Title: Surface disorder induced Kikuchi features in reflection high-energy electron diffraction patterns of static and growing GaAs(001) films
Abstract: Reflection high-energy electron diffraction (RHEED) investigations have been carried out on reconstructed GaAs(001)-2×4 surfaces under static conditions and during growth by molecular-beam epitaxy. Intensity modulation of streaks in the RHEED patterns is strongly enhanced during growth and high-intensity regions are found at angular positions corresponding to intersections of Kikuchi lines and streaks. The features are explained by a model assuming forward diffuse scattering in the surface layer due to long-range disorder followed by Kikuchi-type diffraction in the bulk.
Publication Year: 1987
Publication Date: 1987-07-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 16
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