The synthesis, characterization and phase stability of tin sulfides (SnS2, SnS and Sn2S3) films deposited by ultrasonic spray

Name: Work Video:
Duration: 3 min 30 s
Imen Bouhaf Kherchachi; A. Attaf; H. Saïdi; Adel bouhdjar; Hamza bendjdidi; Y. Benkhetta; Rahil Azizi
{'id': 'https://openalex.org/W2519523397', 'doi': 'https://doi.org/10.3233/mgc-160202', 'title': 'The synthesis, characterization and phase stability of tin sulfides (SnS2, SnS and Sn2S3) films deposited by ultrasonic spray', 'display_name': 'The synthesis, characterization and phase stability of tin sulfides (SnS2, SnS and Sn2S3) films deposited by ultrasonic spray', 'publication_year': 2016, 'publication_date': '2016-09-15', 'ids': {'openalex': 'https://openalex.org/W2519523397', 'doi': 'https://doi.org/10.3233/mgc-160202', 'mag': '2519523397'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.3233/mgc-160202', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S190123960', 'display_name': 'Main Group Chemistry', 'issn_l': '1024-1221', 'issn': ['1024-1221', '1026-7581', '1745-1167'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310318577', 'host_organization_name': 'IOS Press', 'host_organization_lineage': ['https://openalex.org/P4310318577'], 'host_organization_lineage_names': ['IOS Press'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5013909493', 'display_name': 'Imen Bouhaf Kherchachi', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I206961696', 'display_name': 'University of Biskra', 'ror': 'https://ror.org/05fr5y859', 'country_code': 'DZ', 'type': 'education', 'lineage': ['https://openalex.org/I206961696']}], 'countries': ['DZ'], 'is_corresponding': True, 'raw_author_name': 'Imen Bouhaf Kherchachi', 'raw_affiliation_strings': ['Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria'], 'affiliations': [{'raw_affiliation_string': 'Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria', 'institution_ids': ['https://openalex.org/I206961696']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5026531559', 'display_name': 'A. Attaf', 'orcid': 'https://orcid.org/0000-0003-2477-9613'}, 'institutions': [{'id': 'https://openalex.org/I206961696', 'display_name': 'University of Biskra', 'ror': 'https://ror.org/05fr5y859', 'country_code': 'DZ', 'type': 'education', 'lineage': ['https://openalex.org/I206961696']}], 'countries': ['DZ'], 'is_corresponding': False, 'raw_author_name': 'Abdallah Attaf', 'raw_affiliation_strings': ['Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria'], 'affiliations': [{'raw_affiliation_string': 'Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria', 'institution_ids': ['https://openalex.org/I206961696']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5006364156', 'display_name': 'H. Saïdi', 'orcid': 'https://orcid.org/0000-0001-6769-4359'}, 'institutions': [{'id': 'https://openalex.org/I206961696', 'display_name': 'University of Biskra', 'ror': 'https://ror.org/05fr5y859', 'country_code': 'DZ', 'type': 'education', 'lineage': ['https://openalex.org/I206961696']}], 'countries': ['DZ'], 'is_corresponding': False, 'raw_author_name': 'Hanane Saidi', 'raw_affiliation_strings': ['Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria'], 'affiliations': [{'raw_affiliation_string': 'Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria', 'institution_ids': ['https://openalex.org/I206961696']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5110332770', 'display_name': 'Adel bouhdjar', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I206961696', 'display_name': 'University of Biskra', 'ror': 'https://ror.org/05fr5y859', 'country_code': 'DZ', 'type': 'education', 'lineage': ['https://openalex.org/I206961696']}], 'countries': ['DZ'], 'is_corresponding': False, 'raw_author_name': 'Adel Bouhdjar', 'raw_affiliation_strings': ['Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria'], 'affiliations': [{'raw_affiliation_string': 'Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria', 'institution_ids': ['https://openalex.org/I206961696']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5036254317', 'display_name': 'Hamza bendjdidi', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I206961696', 'display_name': 'University of Biskra', 'ror': 'https://ror.org/05fr5y859', 'country_code': 'DZ', 'type': 'education', 'lineage': ['https://openalex.org/I206961696']}], 'countries': ['DZ'], 'is_corresponding': False, 'raw_author_name': 'Hamza Bendjdidi', 'raw_affiliation_strings': ['Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria'], 'affiliations': [{'raw_affiliation_string': 'Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria', 'institution_ids': ['https://openalex.org/I206961696']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5038568547', 'display_name': 'Y. Benkhetta', 'orcid': 'https://orcid.org/0000-0001-7861-3972'}, 'institutions': [{'id': 'https://openalex.org/I206961696', 'display_name': 'University of Biskra', 'ror': 'https://ror.org/05fr5y859', 'country_code': 'DZ', 'type': 'education', 'lineage': ['https://openalex.org/I206961696']}], 'countries': ['DZ'], 'is_corresponding': False, 'raw_author_name': 'Benkhetta Youcef', 'raw_affiliation_strings': ['Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria'], 'affiliations': [{'raw_affiliation_string': 'Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria', 'institution_ids': ['https://openalex.org/I206961696']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5112214067', 'display_name': 'Rahil Azizi', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I206961696', 'display_name': 'University of Biskra', 'ror': 'https://ror.org/05fr5y859', 'country_code': 'DZ', 'type': 'education', 'lineage': ['https://openalex.org/I206961696']}], 'countries': ['DZ'], 'is_corresponding': False, 'raw_author_name': 'Rahil Azizi', 'raw_affiliation_strings': ['Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria'], 'affiliations': [{'raw_affiliation_string': 'Physic Laboratory of Thin Films and Applications LPCMA, University of Biskra, Biskra, Algeria', 'institution_ids': ['https://openalex.org/I206961696']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': ['https://openalex.org/A5013909493'], 'corresponding_institution_ids': ['https://openalex.org/I206961696'], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 7, 'citation_normalized_percentile': {'value': 0.680196, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 83, 'max': 84}, 'biblio': {'volume': '15', 'issue': '3', 'first_page': '231', 'last_page': '242'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10590', 'display_name': 'Chalcogenide Semiconductor Thin Films', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10590', 'display_name': 'Chalcogenide Semiconductor Thin Films', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10321', 'display_name': 'Quantum Dots Synthesis And Properties', 'score': 0.9993, 'subfield': {'id': 'https://openalex.org/subfields/2505', 'display_name': 'Materials Chemistry'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11853', 'display_name': 'Semiconductor materials and interfaces', 'score': 0.9943, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/deposition', 'display_name': 'Deposition', 'score': 0.6555027}], 'concepts': [{'id': 'https://openalex.org/C137637335', 'wikidata': 'https://www.wikidata.org/wiki/Q899604', 'display_name': 'Crystallite', 'level': 2, 'score': 0.730444}, {'id': 'https://openalex.org/C525849907', 'wikidata': 'https://www.wikidata.org/wiki/Q1096', 'display_name': 'Tin', 'level': 2, 'score': 0.7076567}, {'id': 'https://openalex.org/C64297162', 'wikidata': 'https://www.wikidata.org/wiki/Q1987070', 'display_name': 'Deposition (geology)', 'level': 3, 'score': 0.6555027}, {'id': 'https://openalex.org/C19067145', 'wikidata': 'https://www.wikidata.org/wiki/Q1137203', 'display_name': 'Thin film', 'level': 2, 'score': 0.6424154}, {'id': 'https://openalex.org/C69990965', 'wikidata': 'https://www.wikidata.org/wiki/Q65402698', 'display_name': 'Electrical resistivity and conductivity', 'level': 2, 'score': 0.60757357}, {'id': 'https://openalex.org/C181966813', 'wikidata': 'https://www.wikidata.org/wiki/Q806352', 'display_name': 'Band gap', 'level': 2, 'score': 0.5226019}, {'id': 'https://openalex.org/C113196181', 'wikidata': 'https://www.wikidata.org/wiki/Q485223', 'display_name': 'Analytical Chemistry (journal)', 'level': 2, 'score': 0.5147181}, {'id': 'https://openalex.org/C44280652', 'wikidata': 'https://www.wikidata.org/wiki/Q104837', 'display_name': 'Phase (matter)', 'level': 2, 'score': 0.505548}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.48434365}, {'id': 'https://openalex.org/C2777289219', 'wikidata': 'https://www.wikidata.org/wiki/Q7632154', 'display_name': 'Substrate (aquarium)', 'level': 2, 'score': 0.48349005}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.43408057}, {'id': 'https://openalex.org/C150493377', 'wikidata': 'https://www.wikidata.org/wiki/Q1427863', 'display_name': 'Transmittance', 'level': 2, 'score': 0.41951048}, {'id': 'https://openalex.org/C42360764', 'wikidata': 'https://www.wikidata.org/wiki/Q83588', 'display_name': 'Chemical engineering', 'level': 1, 'score': 0.36114007}, {'id': 'https://openalex.org/C191897082', 'wikidata': 'https://www.wikidata.org/wiki/Q11467', 'display_name': 'Metallurgy', 'level': 1, 'score': 0.1938892}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.18511066}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.16972089}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.04376948}, {'id': 'https://openalex.org/C43617362', 'wikidata': 'https://www.wikidata.org/wiki/Q170050', 'display_name': 'Chromatography', 'level': 1, 'score': 0.03843558}, {'id': 'https://openalex.org/C2816523', 'wikidata': 'https://www.wikidata.org/wiki/Q180184', 'display_name': 'Sediment', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C127313418', 'wikidata': 'https://www.wikidata.org/wiki/Q1069', 'display_name': 'Geology', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C86803240', 'wikidata': 'https://www.wikidata.org/wiki/Q420', 'display_name': 'Biology', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C178790620', 'wikidata': 'https://www.wikidata.org/wiki/Q11351', 'display_name': 'Organic chemistry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C151730666', 'wikidata': 'https://www.wikidata.org/wiki/Q7205', 'display_name': 'Paleontology', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C111368507', 'wikidata': 'https://www.wikidata.org/wiki/Q43518', 'display_name': 'Oceanography', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.3233/mgc-160202', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S190123960', 'display_name': 'Main Group Chemistry', 'issn_l': '1024-1221', 'issn': ['1024-1221', '1026-7581', '1745-1167'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310318577', 'host_organization_name': 'IOS Press', 'host_organization_lineage': ['https://openalex.org/P4310318577'], 'host_organization_lineage_names': ['IOS Press'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 52, 'referenced_works': ['https://openalex.org/W1618836367', 'https://openalex.org/W1633636013', 'https://openalex.org/W1965119374', 'https://openalex.org/W1972664212', 'https://openalex.org/W1974085346', 'https://openalex.org/W1976072791', 'https://openalex.org/W1976207766', 'https://openalex.org/W1979924572', 'https://openalex.org/W1984742074', 'https://openalex.org/W1991851165', 'https://openalex.org/W1995456336', 'https://openalex.org/W1997055759', 'https://openalex.org/W1997604680', 'https://openalex.org/W1998327040', 'https://openalex.org/W2004161590', 'https://openalex.org/W2006300585', 'https://openalex.org/W2009006748', 'https://openalex.org/W2009867097', 'https://openalex.org/W2016240045', 'https://openalex.org/W2019316594', 'https://openalex.org/W2022517497', 'https://openalex.org/W2032579631', 'https://openalex.org/W2036990014', 'https://openalex.org/W2039057844', 'https://openalex.org/W2040130987', 'https://openalex.org/W2041438810', 'https://openalex.org/W2047960742', 'https://openalex.org/W2049715137', 'https://openalex.org/W2049850812', 'https://openalex.org/W2053851007', 'https://openalex.org/W2056974716', 'https://openalex.org/W2059886575', 'https://openalex.org/W2070005737', 'https://openalex.org/W2074848262', 'https://openalex.org/W2076715784', 'https://openalex.org/W2086393093', 'https://openalex.org/W2092226415', 'https://openalex.org/W2094188664', 'https://openalex.org/W2108931874', 'https://openalex.org/W2113442231', 'https://openalex.org/W2116307790', 'https://openalex.org/W2118466746', 'https://openalex.org/W2135612631', 'https://openalex.org/W2136622613', 'https://openalex.org/W2161065062', 'https://openalex.org/W2165296897', 'https://openalex.org/W2316179482', 'https://openalex.org/W2470958752', 'https://openalex.org/W2551674503', 'https://openalex.org/W2735106119', 'https://openalex.org/W3158419683', 'https://openalex.org/W632882335'], 'related_works': ['https://openalex.org/W4244232650', 'https://openalex.org/W2492470561', 'https://openalex.org/W2332218522', 'https://openalex.org/W2312192749', 'https://openalex.org/W2273391071', 'https://openalex.org/W2233460958', 'https://openalex.org/W2040310861', 'https://openalex.org/W1983393460', 'https://openalex.org/W1483162499', 'https://openalex.org/W1148372108'], 'abstract_inverted_index': {'In': [0, 100], 'this': [1, 102], 'study,': [2], 'we': [3], 'will': [4], 'deal': [5], 'with': [6, 39, 148], 'the': [7, 76, 134, 157, 162], 'influences': [8], 'of': [9, 18, 43, 87, 93, 118], 'deposition': [10, 41, 151, 166], 'time': [11, 42], 'on': [12, 34, 161], 'structural,': [13], 'optical': [14, 72], 'and': [15, 56, 75, 96, 113, 140, 165], 'electrical': [16, 77], 'properties': [17], 'SnxSy': [19, 29, 88], 'films': [20, 31, 63, 89, 125], 'which': [21], 'have': [22], 'grown': [23], 'through': [24], 'ultrasonic': [25], 'spray': [26], 'technique.': [27], 'The': [28, 61, 70, 82, 116], 'thin': [30], 'are': [32, 130], 'deposited': [33, 126], 'glass': [35], 'substrate': [36], 'at': [37, 127], '300°C': [38], 'a': [40, 141], 't': [44], '=': [45], '2': [46], 'min-10': [47], 'min,': [48], 'using': [49], 'tw': [50], 'o': [51], 'precursors:': [52], 'tin': [53, 57], '(II)': [54], 'chloride': [55], '(IV)': [58], 'chloride,': [59], 'respectively.': [60], 'obtained': [62], 'were': [64], 'characterized': [65], 'by': [66, 79], 'X-ray': [67, 83], 'diffraction': [68, 84], '(XRD),': [69], 'UV–VIS–NIR': [71], 'transmittance': [73, 132], 'measurements': [74, 154], 'resistivity': [78, 158], 'four': [80], '-points.': [81], '(XRD)': [85], 'analysis': [86, 103], 'indicates': [90], 'three': [91], 'phases': [92, 98], 'SnS2,': [94], 'SnS': [95, 112], 'Sn2S3': [97, 114], 'crystallites.': [99], 'addition,': [101], 'revealed': [104], 'that': [105, 124, 156], 'SnS2': [106], 'phase': [107], 'stability': [108], 'is': [109], 'superior': [110], 'than': [111], 'stability.': [115], 'results': [117], '(UV)': [119], 'spectroscopy': [120], 'visible': [121, 135], 'spectrum': [122], 'demonstrate': [123], '10': [128], 'min': [129], 'low': [131], 'in': [133, 150], 'region': [136], 'for': [137], 'two': [138], 'precursors,': [139], 'direct': [142], 'band': [143], 'gap': [144], 'found': [145], 'to': [146], 'decrease': [147], 'increase': [149], 'time.': [152, 167], 'Electrical': [153], 'indicate': [155], 'behavior': [159], 'depends': [160], 'used': [163], 'precursors': [164]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2519523397', 'counts_by_year': [{'year': 2024, 'cited_by_count': 1}, {'year': 2023, 'cited_by_count': 2}, {'year': 2022, 'cited_by_count': 2}, {'year': 2021, 'cited_by_count': 1}, {'year': 2020, 'cited_by_count': 1}], 'updated_date': '2025-01-03T08:26:20.707945', 'created_date': '2016-09-23'}
Publication Information

Basic Information

Access and Citation

AI Researcher Chatbot

Primary Location

Authors

Topics

Keywords

Related Works
