Title: Exploring the nanoworld with atomic force microscopy
Abstract:Over its 20-year history, the atomic force microscope has gradually evolved into an instrument whose spatial resolution is now fine enough to image subatomic features on the scale of picometers....Over its 20-year history, the atomic force microscope has gradually evolved into an instrument whose spatial resolution is now fine enough to image subatomic features on the scale of picometers.Read More
Publication Year: 2006
Publication Date: 2006-12-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 54
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