Title: Non-contact atomic force microscopy using silicon cantilevers covered with organic monolayers via silicon–carbon covalent bonds
Abstract:Silicon cantilevers covered with dodecyl monolayers anchored via silicon–carbon covalent bonds were prepared by a wet process and used for non-contact atomic force microscopy (NC-AFM) of TiO2(110)-(1 ...Silicon cantilevers covered with dodecyl monolayers anchored via silicon–carbon covalent bonds were prepared by a wet process and used for non-contact atomic force microscopy (NC-AFM) of TiO2(110)-(1 × 1) surfaces. Clear images of atomic rows on atomically flat terraces were observed with the dodecyl-coated samples when they were biased around 2.0 V with respect to the cantilevers. The bias voltage required to give clear images for alkyl-coated cantilevers was higher than that for uncoated ones. Since the cantilevers are thermally and chemically stable, they are applicable to various force microscopy to distinguish chemical species on surfaces.Read More
Publication Year: 2004
Publication Date: 2004-01-13
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 5
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