Get quick answers to your questions about the article from our AI researcher chatbot
{'id': 'https://openalex.org/W2105303594', 'doi': None, 'title': 'Improved measurement of vertical bar V-cb vertical bar using (B)over-bar -> D(*)l(nu)over-bar decays', 'display_name': 'Improved measurement of vertical bar V-cb vertical bar using (B)over-bar -> D(*)l(nu)over-bar decays', 'publication_year': 2002, 'publication_date': '2002-08-01', 'ids': {'openalex': 'https://openalex.org/W2105303594', 'mag': '2105303594'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://kuscholarworks.ku.edu/handle/1808/1312', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': [], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5111512190', 'display_name': 'Raymond G. Ammar', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Raymond G. Ammar', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5078764668', 'display_name': 'D. Besson', 'orcid': 'https://orcid.org/0000-0001-6733-963X'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'David Zeke Besson', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5087536563', 'display_name': 'X. Zhao', 'orcid': 'https://orcid.org/0000-0001-5527-1279'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'X. Zhao', 'raw_affiliation_strings': [], 'affiliations': []}], 'institution_assertions': [], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': False, 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 57}, 'biblio': {'volume': None, 'issue': None, 'first_page': None, 'last_page': None}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T14117', 'display_name': 'Integrated Circuits and Semiconductor Failure Analysis', 'score': 0.9967, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T14117', 'display_name': 'Integrated Circuits and Semiconductor Failure Analysis', 'score': 0.9967, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12169', 'display_name': 'Non-Destructive Testing Techniques', 'score': 0.9752, 'subfield': {'id': 'https://openalex.org/subfields/2210', 'display_name': 'Mechanical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12039', 'display_name': 'Electron and X-Ray Spectroscopy Techniques', 'score': 0.9696, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/bar', 'display_name': 'Bar (unit)', 'score': 0.9413841}], 'concepts': [{'id': 'https://openalex.org/C188721877', 'wikidata': 'https://www.wikidata.org/wiki/Q103510', 'display_name': 'Bar (unit)', 'level': 2, 'score': 0.9413841}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.4286463}, {'id': 'https://openalex.org/C153294291', 'wikidata': 'https://www.wikidata.org/wiki/Q25261', 'display_name': 'Meteorology', 'level': 1, 'score': 0.05373019}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://kuscholarworks.ku.edu/handle/1808/1312', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W806490579', 'https://openalex.org/W798271448', 'https://openalex.org/W3184407471', 'https://openalex.org/W3158542728', 'https://openalex.org/W3133581769', 'https://openalex.org/W3132124828', 'https://openalex.org/W3041929631', 'https://openalex.org/W3028196931', 'https://openalex.org/W3022168500', 'https://openalex.org/W3009577838', 'https://openalex.org/W3003708514', 'https://openalex.org/W3003613782', 'https://openalex.org/W3003269716', 'https://openalex.org/W2950674918', 'https://openalex.org/W2792837628', 'https://openalex.org/W2787776203', 'https://openalex.org/W2593499112', 'https://openalex.org/W2327334076', 'https://openalex.org/W2160151550', 'https://openalex.org/W1912785615'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2105303594', 'counts_by_year': [], 'updated_date': '2024-12-10T18:20:45.550646', 'created_date': '2016-06-24'}