'faulty': [67], 'coverage': [68], 'ratio': [69], '(FCR)': [70], 'can': [71, 96], 'be': [72, 97], 'achieved': [73], 'with': [74], 'short': [76], 'both': [80], 'time': [81], 'domain': [82], 'space': [84], 'domain.': [85], 'Theoretical': [86], 'analysis': [87], 'shows': [88], 'that': [89], 'this': [90], 'reliable': [93], 'easily': [98], 'implemented': [99], 'hardware.': [101]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2124030650', 'counts_by_year': [], 'updated_date': '2024-12-10T04:12:03.180073', 'created_date': '2016-06-24'}