Integrated Circuits and Semiconductor Failure Analysis - AILBRY

Results for 'Integrated Circuits and Semiconductor Failure Analysis' :

Failure analysis of semiconductor integrated circuits

Publication Year: 1970

DOI: https://doi.org/10.1016/0026-2714(70)90253-2

Abstract:

Authors:
- Philip Holmes
- I. C. Jennings
Intermittent faults and effects on reliability of integrated circuits

Publication Year: 2008

DOI: https://doi.org/10.1109/rams.2008.4925824

Abstract:

Authors:
- Cris S. Constantinescu
Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancement

Publication Year: 2015

DOI: https://doi.org/10.1080/00207543.2015.1109153

Abstract:

Authors:
- Chen–Fu Chien
- Chiao-Wen Liu
- Shih‐Chung Chuang
Magnetic Field Fingerprinting of Integrated-Circuit Activity with a Quantum Diamond Microscope

Publication Year: 2020

DOI: https://doi.org/10.1103/physrevapplied.14.014097

Abstract:

Authors:
- Matthew Turner
- Nicholas Langellier
- Rachel Bainbridge
- Dan Walters
- Srujan Meesala
- Thomas M. Babinec
- Pauli Kehayias
- Amir Yacoby
- Evelyn L. Hu
- Marko Lončar
- Ronald L. Walsworth
- Edlyn V. Levine
Technological Discontinuities and Organizational Environments

Publication Year: 1986

DOI: https://doi.org/10.2307/2392832

Abstract:

Authors:
- Michael L. Tushman
- Philip C. Anderson
Transient‐Induced Latchup in CMOS Integrated Circuits

Publication Year: 2009

DOI: https://doi.org/10.1002/9780470824092

Abstract:

Authors:
- Ming‐Dou Ker
- Sheng‐Fu Hsu
Review of THz-based semiconductor assurance

Publication Year: 2021

DOI: https://doi.org/10.1117/1.oe.60.6.060901

Abstract:

Authors:
- John True
- Chengjie Xi
- Nathan Jessurun
- Kiarash Ahi
- Navid Asadizanjani
Physical Inspection & Attacks: New Frontier in Hardware Security

Publication Year: 2018

DOI: https://doi.org/10.1109/ivsw.2018.8494856

Abstract:

Authors:
- Mir Tanjidur Rahman
- Qihang Shi
- Shahin Tajik
- Haoting Shen
- Damon L. Woodard
- Mark Tehranipoor
- Navid Asadizanjani
Performance of Digital Integrated Circuit Technologies at Very High Temperatures

Publication Year: 1980

DOI: https://doi.org/10.1109/tchmt.1980.1135643

Abstract:

Authors:
- J.L. Prince
- B.L. Draper
- E. A. Rapp
- J.W. Kronberg
- L. T. Fitch
Modelling and analysis of wafer fabrication scheduling via generalized stochastic Petri net and simulated annealing

Publication Year: 2003

DOI: https://doi.org/10.1080/0020754031000118152

Abstract:

Authors:
- Vipul Jain
- Rahul Swarnkar
- Manoj Kumar Tiwari
A Memory Built-In Self-Repair Scheme Based on Configurable Spares

Publication Year: 2011

DOI: https://doi.org/10.1109/tcad.2011.2106812

Abstract:

Authors:
- Mincent Lee
- Li-Ming Denq
- Cheng‐Wen Wu
SRAM Circuit-Failure Modeling and Reliability Simulation With SPICE

Publication Year: 2006

DOI: https://doi.org/10.1109/tdmr.2006.876568

Abstract:

Authors:
- Xiaoling Li
- Jin Qin
- Bing Huang
- X. Zhang
- J.B. Bernstein
The Materiality of Microelectronics

Publication Year: 2006

DOI: https://doi.org/10.1080/07341510600803440

Abstract:

Authors:
- Christophe Lécuyer
- David C. Brock
The Backboard Wiring Problem: A Placement Algorithm

Publication Year: 1961

DOI: https://doi.org/10.1137/1003003

Abstract:

Authors:
- Leon Steinberg
Fundamentals of electron beam testing of integrated circuits

Publication Year: 1983

DOI: https://doi.org/10.1002/sca.4950050301

Abstract:

Authors:
- Eberhard Menzel
- E. Kubalek

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Results for 'Integrated Circuits and Semiconductor Failure Analysis' :

Failure analysis of semiconductor integrated circuits

Intermittent faults and effects on reliability of integrated circuits

Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancement

Magnetic Field Fingerprinting of Integrated-Circuit Activity with a Quantum Diamond Microscope

Technological Discontinuities and Organizational Environments

Transient‐Induced Latchup in CMOS Integrated Circuits

Review of THz-based semiconductor assurance

Physical Inspection &amp; Attacks: New Frontier in Hardware Security

Performance of Digital Integrated Circuit Technologies at Very High Temperatures

Modelling and analysis of wafer fabrication scheduling via generalized stochastic Petri net and simulated annealing

A Memory Built-In Self-Repair Scheme Based on Configurable Spares

SRAM Circuit-Failure Modeling and Reliability Simulation With SPICE

The Materiality of Microelectronics

The Backboard Wiring Problem: A Placement Algorithm

Fundamentals of electron beam testing of integrated circuits

What is Boolean Searches

Example Search

Physical Inspection & Attacks: New Frontier in Hardware Security