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Title: $Effective depths for surface excitation derived by reflection electron energy‐loss spectroscopy analysis
Abstract: Abstract A method of estimation is proposed for determining the effective depth of surface excitation. For this, the effective differential inverse inelastic mean free path (DIIMFP) is presumed to be represented as a linear combination of theoretical DIIMFPs for surface and bulk excitation, which are derived by the use of optical dielectric constants. The effective DIIMFP in the approach is derived by a reflected electron energy‐loss spectroscopy analysis based on the extended Landau approach. The present analysis for 1 kV electrons has led to a simple estimation of the effective depth for surface excitations (∼14.5 Å for Al and ∼21 Å for Ag), agreeing well with an estimation given by υ/ ω s , where υ and ω s are the velocity of the primary electrons and the average surface plasmon frequency, respectively. Copyright © 2004 John Wiley & Sons, Ltd.