Publication Information

{'id': 'https://openalex.org/W1971319818', 'doi': 'https://doi.org/10.1109/tc.2014.12', 'title': 'RRAM Defect Modeling and Failure Analysis Based on March Test and a Novel Squeeze-Search Scheme', 'display_name': 'RRAM Defect Modeling and Failure Analysis Based on March Test and a Novel Squeeze-Search Scheme', 'publication_year': 2014, 'publication_date': '2014-01-31', 'ids': {'openalex': 'https://openalex.org/W1971319818', 'doi': 'https://doi.org/10.1109/tc.2014.12', 'mag': '1971319818'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/tc.2014.12', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S157670870', 'display_name': 'IEEE Transactions on Computers', 'issn_l': '0018-9340', 'issn': ['0018-9340', '1557-9956', '2326-3814'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5100757468', 'display_name': 'Ching‐Yi Chen', 'orcid': 'https://orcid.org/0000-0001-6103-9468'}, 'institutions': [{'id': 'https://openalex.org/I25846049', 'display_name': 'National Tsing Hua University', 'ror': 'https://ror.org/00zdnkx70', 'country_code': 'TW', 'type': 'education', 'lineage': ['https://openalex.org/I25846049']}], 'countries': ['TW'], 'is_corresponding': False, 'raw_author_name': 'Ching-Yi Chen', 'raw_affiliation_strings': ['[Department of Electrical Engineering, National Tsing Hua University, Hsinchu 300, Taiwan 300]'], 'affiliations': [{'raw_affiliation_string': '[Department of Electrical Engineering, National Tsing Hua University, Hsinchu 300, Taiwan 300]', 'institution_ids': ['https://openalex.org/I25846049']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5048709906', 'display_name': 'Hsiu-Chuan Shih', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I25846049', 'display_name': 'National Tsing Hua University', 'ror': 'https://ror.org/00zdnkx70', 'country_code': 'TW', 'type': 'education', 'lineage': ['https://openalex.org/I25846049']}], 'countries': ['TW'], 'is_corresponding': False, 'raw_author_name': 'Hsiu-Chuan Shih', 'raw_affiliation_strings': ['[Department of Electrical Engineering, National Tsing Hua University, Hsinchu 300, Taiwan 300]'], 'affiliations': [{'raw_affiliation_string': '[Department of Electrical Engineering, National Tsing Hua University, Hsinchu 300, Taiwan 300]', 'institution_ids': ['https://openalex.org/I25846049']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5075548524', 'display_name': 'Cheng‐Wen Wu', 'orcid': 'https://orcid.org/0000-0001-8614-7908'}, 'institutions': [{'id': 'https://openalex.org/I25846049', 'display_name': 'National Tsing Hua University', 'ror': 'https://ror.org/00zdnkx70', 'country_code': 'TW', 'type': 'education', 'lineage': ['https://openalex.org/I25846049']}], 'countries': ['TW'], 'is_corresponding': False, 'raw_author_name': 'Cheng-Wen Wu', 'raw_affiliation_strings': ['[Department of Electrical Engineering, National Tsing Hua University, Hsinchu 300, Taiwan 300]'], 'affiliations': [{'raw_affiliation_string': '[Department of Electrical Engineering, National Tsing Hua University, Hsinchu 300, Taiwan 300]', 'institution_ids': ['https://openalex.org/I25846049']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5049671720', 'display_name': 'Chih-He Lin', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I4210148468', 'display_name': 'Industrial Technology Research Institute', 'ror': 'https://ror.org/05szzwt63', 'country_code': 'TW', 'type': 'nonprofit', 'lineage': ['https://openalex.org/I4210148468']}], 'countries': ['TW'], 'is_corresponding': False, 'raw_author_name': 'Chih-He Lin', 'raw_affiliation_strings': ['Electronics and Optoelectronics Research Laboratories, Industrial Technology Research Institute, Hsinchu 310, Taiwan 310'], 'affiliations': [{'raw_affiliation_string': 'Electronics and Optoelectronics Research Laboratories, Industrial Technology Research Institute, Hsinchu 310, Taiwan 310', 'institution_ids': ['https://openalex.org/I4210148468']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5109931671', 'display_name': 'Pi-Feng Chiu', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I4210148468', 'display_name': 'Industrial Technology Research Institute', 'ror': 'https://ror.org/05szzwt63', 'country_code': 'TW', 'type': 'nonprofit', 'lineage': ['https://openalex.org/I4210148468']}], 'countries': ['TW'], 'is_corresponding': False, 'raw_author_name': 'Pi-Feng Chiu', 'raw_affiliation_strings': ['Electronics and Optoelectronics Research Laboratories, Industrial Technology Research Institute, Hsinchu 310, Taiwan 310'], 'affiliations': [{'raw_affiliation_string': 'Electronics and Optoelectronics Research Laboratories, Industrial Technology Research Institute, Hsinchu 310, Taiwan 310', 'institution_ids': ['https://openalex.org/I4210148468']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5108353891', 'display_name': 'Shyh-Shyuan Sheu', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I4210148468', 'display_name': 'Industrial Technology Research Institute', 'ror': 'https://ror.org/05szzwt63', 'country_code': 'TW', 'type': 'nonprofit', 'lineage': ['https://openalex.org/I4210148468']}], 'countries': ['TW'], 'is_corresponding': False, 'raw_author_name': 'Shyh-Shyuan Sheu', 'raw_affiliation_strings': ['Electronics and Optoelectronics Research Laboratories, Industrial Technology Research Institute, Hsinchu 310, Taiwan 310'], 'affiliations': [{'raw_affiliation_string': 'Electronics and Optoelectronics Research Laboratories, Industrial Technology Research Institute, Hsinchu 310, Taiwan 310', 'institution_ids': ['https://openalex.org/I4210148468']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5057482445', 'display_name': 'Frederick T. Chen', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I4210148468', 'display_name': 'Industrial Technology Research Institute', 'ror': 'https://ror.org/05szzwt63', 'country_code': 'TW', 'type': 'nonprofit', 'lineage': ['https://openalex.org/I4210148468']}], 'countries': ['TW'], 'is_corresponding': False, 'raw_author_name': 'Frederick T. Chen', 'raw_affiliation_strings': ['Electronics and Optoelectronics Research Laboratories, Industrial Technology Research Institute, Hsinchu 310, Taiwan 310'], 'affiliations': [{'raw_affiliation_string': 'Electronics and Optoelectronics Research Laboratories, Industrial Technology Research Institute, Hsinchu 310, Taiwan 310', 'institution_ids': ['https://openalex.org/I4210148468']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 3.754, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 218, 'citation_normalized_percentile': {'value': 0.920195, 'is_in_top_1_percent': False, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 99, 'max': 100}, 'biblio': {'volume': '64', 'issue': '1', 'first_page': '180', 'last_page': '190'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10502', 'display_name': 'Advanced Memory and Neural Computing', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10502', 'display_name': 'Advanced Memory and Neural Computing', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12808', 'display_name': 'Ferroelectric and Negative Capacitance Devices', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10472', 'display_name': 'Semiconductor materials and devices', 'score': 0.9973, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/resistive-touchscreen', 'display_name': 'Resistive touchscreen', 'score': 0.5174161}], 'concepts': [{'id': 'https://openalex.org/C182019814', 'wikidata': 'https://www.wikidata.org/wiki/Q1143830', 'display_name': 'Resistive random-access memory', 'level': 3, 'score': 0.9595037}, {'id': 'https://openalex.org/C165005293', 'wikidata': 'https://www.wikidata.org/wiki/Q1074500', 'display_name': 'Chip', 'level': 2, 'score': 0.5528721}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.54322344}, {'id': 'https://openalex.org/C6899612', 'wikidata': 'https://www.wikidata.org/wiki/Q852911', 'display_name': 'Resistive touchscreen', 'level': 2, 'score': 0.5174161}, {'id': 'https://openalex.org/C175551986', 'wikidata': 'https://www.wikidata.org/wiki/Q47089', 'display_name': 'Fault (geology)', 'level': 2, 'score': 0.49907303}, {'id': 'https://openalex.org/C77618280', 'wikidata': 'https://www.wikidata.org/wiki/Q1155772', 'display_name': 'Scheme (mathematics)', 'level': 2, 'score': 0.47105595}, {'id': 'https://openalex.org/C9390403', 'wikidata': 'https://www.wikidata.org/wiki/Q3966', 'display_name': 'Computer hardware', 'level': 1, 'score': 0.3482353}, {'id': 'https://openalex.org/C24326235', 'wikidata': 'https://www.wikidata.org/wiki/Q126095', 'display_name': 'Electronic engineering', 'level': 1, 'score': 0.34529907}, {'id': 'https://openalex.org/C149635348', 'wikidata': 'https://www.wikidata.org/wiki/Q193040', 'display_name': 'Embedded system', 'level': 1, 'score': 0.3368413}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.28429922}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.24232379}, {'id': 'https://openalex.org/C76155785', 'wikidata': 'https://www.wikidata.org/wiki/Q418', 'display_name': 'Telecommunications', 'level': 1, 'score': 0.09908819}, {'id': 'https://openalex.org/C111919701', 'wikidata': 'https://www.wikidata.org/wiki/Q9135', 'display_name': 'Operating system', 'level': 1, 'score': 0.09202492}, {'id': 'https://openalex.org/C134306372', 'wikidata': 'https://www.wikidata.org/wiki/Q7754', 'display_name': 'Mathematical analysis', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C33923547', 'wikidata': 'https://www.wikidata.org/wiki/Q395', 'display_name': 'Mathematics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C165801399', 'wikidata': 'https://www.wikidata.org/wiki/Q25428', 'display_name': 'Voltage', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C165205528', 'wikidata': 'https://www.wikidata.org/wiki/Q83371', 'display_name': 'Seismology', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C127313418', 'wikidata': 'https://www.wikidata.org/wiki/Q1069', 'display_name': 'Geology', 'level': 0, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/tc.2014.12', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S157670870', 'display_name': 'IEEE Transactions on Computers', 'issn_l': '0018-9340', 'issn': ['0018-9340', '1557-9956', '2326-3814'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'display_name': 'Industry, innovation and infrastructure', 'score': 0.5, 'id': 'https://metadata.un.org/sdg/9'}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 21, 'referenced_works': ['https://openalex.org/W1846246533', 'https://openalex.org/W2013055927', 'https://openalex.org/W2018234380', 'https://openalex.org/W2020647206', 'https://openalex.org/W2027065489', 'https://openalex.org/W2028461509', 'https://openalex.org/W2032785938', 'https://openalex.org/W2041264297', 'https://openalex.org/W2051736202', 'https://openalex.org/W2057914305', 'https://openalex.org/W2105408739', 'https://openalex.org/W2106935654', 'https://openalex.org/W2112009195', 'https://openalex.org/W2116513702', 'https://openalex.org/W2117531486', 'https://openalex.org/W2120338358', 'https://openalex.org/W2146644641', 'https://openalex.org/W2159356386', 'https://openalex.org/W2167423785', 'https://openalex.org/W2168602049', 'https://openalex.org/W2168972302'], 'related_works': ['https://openalex.org/W4298011929', 'https://openalex.org/W4206468571', 'https://openalex.org/W3161624601', 'https://openalex.org/W2626667124', 'https://openalex.org/W2545245183', 'https://openalex.org/W2350916061', 'https://openalex.org/W2199653281', 'https://openalex.org/W2078381924', 'https://openalex.org/W2054635671', 'https://openalex.org/W1970117475'], 'abstract_inverted_index': {'The': [0, 126], 'Resistive': [1], 'Random': [2], 'Access': [3], 'Memory': [4], '(RRAM)': [5], 'is': [6, 56, 103, 130], 'a': [7, 58, 86, 110, 133, 196], 'new': [8], 'type': [9], 'of': [10], 'non-volatile': [11], 'memory': [12, 17, 28, 36], 'based': [13], 'on': [14], 'the': [15, 43, 46, 52, 74, 79, 98, 116, 122, 155, 165, 182, 192], 'resistive': [16, 24], 'device.': [18], 'Researchers': [19], 'are': [20, 169], 'currently': [21], 'moving': [22], 'from': [23, 164], 'device': [25], 'development': [26], 'to': [27, 34, 71, 89, 97, 114, 121, 132, 171], 'circuit': [29], 'design': [30], 'and': [31, 67, 78, 93, 149, 184, 187], 'implementation,': [32], 'hoping': [33], 'fabricate': [35], 'chips': [37], 'that': [38, 146], 'can': [39, 190], 'be': [40, 172], 'deployed': [41], 'in': [42, 45, 95, 154, 195], 'market': [44], 'near': [47], 'future.': [48], 'However,': [49], 'so': [50], 'far': [51], 'low': [53], 'manufacturing': [54], 'yield': [55, 194], 'still': [57], 'major': [59], 'issue.': [60], 'In': [61], 'this': [62], 'paper,': [63], 'we': [64], 'propose': [65, 85], 'defect': [66, 77], 'fault': [68], 'models': [69], 'specific': [70, 161], 'RRAM,': [72], 'i.e.,': [73], 'Over-Forming': [75], '(OF)': [76], 'Read-One-Disturb': [80], '(R1D)': [81], 'fault.': [82], 'We': [83, 107, 158], 'then': [84], 'March': [87, 105], 'algorithm': [88, 129], 'cover': [90], 'these': [91], 'defects': [92, 148, 177, 183], 'faults': [94, 151], 'addition': [96], 'conventional': [99], 'RAM': [100], 'faults,': [101, 185], 'which': [102, 119, 168], 'called': [104], 'C*.': [106], 'also': [108, 159], 'develop': [109], 'novel': [111], 'squeeze-search': [112], 'scheme': [113], 'identify': [115, 160], 'OF': [117, 147], 'defect,': [118], 'leads': [120], 'Stuck-At': [123], 'Fault': [124], '(SAF).': [125], 'proposed': [127], 'test': [128, 142, 166], 'applied': [131], 'first-cut': [134], '4-Mb': [135], 'HfO': [136], '<sub': [137], 'xmlns:mml="http://www.w3.org/1998/Math/MathML"': [138], 'xmlns:xlink="http://www.w3.org/1999/xlink">2</sub>': [139], '-based': [140], 'RRAM': [141, 156, 193], 'chip.': [143, 157], 'Results': [144], 'show': [145], 'R1D': [150], 'do': [152], 'exist': [153], 'failure': [162], 'patterns': [163], 'results,': [167], 'shown': [170], 'induced': [173], 'by': [174], 'multiple': [175], 'short': [176], 'between': [178], 'bit-lines.': [179], 'By': [180], 'identifying': [181], 'designers': [186], 'process': [188], 'engineers': [189], 'improve': [191], 'more': [197], 'cost-effective': [198], 'way.': [199]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W1971319818', 'counts_by_year': [{'year': 2024, 'cited_by_count': 10}, {'year': 2023, 'cited_by_count': 26}, {'year': 2022, 'cited_by_count': 45}, {'year': 2021, 'cited_by_count': 35}, {'year': 2020, 'cited_by_count': 36}, {'year': 2019, 'cited_by_count': 23}, {'year': 2018, 'cited_by_count': 14}, {'year': 2017, 'cited_by_count': 11}, {'year': 2016, 'cited_by_count': 6}, {'year': 2015, 'cited_by_count': 7}], 'updated_date': '2024-12-19T22:40:44.141392', 'created_date': '2016-06-24'}