Publication Information

{'id': 'https://openalex.org/W2904559969', 'doi': 'https://doi.org/10.1109/tii.2018.2887145', 'title': 'A Simple Guidance Template-Based Defect Detection Method for Strip Steel Surfaces', 'display_name': 'A Simple Guidance Template-Based Defect Detection Method for Strip Steel Surfaces', 'publication_year': 2018, 'publication_date': '2018-12-18', 'ids': {'openalex': 'https://openalex.org/W2904559969', 'doi': 'https://doi.org/10.1109/tii.2018.2887145', 'mag': '2904559969'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/tii.2018.2887145', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S184777250', 'display_name': 'IEEE Transactions on Industrial Informatics', 'issn_l': '1551-3203', 'issn': ['1551-3203', '1941-0050'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5015197245', 'display_name': 'Heying Wang', 'orcid': 'https://orcid.org/0000-0003-3479-7487'}, 'institutions': [{'id': 'https://openalex.org/I184843921', 'display_name': 'Hebei University of Technology', 'ror': 'https://ror.org/018hded08', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I184843921']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Heying Wang', 'raw_affiliation_strings': ['School of Control Science and Engineering, Hebei University of Technology, Tianjin, China'], 'affiliations': [{'raw_affiliation_string': 'School of Control Science and Engineering, Hebei University of Technology, Tianjin, China', 'institution_ids': ['https://openalex.org/I184843921']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5076658811', 'display_name': 'Jiawei Zhang', 'orcid': 'https://orcid.org/0000-0001-7827-0383'}, 'institutions': [{'id': 'https://openalex.org/I184843921', 'display_name': 'Hebei University of Technology', 'ror': 'https://ror.org/018hded08', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I184843921']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Jiawei Zhang', 'raw_affiliation_strings': ['School of Control Science and Engineering, Hebei University of Technology, Tianjin, China'], 'affiliations': [{'raw_affiliation_string': 'School of Control Science and Engineering, Hebei University of Technology, Tianjin, China', 'institution_ids': ['https://openalex.org/I184843921']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5014775850', 'display_name': 'Ying Tian', 'orcid': 'https://orcid.org/0000-0001-8568-8307'}, 'institutions': [{'id': 'https://openalex.org/I162868743', 'display_name': 'Tianjin University', 'ror': 'https://ror.org/012tb2g32', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I162868743']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Ying Tian', 'raw_affiliation_strings': ['Key Laboratory of Equipment Design and Manufacturing Technology, Tianjin University, Tianjin, China'], 'affiliations': [{'raw_affiliation_string': 'Key Laboratory of Equipment Design and Manufacturing Technology, Tianjin University, Tianjin, China', 'institution_ids': ['https://openalex.org/I162868743']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5076611575', 'display_name': 'Haiyong Chen', 'orcid': 'https://orcid.org/0000-0002-5262-4208'}, 'institutions': [{'id': 'https://openalex.org/I184843921', 'display_name': 'Hebei University of Technology', 'ror': 'https://ror.org/018hded08', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I184843921']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Haiyong Chen', 'raw_affiliation_strings': ['School of Control Science and Engineering, Hebei University of Technology, Tianjin, China'], 'affiliations': [{'raw_affiliation_string': 'School of Control Science and Engineering, Hebei University of Technology, Tianjin, China', 'institution_ids': ['https://openalex.org/I184843921']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5101746413', 'display_name': 'Hexu Sun', 'orcid': 'https://orcid.org/0000-0001-7746-8806'}, 'institutions': [{'id': 'https://openalex.org/I184843921', 'display_name': 'Hebei University of Technology', 'ror': 'https://ror.org/018hded08', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I184843921']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Hexu Sun', 'raw_affiliation_strings': ['School of Control Science and Engineering, Hebei University of Technology, Tianjin, China'], 'affiliations': [{'raw_affiliation_string': 'School of Control Science and Engineering, Hebei University of Technology, Tianjin, China', 'institution_ids': ['https://openalex.org/I184843921']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5100398796', 'display_name': 'Kun Liu', 'orcid': 'https://orcid.org/0000-0003-0774-3635'}, 'institutions': [{'id': 'https://openalex.org/I184843921', 'display_name': 'Hebei University of Technology', 'ror': 'https://ror.org/018hded08', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I184843921']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Kun Liu', 'raw_affiliation_strings': ['School of Control Science and Engineering, Hebei University of Technology, Tianjin, China'], 'affiliations': [{'raw_affiliation_string': 'School of Control Science and Engineering, Hebei University of Technology, Tianjin, China', 'institution_ids': ['https://openalex.org/I184843921']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 7.435, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 107, 'citation_normalized_percentile': {'value': 0.916114, 'is_in_top_1_percent': False, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 98, 'max': 99}, 'biblio': {'volume': '15', 'issue': '5', 'first_page': '2798', 'last_page': '2809'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12111', 'display_name': 'Industrial Vision Systems and Defect Detection', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2209', 'display_name': 'Industrial and Manufacturing Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12111', 'display_name': 'Industrial Vision Systems and Defect Detection', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2209', 'display_name': 'Industrial and Manufacturing Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13049', 'display_name': 'Surface Roughness and Optical Measurements', 'score': 0.9951, 'subfield': {'id': 'https://openalex.org/subfields/2206', 'display_name': 'Computational Mechanics'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T14117', 'display_name': 'Integrated Circuits and Semiconductor Failure Analysis', 'score': 0.9885, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/template-matching', 'display_name': 'Template matching', 'score': 0.69691503}, {'id': 'https://openalex.org/keywords/image-subtraction', 'display_name': 'Image subtraction', 'score': 0.5840075}, {'id': 'https://openalex.org/keywords/standard-test-image', 'display_name': 'Standard test image', 'score': 0.46183988}, {'id': 'https://openalex.org/keywords/subtraction', 'display_name': 'Subtraction', 'score': 0.4500641}], 'concepts': [{'id': 'https://openalex.org/C158096908', 'wikidata': 'https://www.wikidata.org/wiki/Q3983303', 'display_name': 'Template matching', 'level': 3, 'score': 0.69691503}, {'id': 'https://openalex.org/C154945302', 'wikidata': 'https://www.wikidata.org/wiki/Q11660', 'display_name': 'Artificial intelligence', 'level': 1, 'score': 0.67117894}, {'id': 'https://openalex.org/C111696304', 'wikidata': 'https://www.wikidata.org/wiki/Q2303697', 'display_name': 'Sorting', 'level': 2, 'score': 0.6469095}, {'id': 'https://openalex.org/C160633673', 'wikidata': 'https://www.wikidata.org/wiki/Q355198', 'display_name': 'Pixel', 'level': 2, 'score': 0.638681}, {'id': 'https://openalex.org/C31972630', 'wikidata': 'https://www.wikidata.org/wiki/Q844240', 'display_name': 'Computer vision', 'level': 1, 'score': 0.6366772}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.6116518}, {'id': 'https://openalex.org/C37672646', 'wikidata': 'https://www.wikidata.org/wiki/Q6002283', 'display_name': 'Image subtraction', 'level': 5, 'score': 0.5840075}, {'id': 'https://openalex.org/C115961682', 'wikidata': 'https://www.wikidata.org/wiki/Q860623', 'display_name': 'Image (mathematics)', 'level': 2, 'score': 0.46546578}, {'id': 'https://openalex.org/C180462255', 'wikidata': 'https://www.wikidata.org/wiki/Q3559736', 'display_name': 'Standard test image', 'level': 4, 'score': 0.46183988}, {'id': 'https://openalex.org/C153180895', 'wikidata': 'https://www.wikidata.org/wiki/Q7148389', 'display_name': 'Pattern recognition (psychology)', 'level': 2, 'score': 0.45014906}, {'id': 'https://openalex.org/C68060419', 'wikidata': 'https://www.wikidata.org/wiki/Q40754', 'display_name': 'Subtraction', 'level': 2, 'score': 0.4500641}, {'id': 'https://openalex.org/C9417928', 'wikidata': 'https://www.wikidata.org/wiki/Q1070689', 'display_name': 'Image processing', 'level': 3, 'score': 0.42313}, {'id': 'https://openalex.org/C88548561', 'wikidata': 'https://www.wikidata.org/wiki/Q347599', 'display_name': 'sort', 'level': 2, 'score': 0.4197871}, {'id': 'https://openalex.org/C32653426', 'wikidata': 'https://www.wikidata.org/wiki/Q3813641', 'display_name': 'Background subtraction', 'level': 3, 'score': 0.41540086}, {'id': 'https://openalex.org/C11413529', 'wikidata': 'https://www.wikidata.org/wiki/Q8366', 'display_name': 'Algorithm', 'level': 1, 'score': 0.26659852}, {'id': 'https://openalex.org/C33923547', 'wikidata': 'https://www.wikidata.org/wiki/Q395', 'display_name': 'Mathematics', 'level': 0, 'score': 0.24274799}, {'id': 'https://openalex.org/C193828747', 'wikidata': 'https://www.wikidata.org/wiki/Q864118', 'display_name': 'Binary image', 'level': 4, 'score': 0.21752498}, {'id': 'https://openalex.org/C94375191', 'wikidata': 'https://www.wikidata.org/wiki/Q11205', 'display_name': 'Arithmetic', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C23123220', 'wikidata': 'https://www.wikidata.org/wiki/Q816826', 'display_name': 'Information retrieval', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/tii.2018.2887145', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S184777250', 'display_name': 'IEEE Transactions on Industrial Informatics', 'issn_l': '1551-3203', 'issn': ['1551-3203', '1941-0050'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'display_name': 'Sustainable cities and communities', 'score': 0.69, 'id': 'https://metadata.un.org/sdg/11'}], 'grants': [{'funder': 'https://openalex.org/F4320321001', 'funder_display_name': 'National Natural Science Foundation of China', 'award_id': '61403119'}, {'funder': 'https://openalex.org/F4320322163', 'funder_display_name': 'Natural Science Foundation of Hebei Province', 'award_id': 'F201402166'}], 'datasets': [], 'versions': [], 'referenced_works_count': 29, 'referenced_works': ['https://openalex.org/W1852849178', 'https://openalex.org/W1884395441', 'https://openalex.org/W1975869169', 'https://openalex.org/W1981319256', 'https://openalex.org/W1986306729', 'https://openalex.org/W1991589289', 'https://openalex.org/W2005164446', 'https://openalex.org/W2012496675', 'https://openalex.org/W2019704568', 'https://openalex.org/W2028640249', 'https://openalex.org/W2028775883', 'https://openalex.org/W2031821661', 'https://openalex.org/W2032780809', 'https://openalex.org/W2036447028', 'https://openalex.org/W2044374157', 'https://openalex.org/W2048632148', 'https://openalex.org/W2065069729', 'https://openalex.org/W2078087367', 'https://openalex.org/W2092072518', 'https://openalex.org/W2133059825', 'https://openalex.org/W2190549459', 'https://openalex.org/W2288285947', 'https://openalex.org/W2344428106', 'https://openalex.org/W2436151569', 'https://openalex.org/W2512338826', 'https://openalex.org/W2536297875', 'https://openalex.org/W2552392885', 'https://openalex.org/W2588054711', 'https://openalex.org/W2736973763'], 'related_works': ['https://openalex.org/W4251986860', 'https://openalex.org/W3100796443', 'https://openalex.org/W2598755044', 'https://openalex.org/W2330962891', 'https://openalex.org/W2156130696', 'https://openalex.org/W2093013253', 'https://openalex.org/W2050611153', 'https://openalex.org/W2013855924', 'https://openalex.org/W1971961143', 'https://openalex.org/W1968254755'], 'abstract_inverted_index': {'Automatic': [0], 'defect': [1, 49], 'detection': [2, 50, 186], 'on': [3, 116, 142, 190], 'strip': [4, 46], 'steel': [5, 47], 'surfaces': [6], 'is': [7, 37, 51, 79, 96, 113, 133, 176], 'a': [8, 33, 40, 54, 93, 109, 183, 191], 'challenging': [9], 'task': [10], 'in': [11, 28, 136], 'computer': [12], 'vision,': [13], 'owing': [14], 'to': [15, 62, 82, 98], 'miscellaneous': [16], 'patterns': [17], 'of': [18, 21, 26, 57, 67, 89, 120, 129, 188], 'defects,': [19], 'disturbance': [20], 'pseudodefects,': [22], 'and': [23, 86, 158, 165, 179], 'random': [24], 'arrangement': [25], 'gray-level': [27], 'background.': [29], 'In': [30], 'this': [31], 'paper,': [32], 'novel': [34], 'template': [35, 78, 112, 157], 'establishment': [36], 'presented.': [38], 'Further,': [39, 103], 'simple': [41], 'guidance': [42, 111, 138, 156], 'template-based': [43], 'algorithm': [44], 'for': [45, 71], 'surface': [48], 'proposed.': [52], 'First,': [53], 'large': [55], 'number': [56], 'defect-free': [58], 'images': [59], 'are': [60], 'collected': [61], 'obtain': [63], 'the': [64, 76, 83, 87, 99, 106, 121, 127, 137, 145, 155, 173], 'statistical': [65, 84], 'characteristic': [66, 85], 'normal': [68], 'textures.': [69], 'Second,': [70], 'each': [72, 130], 'given': [73, 100], 'test': [74, 90, 101, 123, 131, 160, 196], 'image,': [75, 161], 'initial': [77, 107], 'built': [80], 'according': [81], 'size': [88], 'image.': [91, 102, 124], 'Then,': [92], 'sorting': [94, 163], 'operation': [95, 153], 'applied': [97], 'by': [104, 151], 'updating': [105], 'template,': [108], 'unique': [110], 'generated': [114], 'based': [115, 141], 'specific': [117], 'intensity': [118], 'distribution': [119], 'sorted': [122, 159], 'So': [125], 'far,': [126], 'background': [128], 'image': [132], 'approximately': [134], 'reconstructed': [135], 'template.': [139], 'Finally,': [140], 'pixel-wise': [143], 'detection,': [144], 'defects': [146], 'can': [147], 'be': [148], 'located': [149], 'accurately': [150], 'subtraction': [152], 'between': [154], 'reverse': [162], 'operation,': [164], 'adaptive': [166], 'threshold': [167], 'determination.': [168], 'Experimental': [169], 'results': [170], 'show': [171], 'that': [172], 'proposed': [174], 'method': [175], 'both': [177], 'efficient': [178], 'effective.': [180], 'It': [181], 'achieves': [182], 'better': [184], 'average': [185], 'rate': [187], '96.2%': [189], 'data': [192], 'set': [193], 'including': [194], '1500': [195], 'images.': [197]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2904559969', 'counts_by_year': [{'year': 2024, 'cited_by_count': 23}, {'year': 2023, 'cited_by_count': 24}, {'year': 2022, 'cited_by_count': 25}, {'year': 2021, 'cited_by_count': 16}, {'year': 2020, 'cited_by_count': 16}, {'year': 2019, 'cited_by_count': 2}], 'updated_date': '2024-12-14T19:54:47.778617', 'created_date': '2018-12-22'}