Publication Information

{'id': 'https://openalex.org/W2793088195', 'doi': 'https://doi.org/10.1017/s1551929500063513', 'title': 'Atomic Resolution with the Atomic Force Microscope', 'display_name': 'Atomic Resolution with the Atomic Force Microscope', 'publication_year': 1995, 'publication_date': '1995-05-01', 'ids': {'openalex': 'https://openalex.org/W2793088195', 'doi': 'https://doi.org/10.1017/s1551929500063513', 'mag': '2793088195'}, 'language': 'en', 'primary_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.1017/s1551929500063513', 'pdf_url': 'https://www.cambridge.org/core/services/aop-cambridge-core/content/view/0DF3F6A4B9A68C4DB96B6460B5617B65/S1551929500063513a.pdf/div-class-title-atomic-resolution-with-the-atomic-force-microscope-div.pdf', 'source': {'id': 'https://openalex.org/S74408252', 'display_name': 'Microscopy Today', 'issn_l': '1551-9295', 'issn': ['1551-9295', '2150-3583'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311648', 'host_organization_name': 'Oxford University Press', 'host_organization_lineage': ['https://openalex.org/P4310311647', 'https://openalex.org/P4310311648'], 'host_organization_lineage_names': ['University of Oxford', 'Oxford University Press'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': True, 'oa_status': 'bronze', 'oa_url': 'https://www.cambridge.org/core/services/aop-cambridge-core/content/view/0DF3F6A4B9A68C4DB96B6460B5617B65/S1551929500063513a.pdf/div-class-title-atomic-resolution-with-the-atomic-force-microscope-div.pdf', 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5113641130', 'display_name': 'Stephen W. Carmichael', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I2802423016', 'display_name': 'WinnMed', 'ror': 'https://ror.org/02s47w807', 'country_code': 'US', 'type': 'nonprofit', 'lineage': ['https://openalex.org/I2802423016']}], 'countries': ['US'], 'is_corresponding': True, 'raw_author_name': 'Stephen W Carmichael', 'raw_affiliation_strings': ['Mayo Clinic'], 'affiliations': [{'raw_affiliation_string': 'Mayo Clinic', 'institution_ids': ['https://openalex.org/I2802423016']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': ['https://openalex.org/A5113641130'], 'corresponding_institution_ids': ['https://openalex.org/I2802423016'], 'apc_list': {'value': 3255, 'currency': 'USD', 'value_usd': 3255, 'provenance': 'doaj'}, 'apc_paid': None, 'fwci': 0.216, 'has_fulltext': True, 'fulltext_origin': 'pdf', 'cited_by_count': 4, 'citation_normalized_percentile': {'value': 0.432878, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 68, 'max': 70}, 'biblio': {'volume': '3', 'issue': '4', 'first_page': '6', 'last_page': '7'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13552', 'display_name': 'Advanced Materials Characterization Techniques', 'score': 0.9981, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10913', 'display_name': 'Molecular Junctions and Nanostructures', 'score': 0.9981, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/atomic-units', 'display_name': 'Atomic units', 'score': 0.7524873}], 'concepts': [{'id': 'https://openalex.org/C102951782', 'wikidata': 'https://www.wikidata.org/wiki/Q49295', 'display_name': 'Atomic force microscopy', 'level': 2, 'score': 0.8432982}, {'id': 'https://openalex.org/C206008964', 'wikidata': 'https://www.wikidata.org/wiki/Q5159384', 'display_name': 'Conductive atomic force microscopy', 'level': 3, 'score': 0.76425815}, {'id': 'https://openalex.org/C66823137', 'wikidata': 'https://www.wikidata.org/wiki/Q757568', 'display_name': 'Atomic units', 'level': 2, 'score': 0.7524873}, {'id': 'https://openalex.org/C138268822', 'wikidata': 'https://www.wikidata.org/wiki/Q1051925', 'display_name': 'Resolution (logic)', 'level': 2, 'score': 0.5952221}, {'id': 'https://openalex.org/C544956773', 'wikidata': 'https://www.wikidata.org/wiki/Q670', 'display_name': 'Silicon', 'level': 2, 'score': 0.5762227}, {'id': 'https://openalex.org/C6518042', 'wikidata': 'https://www.wikidata.org/wiki/Q175646', 'display_name': 'Scanning tunneling microscope', 'level': 2, 'score': 0.5690193}, {'id': 'https://openalex.org/C82764429', 'wikidata': 'https://www.wikidata.org/wiki/Q7187730', 'display_name': 'Photoconductive atomic force microscopy', 'level': 5, 'score': 0.54027206}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.5086604}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.48680374}, {'id': 'https://openalex.org/C83898325', 'wikidata': 'https://www.wikidata.org/wiki/Q1324110', 'display_name': 'Kelvin probe force microscope', 'level': 3, 'score': 0.4145514}, {'id': 'https://openalex.org/C147080431', 'wikidata': 'https://www.wikidata.org/wiki/Q1074953', 'display_name': 'Microscopy', 'level': 2, 'score': 0.3987114}, {'id': 'https://openalex.org/C99752389', 'wikidata': 'https://www.wikidata.org/wiki/Q9337610', 'display_name': 'Scanning capacitance microscopy', 'level': 4, 'score': 0.37768367}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.25625885}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.20708692}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.20412323}, {'id': 'https://openalex.org/C187921700', 'wikidata': 'https://www.wikidata.org/wiki/Q7430074', 'display_name': 'Scanning confocal electron microscopy', 'level': 3, 'score': 0.1955786}, {'id': 'https://openalex.org/C154945302', 'wikidata': 'https://www.wikidata.org/wiki/Q11660', 'display_name': 'Artificial intelligence', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': True, 'landing_page_url': 'https://doi.org/10.1017/s1551929500063513', 'pdf_url': 'https://www.cambridge.org/core/services/aop-cambridge-core/content/view/0DF3F6A4B9A68C4DB96B6460B5617B65/S1551929500063513a.pdf/div-class-title-atomic-resolution-with-the-atomic-force-microscope-div.pdf', 'source': {'id': 'https://openalex.org/S74408252', 'display_name': 'Microscopy Today', 'issn_l': '1551-9295', 'issn': ['1551-9295', '2150-3583'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311648', 'host_organization_name': 'Oxford University Press', 'host_organization_lineage': ['https://openalex.org/P4310311647', 'https://openalex.org/P4310311648'], 'host_organization_lineage_names': ['University of Oxford', 'Oxford University Press'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}], 'best_oa_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.1017/s1551929500063513', 'pdf_url': 'https://www.cambridge.org/core/services/aop-cambridge-core/content/view/0DF3F6A4B9A68C4DB96B6460B5617B65/S1551929500063513a.pdf/div-class-title-atomic-resolution-with-the-atomic-force-microscope-div.pdf', 'source': {'id': 'https://openalex.org/S74408252', 'display_name': 'Microscopy Today', 'issn_l': '1551-9295', 'issn': ['1551-9295', '2150-3583'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311648', 'host_organization_name': 'Oxford University Press', 'host_organization_lineage': ['https://openalex.org/P4310311647', 'https://openalex.org/P4310311648'], 'host_organization_lineage_names': ['University of Oxford', 'Oxford University Press'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W89286580', 'https://openalex.org/W88948087', 'https://openalex.org/W4301002845', 'https://openalex.org/W4235926702', 'https://openalex.org/W2747292860', 'https://openalex.org/W2620958299', 'https://openalex.org/W2410165343', 'https://openalex.org/W2402056527', 'https://openalex.org/W2365179753', 'https://openalex.org/W2006261985'], 'abstract_inverted_index': {'Abstract': [0], 'For': [1], 'biologic': [2, 24], 'studies,': [3], 'atomic': [4, 41, 58], 'force': [5, 59], 'microscopy': [6, 14], '(AFM)': [7], 'has': [8, 18, 64], 'been': [9], 'prevailing': [10], 'over': [11], 'scanning': [12], 'tunneling': [13], '(STM)': [15], 'because': [16], 'it': [17], 'the': [19, 40, 52], 'capability': [20], 'of': [21, 51], 'imaging': [22], 'non-conducting': [23], 'specimens.': [25], 'However,': [26], 'STM': [27], 'generally': [28], 'gives': [29], 'better': [30], 'resolution': [31, 38, 50], 'than': [32], 'AFM,': [33], 'and': [34], "we're": [35], 'talking': [36], 'about': [37], 'on': [39], 'scale.': [42], 'In': [43], 'a': [44], 'recent': [45], 'article,': [46], 'Franz': [47], 'Giessibl': [48], '(Atomic': [49], 'silicon': [53], '(111)-': [54], '(7X7)': [55], 'surface': [56], 'by': [57, 71], 'microscopy,': [60], 'Science': [61], '267:68-71,': [62], '1995)': [63], 'demonstrated': [65], 'that': [66], 'atoms': [67], 'can': [68], 'be': [69], 'imaged': [70], 'AFM.': [72]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2793088195', 'counts_by_year': [{'year': 2023, 'cited_by_count': 1}, {'year': 2016, 'cited_by_count': 1}], 'updated_date': '2024-12-09T23:43:24.136296', 'created_date': '2018-03-29'}