Title: Measurement of Microcrystal Size by Means of Diffraction of X‐Rays
Abstract:Abstract The diffraction function expressing the dependence of the intensity of the diffracted X‐rays on the angle of diffraction ϱ is derived. On the basis of this equation two methods of measuring t...Abstract The diffraction function expressing the dependence of the intensity of the diffracted X‐rays on the angle of diffraction ϱ is derived. On the basis of this equation two methods of measuring the microcrystal size in the direction of the normal line onto the beam of coherently diffracting atom planes are elaborated. Further, the methods for measuring the diffraction line enlargement owing to the experimental conditions are given here.Read More
Publication Year: 1979
Publication Date: 1979-01-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 3
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