Title: Construction of an atomic force microscope and application of atomic force microscopy and scanning tunneling microscopy in surface chemistry
Abstract:A new force detector for atomic force microscope measurements is presented. A tip carrying an organic monolayer is covered by a thin metal layer that forms a tunneling gap which can be modulated by th...A new force detector for atomic force microscope measurements is presented. A tip carrying an organic monolayer is covered by a thin metal layer that forms a tunneling gap which can be modulated by the surface forces. This arrangement eliminates the adjustment problems of the usual atomic force microscopy devices. Several experimental methods of tip preparation are discussed. — Scanning tunneling microscope images of adsorbed monolayers of n-octadecyl — trichlorosilane, tetraethyleneglycol laurylether, and n-hexadecane are presented.Read More
Publication Year: 2007
Publication Date: 2007-12-10
Language: en
Type: book-chapter
Indexed In: ['crossref']
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