Title: Analysis Through X‐Ray Diffraction of Polycrystalline Thin Films
Abstract:This chapter contains sections titled: Introduction Some reminders of x-ray diffraction and crystallography Application to powder or polycrystalline thin-films Phase analysis by X-ray diffraction Iden...This chapter contains sections titled: Introduction Some reminders of x-ray diffraction and crystallography Application to powder or polycrystalline thin-films Phase analysis by X-ray diffraction Identification of coherent domain sizes of diffraction and micro-strains Identification of crystallographic textures by X-ray diffraction Determination of strains/stresses by X-ray diffraction BibliographyRead More
Publication Year: 2011
Publication Date: 2011-10-24
Language: en
Type: other
Indexed In: ['crossref']
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Cited By Count: 1
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