Title: Employing On-Chip Jitter Test Circuit for Phase Locked Loop Self-Calibration
Abstract:In this paper, a new adaptive PLL is implemented. This PLL employs a simple yet effective jitter test circuit to monitor the PLL jitter performance. Additionally, it uses a digital control unit to dyn...In this paper, a new adaptive PLL is implemented. This PLL employs a simple yet effective jitter test circuit to monitor the PLL jitter performance. Additionally, it uses a digital control unit to dynamically adjust the switched loop filter to suppress the jitter. By using this structure, the trade-off between the PLL locking speed and jitter performance can be balancedRead More
Publication Year: 2006
Publication Date: 2006-10-01
Language: en
Type: article
Indexed In: ['crossref']
Access and Citation
Cited By Count: 1
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