Publication Information

{'id': 'https://openalex.org/W2593506445', 'doi': 'https://doi.org/10.1109/imcec.2016.7867326', 'title': 'New write operation scheme for alleviating effect of line resistance on RRAM crossbar array', 'display_name': 'New write operation scheme for alleviating effect of line resistance on RRAM crossbar array', 'publication_year': 2016, 'publication_date': '2016-10-01', 'ids': {'openalex': 'https://openalex.org/W2593506445', 'doi': 'https://doi.org/10.1109/imcec.2016.7867326', 'mag': '2593506445'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/imcec.2016.7867326', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'proceedings-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5100758097', 'display_name': 'Jiwei Li', 'orcid': 'https://orcid.org/0000-0002-7580-5431'}, 'institutions': [{'id': 'https://openalex.org/I170215575', 'display_name': 'National University of Defense Technology', 'ror': 'https://ror.org/05d2yfz11', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I170215575']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'None Jiwei Li', 'raw_affiliation_strings': ['College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China'], 'affiliations': [{'raw_affiliation_string': 'College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China', 'institution_ids': ['https://openalex.org/I170215575']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5077533270', 'display_name': 'Hui Xu', 'orcid': 'https://orcid.org/0000-0003-2970-3984'}, 'institutions': [{'id': 'https://openalex.org/I170215575', 'display_name': 'National University of Defense Technology', 'ror': 'https://ror.org/05d2yfz11', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I170215575']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Hui Xu', 'raw_affiliation_strings': ['National University of Defense Technology, Changsha, Hunan, CN'], 'affiliations': [{'raw_affiliation_string': 'National University of Defense Technology, Changsha, Hunan, CN', 'institution_ids': ['https://openalex.org/I170215575']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5086948087', 'display_name': 'Jinling Xing', 'orcid': 'https://orcid.org/0000-0002-8700-9483'}, 'institutions': [{'id': 'https://openalex.org/I170215575', 'display_name': 'National University of Defense Technology', 'ror': 'https://ror.org/05d2yfz11', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I170215575']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Jinling Xing', 'raw_affiliation_strings': ['College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China'], 'affiliations': [{'raw_affiliation_string': 'College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China', 'institution_ids': ['https://openalex.org/I170215575']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5065807503', 'display_name': 'Bing Song', 'orcid': 'https://orcid.org/0000-0002-9450-7579'}, 'institutions': [{'id': 'https://openalex.org/I170215575', 'display_name': 'National University of Defense Technology', 'ror': 'https://ror.org/05d2yfz11', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I170215575']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'None Bing Song', 'raw_affiliation_strings': ['College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China'], 'affiliations': [{'raw_affiliation_string': 'College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China', 'institution_ids': ['https://openalex.org/I170215575']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5100358496', 'display_name': 'Sen Liu', 'orcid': 'https://orcid.org/0000-0002-7198-9106'}, 'institutions': [{'id': 'https://openalex.org/I170215575', 'display_name': 'National University of Defense Technology', 'ror': 'https://ror.org/05d2yfz11', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I170215575']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'None Sen Liu', 'raw_affiliation_strings': ['College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China'], 'affiliations': [{'raw_affiliation_string': 'College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China', 'institution_ids': ['https://openalex.org/I170215575']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5100409085', 'display_name': 'Zhiwei Li', 'orcid': 'https://orcid.org/0000-0002-6238-2660'}, 'institutions': [{'id': 'https://openalex.org/I170215575', 'display_name': 'National University of Defense Technology', 'ror': 'https://ror.org/05d2yfz11', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I170215575']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'None Zhiwei Li', 'raw_affiliation_strings': ['College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China'], 'affiliations': [{'raw_affiliation_string': 'College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China', 'institution_ids': ['https://openalex.org/I170215575']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5100392064', 'display_name': 'Wei Wang', 'orcid': 'https://orcid.org/0000-0002-7180-831X'}, 'institutions': [{'id': 'https://openalex.org/I170215575', 'display_name': 'National University of Defense Technology', 'ror': 'https://ror.org/05d2yfz11', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I170215575']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'None Wei Wang', 'raw_affiliation_strings': ['College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China'], 'affiliations': [{'raw_affiliation_string': 'College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China', 'institution_ids': ['https://openalex.org/I170215575']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5102990218', 'display_name': 'Qingjiang Li', 'orcid': 'https://orcid.org/0000-0001-9779-3198'}, 'institutions': [{'id': 'https://openalex.org/I170215575', 'display_name': 'National University of Defense Technology', 'ror': 'https://ror.org/05d2yfz11', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I170215575']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'None Qingjiang Li', 'raw_affiliation_strings': ['College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China'], 'affiliations': [{'raw_affiliation_string': 'College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China', 'institution_ids': ['https://openalex.org/I170215575']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5100734666', 'display_name': 'Haijun Liu', 'orcid': 'https://orcid.org/0000-0002-5094-5411'}, 'institutions': [{'id': 'https://openalex.org/I170215575', 'display_name': 'National University of Defense Technology', 'ror': 'https://ror.org/05d2yfz11', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I170215575']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'None Haijun Liu', 'raw_affiliation_strings': ['College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China'], 'affiliations': [{'raw_affiliation_string': 'College of Electronic Science and Engineering, National University of Defense Technology, Changsha, P.R China', 'institution_ids': ['https://openalex.org/I170215575']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 2, 'citation_normalized_percentile': {'value': 0.436554, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 73, 'max': 77}, 'biblio': {'volume': None, 'issue': None, 'first_page': '830', 'last_page': '834'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12808', 'display_name': 'Ferroelectric and Negative Capacitance Devices', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12808', 'display_name': 'Ferroelectric and Negative Capacitance Devices', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10502', 'display_name': 'Advanced Memory and Neural Computing', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10472', 'display_name': 'Semiconductor materials and devices', 'score': 0.9994, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/line', 'display_name': 'Line (geometry)', 'score': 0.573656}, {'id': 'https://openalex.org/keywords/biasing', 'display_name': 'Biasing', 'score': 0.4150917}], 'concepts': [{'id': 'https://openalex.org/C182019814', 'wikidata': 'https://www.wikidata.org/wiki/Q1143830', 'display_name': 'Resistive random-access memory', 'level': 3, 'score': 0.9350383}, {'id': 'https://openalex.org/C29984679', 'wikidata': 'https://www.wikidata.org/wiki/Q1929149', 'display_name': 'Crossbar switch', 'level': 2, 'score': 0.91013956}, {'id': 'https://openalex.org/C137488568', 'wikidata': 'https://www.wikidata.org/wiki/Q5321', 'display_name': 'Resistor', 'level': 3, 'score': 0.7523196}, {'id': 'https://openalex.org/C77618280', 'wikidata': 'https://www.wikidata.org/wiki/Q1155772', 'display_name': 'Scheme (mathematics)', 'level': 2, 'score': 0.6472695}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.61108804}, {'id': 'https://openalex.org/C198352243', 'wikidata': 'https://www.wikidata.org/wiki/Q37105', 'display_name': 'Line (geometry)', 'level': 2, 'score': 0.573656}, {'id': 'https://openalex.org/C165801399', 'wikidata': 'https://www.wikidata.org/wiki/Q25428', 'display_name': 'Voltage', 'level': 2, 'score': 0.5534386}, {'id': 'https://openalex.org/C2780365114', 'wikidata': 'https://www.wikidata.org/wiki/Q169478', 'display_name': 'MATLAB', 'level': 2, 'score': 0.52636606}, {'id': 'https://openalex.org/C24326235', 'wikidata': 'https://www.wikidata.org/wiki/Q126095', 'display_name': 'Electronic engineering', 'level': 1, 'score': 0.46277627}, {'id': 'https://openalex.org/C20254490', 'wikidata': 'https://www.wikidata.org/wiki/Q719550', 'display_name': 'Biasing', 'level': 3, 'score': 0.4150917}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.40461382}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.23161578}, {'id': 'https://openalex.org/C76155785', 'wikidata': 'https://www.wikidata.org/wiki/Q418', 'display_name': 'Telecommunications', 'level': 1, 'score': 0.10775837}, {'id': 'https://openalex.org/C134306372', 'wikidata': 'https://www.wikidata.org/wiki/Q7754', 'display_name': 'Mathematical analysis', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C2524010', 'wikidata': 'https://www.wikidata.org/wiki/Q8087', 'display_name': 'Geometry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C33923547', 'wikidata': 'https://www.wikidata.org/wiki/Q395', 'display_name': 'Mathematics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C111919701', 'wikidata': 'https://www.wikidata.org/wiki/Q9135', 'display_name': 'Operating system', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/imcec.2016.7867326', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'display_name': 'Affordable and clean energy', 'id': 'https://metadata.un.org/sdg/7', 'score': 0.72}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 11, 'referenced_works': ['https://openalex.org/W1493017827', 'https://openalex.org/W1979042539', 'https://openalex.org/W2031559328', 'https://openalex.org/W2035373681', 'https://openalex.org/W2040094671', 'https://openalex.org/W2091651547', 'https://openalex.org/W2126856948', 'https://openalex.org/W2133557550', 'https://openalex.org/W2150313118', 'https://openalex.org/W2156555351', 'https://openalex.org/W2398710777'], 'related_works': ['https://openalex.org/W4385624997', 'https://openalex.org/W4306751418', 'https://openalex.org/W4301187613', 'https://openalex.org/W4232634182', 'https://openalex.org/W3176428941', 'https://openalex.org/W3089883684', 'https://openalex.org/W3008646524', 'https://openalex.org/W3005999147', 'https://openalex.org/W2923038022', 'https://openalex.org/W2593506445'], 'abstract_inverted_index': {'Crossbar': [0], 'is': [1, 25, 82], 'the': [2, 11, 22, 27, 32, 38, 55, 78, 92], 'basic': [3], 'structure': [4, 47], 'for': [5, 67], 'RRAM': [6, 19, 44], 'massive': [7], 'applications,': [8], 'while': [9], 'as': [10], 'increase': [12], 'of': [13, 18, 37, 77, 94], 'integration': [14], 'level': [15], 'and': [16, 34, 59, 89], 'density': [17], 'crossbar': [20, 97], 'array,': [21], 'line': [23, 56], 'resistance': [24, 57], 'becoming': [26], 'key': [28], 'problem,': [29], 'which': [30], 'affects': [31], 'write': [33, 64, 68], 'read': [35], 'operation': [36], 'device': [39], 'in': [40, 87], 'array.': [41, 98], 'Based': [42], 'on': [43, 91], '1D-1R(1-diode': [45], '1-resistor)': [46], 'with': [48], 'V/3': [49], 'bias': [50, 80], 'scheme,': [51], 'this': [52], 'paper': [53], 'analyzes': [54], 'problem': [58], 'puts': [60], 'forward': [61], 'a': [62], 'new': [63], 'voltage': [65, 70], 'scheme': [66, 81], 'operation:': [69], 'source': [71], 'coefficient': [72], 'adjusting': [73], 'scheme.': [74], 'The': [75], 'functionality': [76], 'proposed': [79], 'verified': [83], 'by': [84], 'numerical': [85], 'simulation': [86], 'Matlab': [88], 'LTSpice': [90], 'case': [93], '32×32': [95], '1D-1R': [96]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2593506445', 'counts_by_year': [{'year': 2024, 'cited_by_count': 1}, {'year': 2021, 'cited_by_count': 1}], 'updated_date': '2024-12-11T09:34:27.105433', 'created_date': '2017-03-16'}