Publication Information

{'id': 'https://openalex.org/W1942050676', 'doi': 'https://doi.org/10.1088/0957-4484/26/34/345702', 'title': 'Structural defect-dependent resistive switching in Cu-O/Si studied by Kelvin probe force microscopy and conductive atomic force microscopy', 'display_name': 'Structural defect-dependent resistive switching in Cu-O/Si studied by Kelvin probe force microscopy and conductive atomic force microscopy', 'publication_year': 2015, 'publication_date': '2015-08-05', 'ids': {'openalex': 'https://openalex.org/W1942050676', 'doi': 'https://doi.org/10.1088/0957-4484/26/34/345702', 'mag': '1942050676', 'pmid': 'https://pubmed.ncbi.nlm.nih.gov/26243354'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1088/0957-4484/26/34/345702', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S206811868', 'display_name': 'Nanotechnology', 'issn_l': '0957-4484', 'issn': ['0957-4484', '1361-6528'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320083', 'host_organization_name': 'IOP Publishing', 'host_organization_lineage': ['https://openalex.org/P4310311669', 'https://openalex.org/P4310320083'], 'host_organization_lineage_names': ['Institute of Physics', 'IOP Publishing'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref', 'pubmed'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5030602626', 'display_name': 'Mohit Kumar', 'orcid': 'https://orcid.org/0000-0003-1253-0482'}, 'institutions': [{'id': 'https://openalex.org/I40912709', 'display_name': 'Institute of Physics, Bhubaneshwar', 'ror': 'https://ror.org/01741jv66', 'country_code': 'IN', 'type': 'facility', 'lineage': ['https://openalex.org/I40912709']}], 'countries': ['IN'], 'is_corresponding': False, 'raw_author_name': 'Mohit Kumar', 'raw_affiliation_strings': ['SUNAG laboratory, Institute of Physics, Sachivalaya Marg, Bhubaneswar 751 005, India'], 'affiliations': [{'raw_affiliation_string': 'SUNAG laboratory, Institute of Physics, Sachivalaya Marg, Bhubaneswar 751 005, India', 'institution_ids': ['https://openalex.org/I40912709']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5061888892', 'display_name': 'T. Som', 'orcid': 'https://orcid.org/0000-0003-1587-6745'}, 'institutions': [{'id': 'https://openalex.org/I40912709', 'display_name': 'Institute of Physics, Bhubaneshwar', 'ror': 'https://ror.org/01741jv66', 'country_code': 'IN', 'type': 'facility', 'lineage': ['https://openalex.org/I40912709']}], 'countries': ['IN'], 'is_corresponding': True, 'raw_author_name': 'Tapobrata Som', 'raw_affiliation_strings': ['SUNAG laboratory, Institute of Physics, Sachivalaya Marg, Bhubaneswar 751 005, India'], 'affiliations': [{'raw_affiliation_string': 'SUNAG laboratory, Institute of Physics, Sachivalaya Marg, Bhubaneswar 751 005, India', 'institution_ids': ['https://openalex.org/I40912709']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': ['https://openalex.org/A5061888892'], 'corresponding_institution_ids': ['https://openalex.org/I40912709'], 'apc_list': None, 'apc_paid': None, 'fwci': 2.245, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 48, 'citation_normalized_percentile': {'value': 0.897579, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 95, 'max': 96}, 'biblio': {'volume': '26', 'issue': '34', 'first_page': '345702', 'last_page': '345702'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10502', 'display_name': 'Advanced Memory and Neural Computing', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10502', 'display_name': 'Advanced Memory and Neural Computing', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12808', 'display_name': 'Ferroelectric and Negative Capacitance Devices', 'score': 0.9949, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11601', 'display_name': 'Neuroscience and Neural Engineering', 'score': 0.9906, 'subfield': {'id': 'https://openalex.org/subfields/2804', 'display_name': 'Cellular and Molecular Neuroscience'}, 'field': {'id': 'https://openalex.org/fields/28', 'display_name': 'Neuroscience'}, 'domain': {'id': 'https://openalex.org/domains/1', 'display_name': 'Life Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/resistive-touchscreen', 'display_name': 'Resistive touchscreen', 'score': 0.6596433}], 'concepts': [{'id': 'https://openalex.org/C83898325', 'wikidata': 'https://www.wikidata.org/wiki/Q1324110', 'display_name': 'Kelvin probe force microscope', 'level': 3, 'score': 0.9008156}, {'id': 'https://openalex.org/C206008964', 'wikidata': 'https://www.wikidata.org/wiki/Q5159384', 'display_name': 'Conductive atomic force microscopy', 'level': 3, 'score': 0.8543043}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.81339014}, {'id': 'https://openalex.org/C45206210', 'wikidata': 'https://www.wikidata.org/wiki/Q2415817', 'display_name': 'Nanoscopic scale', 'level': 2, 'score': 0.80109453}, {'id': 'https://openalex.org/C6899612', 'wikidata': 'https://www.wikidata.org/wiki/Q852911', 'display_name': 'Resistive touchscreen', 'level': 2, 'score': 0.6596433}, {'id': 'https://openalex.org/C147080431', 'wikidata': 'https://www.wikidata.org/wiki/Q1074953', 'display_name': 'Microscopy', 'level': 2, 'score': 0.65634686}, {'id': 'https://openalex.org/C102951782', 'wikidata': 'https://www.wikidata.org/wiki/Q49295', 'display_name': 'Atomic force microscopy', 'level': 2, 'score': 0.61100733}, {'id': 'https://openalex.org/C202374169', 'wikidata': 'https://www.wikidata.org/wiki/Q124291', 'display_name': 'Electrical conductor', 'level': 2, 'score': 0.6093855}, {'id': 'https://openalex.org/C14228908', 'wikidata': 'https://www.wikidata.org/wiki/Q2920483', 'display_name': 'Protein filament', 'level': 2, 'score': 0.52705526}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.5254766}, {'id': 'https://openalex.org/C182019814', 'wikidata': 'https://www.wikidata.org/wiki/Q1143830', 'display_name': 'Resistive random-access memory', 'level': 3, 'score': 0.4447461}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.42319238}, {'id': 'https://openalex.org/C17525397', 'wikidata': 'https://www.wikidata.org/wiki/Q176140', 'display_name': 'Electrode', 'level': 2, 'score': 0.19576365}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.15613416}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.14429164}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.08483434}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.07495576}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.05260393}, {'id': 'https://openalex.org/C147789679', 'wikidata': 'https://www.wikidata.org/wiki/Q11372', 'display_name': 'Physical chemistry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.0}], 'mesh': [], 'locations_count': 2, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1088/0957-4484/26/34/345702', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S206811868', 'display_name': 'Nanotechnology', 'issn_l': '0957-4484', 'issn': ['0957-4484', '1361-6528'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320083', 'host_organization_name': 'IOP Publishing', 'host_organization_lineage': ['https://openalex.org/P4310311669', 'https://openalex.org/P4310320083'], 'host_organization_lineage_names': ['Institute of Physics', 'IOP Publishing'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, {'is_oa': False, 'landing_page_url': 'https://pubmed.ncbi.nlm.nih.gov/26243354', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306525036', 'display_name': 'PubMed', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/I1299303238', 'host_organization_name': 'National Institutes of Health', 'host_organization_lineage': ['https://openalex.org/I1299303238'], 'host_organization_lineage_names': ['National Institutes of Health'], 'type': 'repository'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 38, 'referenced_works': ['https://openalex.org/W1857165709', 'https://openalex.org/W1970840177', 'https://openalex.org/W1977623411', 'https://openalex.org/W1979797224', 'https://openalex.org/W1981264689', 'https://openalex.org/W1981618951', 'https://openalex.org/W1981920258', 'https://openalex.org/W1995749948', 'https://openalex.org/W1998631300', 'https://openalex.org/W1999075212', 'https://openalex.org/W2009246224', 'https://openalex.org/W2012387349', 'https://openalex.org/W2013905641', 'https://openalex.org/W2013938710', 'https://openalex.org/W2020445295', 'https://openalex.org/W2054750625', 'https://openalex.org/W2057868629', 'https://openalex.org/W2058286452', 'https://openalex.org/W2060508408', 'https://openalex.org/W2064224114', 'https://openalex.org/W2064756415', 'https://openalex.org/W2067870362', 'https://openalex.org/W2068894213', 'https://openalex.org/W2074357625', 'https://openalex.org/W2076439930', 'https://openalex.org/W2081817446', 'https://openalex.org/W2099540110', 'https://openalex.org/W2106620460', 'https://openalex.org/W2127584689', 'https://openalex.org/W2231514479', 'https://openalex.org/W2331507620', 'https://openalex.org/W2335511003', 'https://openalex.org/W2400641950', 'https://openalex.org/W2490765418', 'https://openalex.org/W2494197051', 'https://openalex.org/W36692847', 'https://openalex.org/W4247121546', 'https://openalex.org/W645319002'], 'related_works': ['https://openalex.org/W4205298494', 'https://openalex.org/W3015253211', 'https://openalex.org/W2276675333', 'https://openalex.org/W2199653281', 'https://openalex.org/W2086074825', 'https://openalex.org/W2081353235', 'https://openalex.org/W2012387349', 'https://openalex.org/W2006321960', 'https://openalex.org/W1978252041', 'https://openalex.org/W1942050676'], 'abstract_inverted_index': {'In': [0, 34, 60], 'this': [1], 'study,': [2], 'we': [3], 'show': [4, 28], 'structural': [5, 66], 'defect-dependent': [6], 'presence': [7, 30], 'or': [8], 'absence': [9], 'of': [10, 31, 45, 65], 'resistive': [11, 32, 58, 69], 'switching': [12, 70], 'in': [13, 68], 'Cu-O': [14], 'films.': [15], 'We': [16], 'use': [17], 'Kelvin': [18], 'probe': [19], 'force': [20, 25], 'microscopy': [21, 26], 'and': [22], 'conductive': [23], 'atomic': [24], 'to': [27, 77], 'the': [29, 43, 53, 63], 'switching.': [33, 59], 'addition,': [35], 'local': [36], 'current': [37], 'mapping': [38], 'provides': [39], 'direct': [40], 'evidence': [41], 'on': [42, 57], 'formation': [44], 'nanoscale': [46, 85], 'filament.': [47], 'These': [48], 'findings': [49], 'match': [50], 'well': [51], 'with': [52], 'existing': [54], 'theoretical': [55], 'model': [56], 'particular,': [61], 'understanding': [62], 'role': [64], 'defects': [67], 'can': [71], 'be': [72], 'considered': [73], 'as': [74], 'critically': [75], 'important': [76], 'take': [78], 'a': [79], 'step': [80], 'forward': [81], 'for': [82], 'designing': [83], 'advanced': [84], 'memory': [86], 'devices.': [87]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1942050676', 'counts_by_year': [{'year': 2024, 'cited_by_count': 5}, {'year': 2023, 'cited_by_count': 5}, {'year': 2022, 'cited_by_count': 5}, {'year': 2021, 'cited_by_count': 8}, {'year': 2020, 'cited_by_count': 3}, {'year': 2019, 'cited_by_count': 5}, {'year': 2018, 'cited_by_count': 8}, {'year': 2017, 'cited_by_count': 2}, {'year': 2016, 'cited_by_count': 6}], 'updated_date': '2024-12-10T22:48:08.047261', 'created_date': '2016-06-24'}