Publication Information

{'id': 'https://openalex.org/W4240739534', 'doi': 'https://doi.org/10.1201/9781420040944-18', 'title': 'Application of Scanning Probe Microscopy (Scanning Tunneling Microscopy and Atomic Force Microscopy) in Colloid and Surface Chemistry', 'display_name': 'Application of Scanning Probe Microscopy (Scanning Tunneling Microscopy and Atomic Force Microscopy) in Colloid and Surface Chemistry', 'publication_year': 2002, 'publication_date': '2002-08-27', 'ids': {'openalex': 'https://openalex.org/W4240739534', 'doi': 'https://doi.org/10.1201/9781420040944-18'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1201/9781420040944-18', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306463075', 'display_name': 'CRC Press eBooks', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/P4310320449', 'host_organization_name': 'Informa', 'host_organization_lineage': ['https://openalex.org/P4310320449'], 'host_organization_lineage_names': ['Informa'], 'type': 'ebook platform'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'book-chapter', 'type_crossref': 'book-chapter', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [], 'institution_assertions': [], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': False, 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 57}, 'biblio': {'volume': None, 'issue': None, 'first_page': '667', 'last_page': '696'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 0.8867, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 0.8867, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/scanning-probe-microscopy', 'display_name': 'Scanning Probe Microscopy', 'score': 0.65510505}, {'id': 'https://openalex.org/keywords/scanning-force-microscopy', 'display_name': 'Scanning Force Microscopy', 'score': 0.5597472}], 'concepts': [{'id': 'https://openalex.org/C16777580', 'wikidata': 'https://www.wikidata.org/wiki/Q7430068', 'display_name': 'Scanning ion-conductance microscopy', 'level': 4, 'score': 0.74893194}, {'id': 'https://openalex.org/C6518042', 'wikidata': 'https://www.wikidata.org/wiki/Q175646', 'display_name': 'Scanning tunneling microscope', 'level': 2, 'score': 0.68845475}, {'id': 'https://openalex.org/C147080431', 'wikidata': 'https://www.wikidata.org/wiki/Q1074953', 'display_name': 'Microscopy', 'level': 2, 'score': 0.6664779}, {'id': 'https://openalex.org/C36628996', 'wikidata': 'https://www.wikidata.org/wiki/Q907287', 'display_name': 'Scanning probe microscopy', 'level': 2, 'score': 0.65510505}, {'id': 'https://openalex.org/C99752389', 'wikidata': 'https://www.wikidata.org/wiki/Q9337610', 'display_name': 'Scanning capacitance microscopy', 'level': 4, 'score': 0.585378}, {'id': 'https://openalex.org/C187921700', 'wikidata': 'https://www.wikidata.org/wiki/Q7430074', 'display_name': 'Scanning confocal electron microscopy', 'level': 3, 'score': 0.5729183}, {'id': 'https://openalex.org/C206008964', 'wikidata': 'https://www.wikidata.org/wiki/Q5159384', 'display_name': 'Conductive atomic force microscopy', 'level': 3, 'score': 0.5718436}, {'id': 'https://openalex.org/C2909055331', 'wikidata': 'https://www.wikidata.org/wiki/Q49295', 'display_name': 'Scanning Force Microscopy', 'level': 3, 'score': 0.5597472}, {'id': 'https://openalex.org/C102951782', 'wikidata': 'https://www.wikidata.org/wiki/Q49295', 'display_name': 'Atomic force microscopy', 'level': 2, 'score': 0.550066}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.54969066}, {'id': 'https://openalex.org/C82764429', 'wikidata': 'https://www.wikidata.org/wiki/Q7187730', 'display_name': 'Photoconductive atomic force microscopy', 'level': 5, 'score': 0.5315119}, {'id': 'https://openalex.org/C59789625', 'wikidata': 'https://www.wikidata.org/wiki/Q181780', 'display_name': 'Colloid', 'level': 2, 'score': 0.5165485}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.45775354}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.39815116}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.2292552}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.13728836}, {'id': 'https://openalex.org/C147789679', 'wikidata': 'https://www.wikidata.org/wiki/Q11372', 'display_name': 'Physical chemistry', 'level': 1, 'score': 0.09034616}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1201/9781420040944-18', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306463075', 'display_name': 'CRC Press eBooks', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/P4310320449', 'host_organization_name': 'Informa', 'host_organization_lineage': ['https://openalex.org/P4310320449'], 'host_organization_lineage_names': ['Informa'], 'type': 'ebook platform'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W4379118176', 'https://openalex.org/W4240739534', 'https://openalex.org/W2491233359', 'https://openalex.org/W2402056527', 'https://openalex.org/W2353279948', 'https://openalex.org/W2278491674', 'https://openalex.org/W2075902303', 'https://openalex.org/W1646861040', 'https://openalex.org/W1519855544', 'https://openalex.org/W1486910393'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W4240739534', 'counts_by_year': [], 'updated_date': '2024-12-12T04:16:20.785584', 'created_date': '2022-05-12'}