Title: K. Janssens and R. van Grieken (Editors). Non‐destructive microanalysis of cultural heritage materials. Elsevier, Amsterdam, 2004, pp. 800. ISBN: 0 444 50738 8
Abstract: X-Ray SpectrometryVolume 35, Issue 2 p. 146-147 Book Review K. Janssens and R. van Grieken (Editors). Non-destructive microanalysis of cultural heritage materials. Elsevier, Amsterdam, 2004, pp. 800. ISBN: 0 444 50738 8 Jean Louis Boutaine, Corresponding Author Jean Louis Boutaine Centre de Recherche et de Restauration des Musées de France, Paris, FranceCentre de Recherche et de Restauration des Musées de France, Paris, France.Search for more papers by this author Jean Louis Boutaine, Corresponding Author Jean Louis Boutaine Centre de Recherche et de Restauration des Musées de France, Paris, FranceCentre de Recherche et de Restauration des Musées de France, Paris, France.Search for more papers by this author First published: 24 October 2005 https://doi.org/10.1002/xrs.879AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat No abstract is available for this article. Volume35, Issue2March/April 2006Pages 146-147 RelatedInformation
Publication Year: 2005
Publication Date: 2005-10-24
Language: en
Type: article
Indexed In: ['crossref']
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