Title: Molecular-scale Investigations of Organic Molecular Films by Dynamic Force Microscopy
Abstract:Abstract The application of non-contact atomic force microscopy (NC-AFM) to the molecularscale investigations of organic molecular films is presented. Molecular arrangements of fullerene thin films on...Abstract The application of non-contact atomic force microscopy (NC-AFM) to the molecularscale investigations of organic molecular films is presented. Molecular arrangements of fullerene thin films on the Si(111)-7 × 7 reconstucted surface and self-assembled monolayers of alkanethiol molecules on Au(111) were successfully imaged. In addition, surface potential measurements of the fullerene films by NC-AFM revealed the local charge transfer from the Si danging bond to the adsorbed molecular layer.Read More
Publication Year: 2001
Publication Date: 2001-10-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 1
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