Title: Evaluation of detectability in BIST environment
Abstract:Built-in self-test (BIST) technique is now widely applied. How to estimate its testing capabilities is an important problem. BIST detectability is defined as the probability of that a fault set of the...Built-in self-test (BIST) technique is now widely applied. How to estimate its testing capabilities is an important problem. BIST detectability is defined as the probability of that a fault set of the circuit-under-test is detected. It depends on the properties of the test at, circuit-under-test, as well as the signature analyser as a data compressor. The detectability of a signature analyzer is evaluated. The random and pseudorandom testing techniques are examined for their BIST detectability and several results are derived.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>Read More
Publication Year: 2002
Publication Date: 2002-12-09
Language: en
Type: article
Indexed In: ['crossref']
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