Title: Ultrasonic reflection wave frequency-domain method for the thickness measurement of ultra-thin elastic plate
Abstract: A novel ultrasonic longitudinal reflection wave frequency-domain method suitable for measuring the thickness of ultra-thin elastic layer is presented.The relative reflection transfer function of ultra-thin layer was derived.In the least squares-error sense,an inverse algorithm was used to characterize the layer thickness on the basis of amplitude,phase and complex spectrum.Main sources of estimate deviation were analyzed.The sensitivity of the relative reflection transfer function to the layer thickness and its importance in the transfer of errors were discussed.It is observed in the experiment that the method can measure the thickness of an elastic aluminum layer less than one percent of the wavelength within a relative error of 2.5%.The result obtained on the basis of the amplitude spectrum is the most accurate.The relative reflection transfer function method can characterize the thickness of ultra-thin elastic layer effectively.The accuracy of this method is mainly dependent on the sensitivity of the relative reflection transfer function to the layer thickness and the measurement error.
Publication Year: 2008
Publication Date: 2008-01-01
Language: en
Type: article
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