Publication Information

{'id': 'https://openalex.org/W2920768803', 'doi': 'https://doi.org/10.1049/mnl.2019.0038', 'title': 'Recent development of samples’ surface properties using scanning ion conductance microscopy', 'display_name': 'Recent development of samples’ surface properties using scanning ion conductance microscopy', 'publication_year': 2019, 'publication_date': '2019-03-02', 'ids': {'openalex': 'https://openalex.org/W2920768803', 'doi': 'https://doi.org/10.1049/mnl.2019.0038', 'mag': '2920768803'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1049/mnl.2019.0038', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S95685352', 'display_name': 'Micro & Nano Letters', 'issn_l': '1750-0443', 'issn': ['1750-0443'], 'is_oa': True, 'is_in_doaj': True, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311714', 'host_organization_name': 'Institution of Engineering and Technology', 'host_organization_lineage': ['https://openalex.org/P4310311714'], 'host_organization_lineage_names': ['Institution of Engineering and Technology'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5016516907', 'display_name': 'Zhenhui Li', 'orcid': 'https://orcid.org/0000-0001-7221-2588'}, 'institutions': [{'id': 'https://openalex.org/I83714178', 'display_name': 'Shenyang Jianzhu University', 'ror': 'https://ror.org/01zr73v18', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I83714178']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Zhenhui Li', 'raw_affiliation_strings': ["School of Information and Control Engineering, Shenyang Jianzhu University, Shenyang, 110000 People's Republic of China"], 'affiliations': [{'raw_affiliation_string': "School of Information and Control Engineering, Shenyang Jianzhu University, Shenyang, 110000 People's Republic of China", 'institution_ids': ['https://openalex.org/I83714178']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5048316347', 'display_name': 'Ke Xu', 'orcid': 'https://orcid.org/0000-0002-7807-8444'}, 'institutions': [{'id': 'https://openalex.org/I83714178', 'display_name': 'Shenyang Jianzhu University', 'ror': 'https://ror.org/01zr73v18', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I83714178']}], 'countries': ['CN'], 'is_corresponding': True, 'raw_author_name': 'Ke Xu', 'raw_affiliation_strings': ["School of Information and Control Engineering, Shenyang Jianzhu University, Shenyang, 110000 People's Republic of China"], 'affiliations': [{'raw_affiliation_string': "School of Information and Control Engineering, Shenyang Jianzhu University, Shenyang, 110000 People's Republic of China", 'institution_ids': ['https://openalex.org/I83714178']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5067709603', 'display_name': 'Fanan Wei', 'orcid': 'https://orcid.org/0000-0002-4289-786X'}, 'institutions': [{'id': 'https://openalex.org/I80947539', 'display_name': 'Fuzhou University', 'ror': 'https://ror.org/011xvna82', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I80947539']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Fanan Wei', 'raw_affiliation_strings': ["School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, 350000 People's Republic of China"], 'affiliations': [{'raw_affiliation_string': "School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, 350000 People's Republic of China", 'institution_ids': ['https://openalex.org/I80947539']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': ['https://openalex.org/A5048316347'], 'corresponding_institution_ids': ['https://openalex.org/I83714178'], 'apc_list': {'value': 2000, 'currency': 'EUR', 'value_usd': 2200, 'provenance': 'doaj'}, 'apc_paid': None, 'fwci': 0.198, 'has_fulltext': False, 'cited_by_count': 2, 'citation_normalized_percentile': {'value': 0.401, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 69, 'max': 74}, 'biblio': {'volume': '14', 'issue': '7', 'first_page': '744', 'last_page': '748'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T11434', 'display_name': 'Electrochemical Analysis and Applications', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/1603', 'display_name': 'Electrochemistry'}, 'field': {'id': 'https://openalex.org/fields/16', 'display_name': 'Chemistry'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T11434', 'display_name': 'Electrochemical Analysis and Applications', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/1603', 'display_name': 'Electrochemistry'}, 'field': {'id': 'https://openalex.org/fields/16', 'display_name': 'Chemistry'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11472', 'display_name': 'Analytical Chemistry and Sensors', 'score': 0.9988, 'subfield': {'id': 'https://openalex.org/subfields/1502', 'display_name': 'Bioengineering'}, 'field': {'id': 'https://openalex.org/fields/15', 'display_name': 'Chemical Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 0.9959, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/scanning-probe-microscopy', 'display_name': 'Scanning Probe Microscopy', 'score': 0.71921223}], 'concepts': [{'id': 'https://openalex.org/C16777580', 'wikidata': 'https://www.wikidata.org/wiki/Q7430068', 'display_name': 'Scanning ion-conductance microscopy', 'level': 4, 'score': 0.91534287}, {'id': 'https://openalex.org/C36628996', 'wikidata': 'https://www.wikidata.org/wiki/Q907287', 'display_name': 'Scanning probe microscopy', 'level': 2, 'score': 0.71921223}, {'id': 'https://openalex.org/C147080431', 'wikidata': 'https://www.wikidata.org/wiki/Q1074953', 'display_name': 'Microscopy', 'level': 2, 'score': 0.69590664}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.68077767}, {'id': 'https://openalex.org/C121932024', 'wikidata': 'https://www.wikidata.org/wiki/Q5159376', 'display_name': 'Conductance', 'level': 2, 'score': 0.6372182}, {'id': 'https://openalex.org/C26771246', 'wikidata': 'https://www.wikidata.org/wiki/Q321095', 'display_name': 'Scanning electron microscope', 'level': 2, 'score': 0.6074544}, {'id': 'https://openalex.org/C99752389', 'wikidata': 'https://www.wikidata.org/wiki/Q9337610', 'display_name': 'Scanning capacitance microscopy', 'level': 4, 'score': 0.582853}, {'id': 'https://openalex.org/C187921700', 'wikidata': 'https://www.wikidata.org/wiki/Q7430074', 'display_name': 'Scanning confocal electron microscopy', 'level': 3, 'score': 0.49346104}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.48644945}, {'id': 'https://openalex.org/C206008964', 'wikidata': 'https://www.wikidata.org/wiki/Q5159384', 'display_name': 'Conductive atomic force microscopy', 'level': 3, 'score': 0.44903636}, {'id': 'https://openalex.org/C145148216', 'wikidata': 'https://www.wikidata.org/wiki/Q36496', 'display_name': 'Ion', 'level': 2, 'score': 0.44054708}, {'id': 'https://openalex.org/C131540310', 'wikidata': 'https://www.wikidata.org/wiki/Q907564', 'display_name': 'Conductivity', 'level': 2, 'score': 0.43794817}, {'id': 'https://openalex.org/C113196181', 'wikidata': 'https://www.wikidata.org/wiki/Q485223', 'display_name': 'Analytical Chemistry (journal)', 'level': 2, 'score': 0.4323096}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.24501127}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.21572936}, {'id': 'https://openalex.org/C102951782', 'wikidata': 'https://www.wikidata.org/wiki/Q49295', 'display_name': 'Atomic force microscopy', 'level': 2, 'score': 0.14853671}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.0806987}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.058557212}, {'id': 'https://openalex.org/C178790620', 'wikidata': 'https://www.wikidata.org/wiki/Q11351', 'display_name': 'Organic chemistry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C147789679', 'wikidata': 'https://www.wikidata.org/wiki/Q11372', 'display_name': 'Physical chemistry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C26873012', 'wikidata': 'https://www.wikidata.org/wiki/Q214781', 'display_name': 'Condensed matter physics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C43617362', 'wikidata': 'https://www.wikidata.org/wiki/Q170050', 'display_name': 'Chromatography', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1049/mnl.2019.0038', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S95685352', 'display_name': 'Micro & Nano Letters', 'issn_l': '1750-0443', 'issn': ['1750-0443'], 'is_oa': True, 'is_in_doaj': True, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311714', 'host_organization_name': 'Institution of Engineering and Technology', 'host_organization_lineage': ['https://openalex.org/P4310311714'], 'host_organization_lineage_names': ['Institution of Engineering and Technology'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 48, 'referenced_works': ['https://openalex.org/W1005006069', 'https://openalex.org/W1989001895', 'https://openalex.org/W2014249634', 'https://openalex.org/W2023637278', 'https://openalex.org/W2025328946', 'https://openalex.org/W2025897420', 'https://openalex.org/W2032511899', 'https://openalex.org/W2036640181', 'https://openalex.org/W2044917307', 'https://openalex.org/W2066801946', 'https://openalex.org/W2069189462', 'https://openalex.org/W2077813193', 'https://openalex.org/W2079227116', 'https://openalex.org/W2080923741', 'https://openalex.org/W2090552791', 'https://openalex.org/W2092624609', 'https://openalex.org/W2105345985', 'https://openalex.org/W2113862559', 'https://openalex.org/W2116740425', 'https://openalex.org/W2120663346', 'https://openalex.org/W2120767516', 'https://openalex.org/W2142841520', 'https://openalex.org/W2215848864', 'https://openalex.org/W2234168478', 'https://openalex.org/W2255761310', 'https://openalex.org/W2260754527', 'https://openalex.org/W2313468242', 'https://openalex.org/W2316698458', 'https://openalex.org/W2332090625', 'https://openalex.org/W2332301628', 'https://openalex.org/W2399530791', 'https://openalex.org/W2518818208', 'https://openalex.org/W2519466457', 'https://openalex.org/W2554125041', 'https://openalex.org/W2582558476', 'https://openalex.org/W2613527060', 'https://openalex.org/W2738432153', 'https://openalex.org/W2751516532', 'https://openalex.org/W2751593216', 'https://openalex.org/W2754929671', 'https://openalex.org/W2761751039', 'https://openalex.org/W2761925545', 'https://openalex.org/W2770002125', 'https://openalex.org/W2772751841', 'https://openalex.org/W2785967823', 'https://openalex.org/W2799653932', 'https://openalex.org/W2884200439', 'https://openalex.org/W2884925572'], 'related_works': ['https://openalex.org/W99870850', 'https://openalex.org/W3143491025', 'https://openalex.org/W2790795421', 'https://openalex.org/W2616275348', 'https://openalex.org/W2061570401', 'https://openalex.org/W2024671047', 'https://openalex.org/W2014435277', 'https://openalex.org/W1646861040', 'https://openalex.org/W1496401154', 'https://openalex.org/W1486910393'], 'abstract_inverted_index': {'Scanning': [0], 'ion': [1, 41, 51, 83, 103], 'conductance': [2, 42, 52, 84, 104], 'microscopy': [3, 43, 53, 70, 74, 105], 'has': [4], 'a': [5, 56], 'widespread': [6], 'application': [7], 'in': [8], 'imaging': [9, 93], 'non-conductive': [10], 'substrates,': [11], 'especially': [12], 'biological': [13], 'samples': [14], 'due': [15], 'to': [16], 'its': [17], 'high-resolution': [18, 63], 'and': [19, 37, 62, 71], 'non-contact': [20], 'imaging.': [21, 64], 'In': [22], 'this': [23], 'work,': [24], 'state-of-the-art': [25], 'achievements': [26], 'on': [27], 'exploring': [28], 'samples’': [29], 'surface': [30, 33], 'properties': [31], 'including': [32], 'morphology,': [34], 'sample': [35], 'conductivity': [36], 'dynamics': [38], 'using': [39], 'scanning': [40, 50, 68, 82, 102], 'are': [44, 75, 95], 'firstly': [45], 'introduced,': [46], 'which': [47, 77], 'confirm': [48], 'that': [49, 59, 88], 'is': [54, 106], 'such': [55], 'mature': [57], 'technology': [58], 'realises': [60], 'non-invasive': [61], 'Then,': [65], 'combinations': [66], 'with': [67], 'electrochemical': [69], 'atomic': [72], 'force': [73], 'demonstrated,': [76], 'realise': [78], 'the': [79, 92, 98], 'multifunction': [80], 'of': [81, 101], 'microscopy.': [85], 'Furthermore,': [86], 'improvements': [87], 'can': [89], 'help': [90], 'enhance': [91], 'rate': [94], 'presented.': [96], 'Finally,': [97], 'future': [99], 'direction': [100], 'discussed.': [107]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2920768803', 'counts_by_year': [{'year': 2022, 'cited_by_count': 1}, {'year': 2020, 'cited_by_count': 1}], 'updated_date': '2024-12-16T11:21:27.840881', 'created_date': '2019-03-11'}