Get quick answers to your questions about the article from our AI researcher chatbot
{'id': 'https://openalex.org/W1965310374', 'doi': 'https://doi.org/10.1016/j.microrel.2004.11.033', 'title': 'On the SILC mechanism in MOSFET’s with ultrathin oxides', 'display_name': 'On the SILC mechanism in MOSFET’s with ultrathin oxides', 'publication_year': 2004, 'publication_date': '2004-12-22', 'ids': {'openalex': 'https://openalex.org/W1965310374', 'doi': 'https://doi.org/10.1016/j.microrel.2004.11.033', 'mag': '1965310374'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1016/j.microrel.2004.11.033', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S133646729', 'display_name': 'Microelectronics Reliability', 'issn_l': '0026-2714', 'issn': ['0026-2714', '1872-941X'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320990', 'host_organization_name': 'Elsevier BV', 'host_organization_lineage': ['https://openalex.org/P4310320990'], 'host_organization_lineage_names': ['Elsevier BV'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5031806112', 'display_name': 'D. Bauza', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I1294671590', 'display_name': 'Centre National de la Recherche Scientifique', 'ror': 'https://ror.org/02feahw73', 'country_code': 'FR', 'type': 'government', 'lineage': ['https://openalex.org/I1294671590']}, {'id': 'https://openalex.org/I4210139715', 'display_name': 'Institut de Microélectronique, Electromagnétisme et Photonique', 'ror': 'https://ror.org/03taa9n66', 'country_code': 'FR', 'type': 'facility', 'lineage': ['https://openalex.org/I106785703', 'https://openalex.org/I1294671590', 'https://openalex.org/I4210095849', 'https://openalex.org/I4210139715', 'https://openalex.org/I70900168', 'https://openalex.org/I899635006']}], 'countries': ['FR'], 'is_corresponding': False, 'raw_author_name': 'D. Bauza', 'raw_affiliation_strings': ['Institut de Microélectronique, Electromagnétisme et Photonique (IMEP), UMR CNRS 5130, INPG, ENSERG, 23, rue des Martyrs, BP 257, 38016 Grenoble Cedex 1, France'], 'affiliations': [{'raw_affiliation_string': 'Institut de Microélectronique, Electromagnétisme et Photonique (IMEP), UMR CNRS 5130, INPG, ENSERG, 23, rue des Martyrs, BP 257, 38016 Grenoble Cedex 1, France', 'institution_ids': ['https://openalex.org/I1294671590', 'https://openalex.org/I4210139715']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5084117190', 'display_name': 'F. Rahmoune', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I1294671590', 'display_name': 'Centre National de la Recherche Scientifique', 'ror': 'https://ror.org/02feahw73', 'country_code': 'FR', 'type': 'government', 'lineage': ['https://openalex.org/I1294671590']}, {'id': 'https://openalex.org/I4210139715', 'display_name': 'Institut de Microélectronique, Electromagnétisme et Photonique', 'ror': 'https://ror.org/03taa9n66', 'country_code': 'FR', 'type': 'facility', 'lineage': ['https://openalex.org/I106785703', 'https://openalex.org/I1294671590', 'https://openalex.org/I4210095849', 'https://openalex.org/I4210139715', 'https://openalex.org/I70900168', 'https://openalex.org/I899635006']}], 'countries': ['FR'], 'is_corresponding': False, 'raw_author_name': 'F. Rahmoune', 'raw_affiliation_strings': ['Institut de Microélectronique, Electromagnétisme et Photonique (IMEP), UMR CNRS 5130, INPG, ENSERG, 23, rue des Martyrs, BP 257, 38016 Grenoble Cedex 1, France'], 'affiliations': [{'raw_affiliation_string': 'Institut de Microélectronique, Electromagnétisme et Photonique (IMEP), UMR CNRS 5130, INPG, ENSERG, 23, rue des Martyrs, BP 257, 38016 Grenoble Cedex 1, France', 'institution_ids': ['https://openalex.org/I1294671590', 'https://openalex.org/I4210139715']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5106461031', 'display_name': 'R. Laqli', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I1294671590', 'display_name': 'Centre National de la Recherche Scientifique', 'ror': 'https://ror.org/02feahw73', 'country_code': 'FR', 'type': 'government', 'lineage': ['https://openalex.org/I1294671590']}, {'id': 'https://openalex.org/I4210139715', 'display_name': 'Institut de Microélectronique, Electromagnétisme et Photonique', 'ror': 'https://ror.org/03taa9n66', 'country_code': 'FR', 'type': 'facility', 'lineage': ['https://openalex.org/I106785703', 'https://openalex.org/I1294671590', 'https://openalex.org/I4210095849', 'https://openalex.org/I4210139715', 'https://openalex.org/I70900168', 'https://openalex.org/I899635006']}], 'countries': ['FR'], 'is_corresponding': False, 'raw_author_name': 'R. Laqli', 'raw_affiliation_strings': ['Institut de Microélectronique, Electromagnétisme et Photonique (IMEP), UMR CNRS 5130, INPG, ENSERG, 23, rue des Martyrs, BP 257, 38016 Grenoble Cedex 1, France'], 'affiliations': [{'raw_affiliation_string': 'Institut de Microélectronique, Electromagnétisme et Photonique (IMEP), UMR CNRS 5130, INPG, ENSERG, 23, rue des Martyrs, BP 257, 38016 Grenoble Cedex 1, France', 'institution_ids': ['https://openalex.org/I1294671590', 'https://openalex.org/I4210139715']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5111669951', 'display_name': 'Gérard Ghibaudo', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I4210139715', 'display_name': 'Institut de Microélectronique, Electromagnétisme et Photonique', 'ror': 'https://ror.org/03taa9n66', 'country_code': 'FR', 'type': 'facility', 'lineage': ['https://openalex.org/I106785703', 'https://openalex.org/I1294671590', 'https://openalex.org/I4210095849', 'https://openalex.org/I4210139715', 'https://openalex.org/I70900168', 'https://openalex.org/I899635006']}, {'id': 'https://openalex.org/I1294671590', 'display_name': 'Centre National de la Recherche Scientifique', 'ror': 'https://ror.org/02feahw73', 'country_code': 'FR', 'type': 'government', 'lineage': ['https://openalex.org/I1294671590']}], 'countries': ['FR'], 'is_corresponding': False, 'raw_author_name': 'G. Ghibaudo', 'raw_affiliation_strings': ['Institut de Microélectronique, Electromagnétisme et Photonique (IMEP), UMR CNRS 5130, INPG, ENSERG, 23, rue des Martyrs, BP 257, 38016 Grenoble Cedex 1, France'], 'affiliations': [{'raw_affiliation_string': 'Institut de Microélectronique, Electromagnétisme et Photonique (IMEP), UMR CNRS 5130, INPG, ENSERG, 23, rue des Martyrs, BP 257, 38016 Grenoble Cedex 1, France', 'institution_ids': ['https://openalex.org/I4210139715', 'https://openalex.org/I1294671590']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': {'value': 2190, 'currency': 'USD', 'value_usd': 2190, 'provenance': 'doaj'}, 'apc_paid': None, 'fwci': 1.152, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 8, 'citation_normalized_percentile': {'value': 0.679374, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 79, 'max': 80}, 'biblio': {'volume': '45', 'issue': '5-6', 'first_page': '849', 'last_page': '852'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10472', 'display_name': 'Semiconductor materials and devices', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10472', 'display_name': 'Semiconductor materials and devices', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10558', 'display_name': 'Advancements in Semiconductor Devices and Circuit Design', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T14117', 'display_name': 'Integrated Circuits and Semiconductor Failure Analysis', 'score': 0.9996, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/silc', 'display_name': 'SILC', 'score': 0.99651515}, {'id': 'https://openalex.org/keywords/trap', 'display_name': 'Trap (plumbing)', 'score': 0.66793734}], 'concepts': [{'id': 'https://openalex.org/C86642149', 'wikidata': 'https://www.wikidata.org/wiki/Q7390375', 'display_name': 'SILC', 'level': 3, 'score': 0.99651515}, {'id': 'https://openalex.org/C2778413303', 'wikidata': 'https://www.wikidata.org/wiki/Q210793', 'display_name': 'MOSFET', 'level': 4, 'score': 0.71304715}, {'id': 'https://openalex.org/C121099081', 'wikidata': 'https://www.wikidata.org/wiki/Q665580', 'display_name': 'Trap (plumbing)', 'level': 2, 'score': 0.66793734}, {'id': 'https://openalex.org/C120398109', 'wikidata': 'https://www.wikidata.org/wiki/Q175751', 'display_name': 'Quantum tunnelling', 'level': 2, 'score': 0.5295635}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.48340717}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.40594888}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.3827077}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.3451712}, {'id': 'https://openalex.org/C26873012', 'wikidata': 'https://www.wikidata.org/wiki/Q214781', 'display_name': 'Condensed matter physics', 'level': 1, 'score': 0.34330672}, {'id': 'https://openalex.org/C165801399', 'wikidata': 'https://www.wikidata.org/wiki/Q25428', 'display_name': 'Voltage', 'level': 2, 'score': 0.34324908}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.14165145}, {'id': 'https://openalex.org/C172385210', 'wikidata': 'https://www.wikidata.org/wiki/Q5339', 'display_name': 'Transistor', 'level': 3, 'score': 0.13105577}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.09281102}, {'id': 'https://openalex.org/C153294291', 'wikidata': 'https://www.wikidata.org/wiki/Q25261', 'display_name': 'Meteorology', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 3, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1016/j.microrel.2004.11.033', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S133646729', 'display_name': 'Microelectronics Reliability', 'issn_l': '0026-2714', 'issn': ['0026-2714', '1872-941X'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320990', 'host_organization_name': 'Elsevier BV', 'host_organization_lineage': ['https://openalex.org/P4310320990'], 'host_organization_lineage_names': ['Elsevier BV'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, {'is_oa': False, 'landing_page_url': 'https://hal.archives-ouvertes.fr/hal-00145184', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306402512', 'display_name': 'HAL (Le Centre pour la Communication Scientifique Directe)', 'issn_l': None, 'issn': None, 'is_oa': True, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/I1294671590', 'host_organization_name': 'Centre National de la Recherche Scientifique', 'host_organization_lineage': ['https://openalex.org/I1294671590'], 'host_organization_lineage_names': ['Centre National de la Recherche Scientifique'], 'type': 'repository'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, {'is_oa': False, 'landing_page_url': 'https://hal.science/hal-00145184', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 8, 'referenced_works': ['https://openalex.org/W1965333095', 'https://openalex.org/W1976633068', 'https://openalex.org/W2078482863', 'https://openalex.org/W2089026843', 'https://openalex.org/W2096873013', 'https://openalex.org/W2126545376', 'https://openalex.org/W2132120374', 'https://openalex.org/W2149433085'], 'related_works': ['https://openalex.org/W2541625110', 'https://openalex.org/W2540318869', 'https://openalex.org/W2131181908', 'https://openalex.org/W2012569240', 'https://openalex.org/W1998655742', 'https://openalex.org/W1998393781', 'https://openalex.org/W1996219590', 'https://openalex.org/W1988236200', 'https://openalex.org/W1965310374', 'https://openalex.org/W1965100848'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1965310374', 'counts_by_year': [], 'updated_date': '2024-12-16T08:47:01.210708', 'created_date': '2016-06-24'}