Abstract: This paper presents a new approach for performing logic BIST diagnosis exclusively using MISR signatures. Unlike conventional logic BIST diagnosis approaches which require either huge test time or complicated logic BIST design and ATE flow, signature based diagnosis does not require dynamically changing MISR operations for each failing device. Our experimental data shows that signature based diagnosis can achieve similar diagnosis resolution with manageable diagnosis run time while eliminating most of the complexity associated with the traditional approach to logic BIST diagnostics.
Publication Year: 2007
Publication Date: 2007-01-01
Language: en
Type: article
Indexed In: ['crossref']
Access and Citation
Cited By Count: 49
AI Researcher Chatbot
Get quick answers to your questions about the article from our AI researcher chatbot