Title: A novel test fixture with enhanced signal port isolation capability for on-wafer microwave measurements
Abstract:A novel test fixture for on-wafer microwave measurements is proposed. It has an excellent isolation between signal ports. The proposed fixture has 15 dB and 30 dB lower forward coupling than commonly ...A novel test fixture for on-wafer microwave measurements is proposed. It has an excellent isolation between signal ports. The proposed fixture has 15 dB and 30 dB lower forward coupling than commonly known shield-based and conventional fixtures, respectively, at 20 GHz. This is validated by measurements. Reliable open in-fixture performance in dummy de-embedding can be achieved by employing the proposed test fixture, since the proposed test fixture's parasitic components are clear and evident. Furthermore, a short in-fixture is demonstrated. The test fixtures were fabricated using four metal layer 0.35 /spl mu/m CMOS technology.Read More
Publication Year: 2005
Publication Date: 2005-07-28
Language: en
Type: article
Indexed In: ['crossref']
Access and Citation
Cited By Count: 2
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