A study on signature analyzer for design for test (DFT)

Name: Work Video:
Duration: 3 min 30 s
Description: This paper takes a look at the use of linear feedback shift registers (LFSRs) as test pattern generators (TPGs) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences of the same set of test patterns.
Abu Khari A’ain; Chee-How Lim; K. H. Ng; Sheng Kwang Ng; Liew Eng Yew
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