Publication Information

{'id': 'https://openalex.org/W2322825932', 'doi': 'https://doi.org/10.1093/jmicro/dfs048', 'title': 'From the physics of secondary electron emission to image contrasts in scanning electron microscopy', 'display_name': 'From the physics of secondary electron emission to image contrasts in scanning electron microscopy', 'publication_year': 2012, 'publication_date': '2012-08-07', 'ids': {'openalex': 'https://openalex.org/W2322825932', 'doi': 'https://doi.org/10.1093/jmicro/dfs048', 'mag': '2322825932', 'pmid': 'https://pubmed.ncbi.nlm.nih.gov/22872280'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1093/jmicro/dfs048', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S145845511', 'display_name': 'Journal of Electron Microscopy', 'issn_l': '0022-0744', 'issn': ['0022-0744', '1477-9986'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311648', 'host_organization_name': 'Oxford University Press', 'host_organization_lineage': ['https://openalex.org/P4310311647', 'https://openalex.org/P4310311648'], 'host_organization_lineage_names': ['University of Oxford', 'Oxford University Press'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref', 'pubmed'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5068894623', 'display_name': 'J. Cazaux', 'orcid': None}, 'institutions': [], 'countries': ['FR'], 'is_corresponding': True, 'raw_author_name': 'J. Cazaux', 'raw_affiliation_strings': ["Laboratoire d'Ingénierie et Sciences des Matériaux (LISM), EA 4695, Faculty of Sciences, BP 1039, 51687 Reims Cedex 2, France"], 'affiliations': [{'raw_affiliation_string': "Laboratoire d'Ingénierie et Sciences des Matériaux (LISM), EA 4695, Faculty of Sciences, BP 1039, 51687 Reims Cedex 2, France", 'institution_ids': []}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 0, 'corresponding_author_ids': ['https://openalex.org/A5068894623'], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 1.995, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 61, 'citation_normalized_percentile': {'value': 0.904786, 'is_in_top_1_percent': False, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 96, 'max': 97}, 'biblio': {'volume': '61', 'issue': '5', 'first_page': '261', 'last_page': '284'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12039', 'display_name': 'Surface Analysis and Electron Spectroscopy Techniques', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12039', 'display_name': 'Surface Analysis and Electron Spectroscopy Techniques', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10857', 'display_name': 'Cryo-Electron Microscopy Techniques', 'score': 0.9995, 'subfield': {'id': 'https://openalex.org/subfields/1315', 'display_name': 'Structural Biology'}, 'field': {'id': 'https://openalex.org/fields/13', 'display_name': 'Biochemistry, Genetics and Molecular Biology'}, 'domain': {'id': 'https://openalex.org/domains/1', 'display_name': 'Life Sciences'}}, {'id': 'https://openalex.org/T11338', 'display_name': 'Electron Beam Lithography: Resolution and Applications', 'score': 0.9965, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/secondary-electron-emission', 'display_name': 'Secondary Electron Emission', 'score': 0.571754}, {'id': 'https://openalex.org/keywords/environmental-scanning-electron-microscopy', 'display_name': 'Environmental Scanning Electron Microscopy', 'score': 0.561654}, {'id': 'https://openalex.org/keywords/scanning-electron-microscopy', 'display_name': 'Scanning Electron Microscopy', 'score': 0.559194}, {'id': 'https://openalex.org/keywords/ambient-pressure-photoelectron-spectroscopy', 'display_name': 'Ambient Pressure Photoelectron Spectroscopy', 'score': 0.504771}], 'concepts': [{'id': 'https://openalex.org/C161191863', 'wikidata': 'https://www.wikidata.org/wiki/Q199655', 'display_name': 'Library science', 'level': 1, 'score': 0.40288872}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.37447143}, {'id': 'https://openalex.org/C52119013', 'wikidata': 'https://www.wikidata.org/wiki/Q50637', 'display_name': 'Art history', 'level': 1, 'score': 0.3681541}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.350958}, {'id': 'https://openalex.org/C142362112', 'wikidata': 'https://www.wikidata.org/wiki/Q735', 'display_name': 'Art', 'level': 0, 'score': 0.3314314}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.24330238}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.1554183}], 'mesh': [{'descriptor_ui': 'D004583', 'descriptor_name': 'Electrons', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': True}, {'descriptor_ui': 'D007091', 'descriptor_name': 'Image Processing, Computer-Assisted', 'qualifier_ui': 'Q000379', 'qualifier_name': 'methods', 'is_major_topic': True}, {'descriptor_ui': 'D008855', 'descriptor_name': 'Microscopy, Electron, Scanning', 'qualifier_ui': 'Q000379', 'qualifier_name': 'methods', 'is_major_topic': True}, {'descriptor_ui': 'D007091', 'descriptor_name': 'Image Processing, Computer-Assisted', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}, {'descriptor_ui': 'D008855', 'descriptor_name': 'Microscopy, Electron, Scanning', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}, {'descriptor_ui': 'D008962', 'descriptor_name': 'Models, Theoretical', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}, {'descriptor_ui': 'D010825', 'descriptor_name': 'Physics', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}], 'locations_count': 2, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1093/jmicro/dfs048', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S145845511', 'display_name': 'Journal of Electron Microscopy', 'issn_l': '0022-0744', 'issn': ['0022-0744', '1477-9986'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311648', 'host_organization_name': 'Oxford University Press', 'host_organization_lineage': ['https://openalex.org/P4310311647', 'https://openalex.org/P4310311648'], 'host_organization_lineage_names': ['University of Oxford', 'Oxford University Press'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, {'is_oa': False, 'landing_page_url': 'https://pubmed.ncbi.nlm.nih.gov/22872280', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306525036', 'display_name': 'PubMed', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/I1299303238', 'host_organization_name': 'National Institutes of Health', 'host_organization_lineage': ['https://openalex.org/I1299303238'], 'host_organization_lineage_names': ['National Institutes of Health'], 'type': 'repository'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'id': 'https://metadata.un.org/sdg/7', 'display_name': 'Affordable and clean energy', 'score': 0.9}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 59, 'referenced_works': ['https://openalex.org/W1677611805', 'https://openalex.org/W1965862228', 'https://openalex.org/W1968249116', 'https://openalex.org/W1970289731', 'https://openalex.org/W1973747903', 'https://openalex.org/W1974704849', 'https://openalex.org/W1977346288', 'https://openalex.org/W1986218733', 'https://openalex.org/W1991242079', 'https://openalex.org/W1994943842', 'https://openalex.org/W2004432881', 'https://openalex.org/W2011341252', 'https://openalex.org/W2014087532', 'https://openalex.org/W2015001960', 'https://openalex.org/W2015967853', 'https://openalex.org/W2017007572', 'https://openalex.org/W2017516680', 'https://openalex.org/W2017987599', 'https://openalex.org/W2018001094', 'https://openalex.org/W2019065836', 'https://openalex.org/W2021264365', 'https://openalex.org/W2021350053', 'https://openalex.org/W2021750627', 'https://openalex.org/W2023633844', 'https://openalex.org/W2024773820', 'https://openalex.org/W2025476899', 'https://openalex.org/W2027731825', 'https://openalex.org/W2028747373', 'https://openalex.org/W2037800860', 'https://openalex.org/W2041772617', 'https://openalex.org/W2042848576', 'https://openalex.org/W2043449730', 'https://openalex.org/W2050149746', 'https://openalex.org/W2051091336', 'https://openalex.org/W2051433637', 'https://openalex.org/W2053417047', 'https://openalex.org/W2056847869', 'https://openalex.org/W2060277567', 'https://openalex.org/W2060952628', 'https://openalex.org/W2062033830', 'https://openalex.org/W2062887854', 'https://openalex.org/W2068664063', 'https://openalex.org/W2068755221', 'https://openalex.org/W2069629883', 'https://openalex.org/W2071516090', 'https://openalex.org/W2076557927', 'https://openalex.org/W2077793170', 'https://openalex.org/W2080405135', 'https://openalex.org/W2083833665', 'https://openalex.org/W2093983303', 'https://openalex.org/W2095209682', 'https://openalex.org/W2095540552', 'https://openalex.org/W2106603672', 'https://openalex.org/W2122022010', 'https://openalex.org/W2155068629', 'https://openalex.org/W2158252203', 'https://openalex.org/W35874179', 'https://openalex.org/W4210942180', 'https://openalex.org/W4255203927'], 'related_works': ['https://openalex.org/W4387497383', 'https://openalex.org/W3193615524', 'https://openalex.org/W3183948672', 'https://openalex.org/W3173606202', 'https://openalex.org/W3110381201', 'https://openalex.org/W2948807893', 'https://openalex.org/W2778153218', 'https://openalex.org/W2758277628', 'https://openalex.org/W2748952813', 'https://openalex.org/W1531601525'], 'abstract_inverted_index': {'Journal': [0, 63], 'Article': [1, 80], 'From': [2], 'the': [3], 'physics': [4], 'of': [5, 33, 64], 'secondary': [6], 'electron': [7, 14], 'emission': [8], 'to': [9], 'image': [10], 'contrasts': [11], 'in': [12], 'scanning': [13], 'microscopy': [15], 'Get': [16], 'access': [17], 'Jacques': [18, 20], 'Cazaux': [19, 21], '*': [22], 'Laboratoire': [23], "d'Ingénierie": [24], 'et': [25], 'Sciences': [26], 'des': [27], 'Matériaux': [28], '(LISM),': [29], 'EA': [30], '4695,': [31], 'Faculty': [32], 'Sciences,': [34], 'BP': [35], '1039,': [36], '51687': [37], 'Reims': [38], 'Cedex': [39], '2,': [40], 'France': [41], '*To': [42], 'whom': [43], 'correspondence': [44], 'should': [45], 'be': [46], 'addressed.': [47], 'Email:': [48], '[email protected]': [49], 'Search': [50], 'for': [51], 'other': [52], 'works': [53], 'by': [54], 'this': [55], 'author': [56], 'on:': [57], 'Oxford': [58], 'Academic': [59], 'PubMed': [60], 'Google': [61], 'Scholar': [62], 'Electron': [65], 'Microscopy,': [66], 'Volume': [67], '61,': [68], 'Issue': [69], '5,': [70], 'October': [71], '2012,': [72], 'Pages': [73], '261–284,': [74], 'https://doi.org/10.1093/jmicro/dfs048': [75], 'Published:': [76, 95], '07': [77, 96], 'August': [78, 97], '2012': [79, 85, 90, 94, 98], 'history': [81], 'Received:': [82], '17': [83], 'January': [84], 'Revision': [86], 'received:': [87], '22': [88], 'April': [89], 'Accepted:': [91], '18': [92], 'May': [93]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2322825932', 'counts_by_year': [{'year': 2024, 'cited_by_count': 5}, {'year': 2023, 'cited_by_count': 5}, {'year': 2022, 'cited_by_count': 2}, {'year': 2021, 'cited_by_count': 6}, {'year': 2020, 'cited_by_count': 7}, {'year': 2019, 'cited_by_count': 12}, {'year': 2018, 'cited_by_count': 5}, {'year': 2017, 'cited_by_count': 2}, {'year': 2016, 'cited_by_count': 5}, {'year': 2015, 'cited_by_count': 6}, {'year': 2014, 'cited_by_count': 5}, {'year': 2012, 'cited_by_count': 1}], 'updated_date': '2024-09-14T06:30:26.096589', 'created_date': '2016-06-24'}