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{'id': 'https://openalex.org/W2069807704', 'doi': 'https://doi.org/10.1109/tr.1975.5215196', 'title': "``An Algorithm to Determine Parallel System Reliability''", 'display_name': "``An Algorithm to Determine Parallel System Reliability''", 'publication_year': 1975, 'publication_date': '1975-10-01', 'ids': {'openalex': 'https://openalex.org/W2069807704', 'doi': 'https://doi.org/10.1109/tr.1975.5215196', 'mag': '2069807704'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/tr.1975.5215196', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S87725633', 'display_name': 'IEEE Transactions on Reliability', 'issn_l': '0018-9529', 'issn': ['0018-9529', '1558-1721'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5033487027', 'display_name': 'Wilmer Cooksey', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I118136607', 'display_name': 'General Motors (United States)', 'ror': 'https://ror.org/05addee68', 'country_code': 'US', 'type': 'company', 'lineage': ['https://openalex.org/I118136607']}, {'id': 'https://openalex.org/I39965400', 'display_name': 'Kettering University', 'ror': 'https://ror.org/03rcspa57', 'country_code': 'US', 'type': 'education', 'lineage': ['https://openalex.org/I39965400']}], 'countries': ['US'], 'is_corresponding': True, 'raw_author_name': 'Wilmer Cooksey', 'raw_affiliation_strings': ['General Motors Institute//Industrial Engineering//1700 West Third Avenue//Flint, MI 48502 USA'], 'affiliations': [{'raw_affiliation_string': 'General Motors Institute//Industrial Engineering//1700 West Third Avenue//Flint, MI 48502 USA', 'institution_ids': ['https://openalex.org/I118136607', 'https://openalex.org/I39965400']}]}], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': ['https://openalex.org/A5033487027'], 'corresponding_institution_ids': ['https://openalex.org/I118136607', 'https://openalex.org/I39965400'], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 5, 'citation_normalized_percentile': {'value': 0.729577, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 74, 'max': 76}, 'biblio': {'volume': 'R-24', 'issue': '4', 'first_page': '287', 'last_page': '287'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12451', 'display_name': 'Smart Grid Technology and Applications', 'score': 0.7858, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12451', 'display_name': 'Smart Grid Technology and Applications', 'score': 0.7858, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T14276', 'display_name': 'Integration and Standardization of Power System Data', 'score': 0.7355, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13832', 'display_name': 'Spatial Data Mining and Cloud Model Applications', 'score': 0.6664, 'subfield': {'id': 'https://openalex.org/subfields/1710', 'display_name': 'Information Systems'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/reliability-analysis', 'display_name': 'Reliability Analysis', 'score': 0.660607}, {'id': 'https://openalex.org/keywords/reliability-theory', 'display_name': 'Reliability theory', 'score': 0.59692407}, {'id': 'https://openalex.org/keywords/interoperability', 'display_name': 'Interoperability', 'score': 0.556499}, {'id': 'https://openalex.org/keywords/virtual-reality-simulation', 'display_name': 'Virtual Reality Simulation', 'score': 0.54787}, {'id': 'https://openalex.org/keywords/network-security-evaluation', 'display_name': 'Network Security Evaluation', 'score': 0.53476}, {'id': 'https://openalex.org/keywords/gis-data-mining', 'display_name': 'GIS Data Mining', 'score': 0.516591}], 'concepts': [{'id': 'https://openalex.org/C43214815', 'wikidata': 'https://www.wikidata.org/wiki/Q7310987', 'display_name': 'Reliability (semiconductor)', 'level': 3, 'score': 0.60079736}, {'id': 'https://openalex.org/C201729545', 'wikidata': 'https://www.wikidata.org/wiki/Q2193887', 'display_name': 'Reliability theory', 'level': 3, 'score': 0.59692407}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.59054744}, {'id': 'https://openalex.org/C11413529', 'wikidata': 'https://www.wikidata.org/wiki/Q8366', 'display_name': 'Algorithm', 'level': 1, 'score': 0.53205025}, {'id': 'https://openalex.org/C200601418', 'wikidata': 'https://www.wikidata.org/wiki/Q2193887', 'display_name': 'Reliability engineering', 'level': 1, 'score': 0.5044354}, {'id': 'https://openalex.org/C163164238', 'wikidata': 'https://www.wikidata.org/wiki/Q2737027', 'display_name': 'Failure rate', 'level': 2, 'score': 0.22474062}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.19501737}, {'id': 'https://openalex.org/C163258240', 'wikidata': 'https://www.wikidata.org/wiki/Q25342', 'display_name': 'Power (physics)', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/tr.1975.5215196', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S87725633', 'display_name': 'IEEE Transactions on Reliability', 'issn_l': '0018-9529', 'issn': ['0018-9529', '1558-1721'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 1, 'referenced_works': ['https://openalex.org/W4301441647'], 'related_works': ['https://openalex.org/W607309636', 'https://openalex.org/W600824226', 'https://openalex.org/W3170058085', 'https://openalex.org/W2921740451', 'https://openalex.org/W2798362176', 'https://openalex.org/W2789311362', 'https://openalex.org/W2736464718', 'https://openalex.org/W2733617384', 'https://openalex.org/W2616049901', 'https://openalex.org/W2580024364', 'https://openalex.org/W2520611130', 'https://openalex.org/W2340867387', 'https://openalex.org/W2268906959', 'https://openalex.org/W2053341708', 'https://openalex.org/W2009521622', 'https://openalex.org/W1976862231', 'https://openalex.org/W1975889250', 'https://openalex.org/W1974829496', 'https://openalex.org/W1973983207', 'https://openalex.org/W173461568'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2069807704', 'counts_by_year': [], 'updated_date': '2024-08-14T02:02:31.423173', 'created_date': '2016-06-24'}