Title: State‐of‐the‐Art Optical Microscopy and AFM‐Based Property Measurement of Nanostructure Materials
Abstract:This chapter provides a review on optical microscopy and atomic force microscopy (AFM) based material property measurement at nanoscale. Originally, the images generated by optical microscopies were c...This chapter provides a review on optical microscopy and atomic force microscopy (AFM) based material property measurement at nanoscale. Originally, the images generated by optical microscopies were captured by a photographic film; now, with modern developments in complementary metaloxide-semiconductor (CMOS) and charge-coupled device (CCD), direct capture of digital images on a computer screen is very common. The scanning probe microscopy (SPM) family, in which a sharp probe is scanned across a surface and certain probe–sample interaction or interactions are monitored, consists of scanning tunneling microscope (STM) and AFM. As compared to optical microscopy, in nanoscale or sub-nanoscale measurement, AFM is the most widely used tool. In order to explore some of the new concepts, the authors proposed the following two methods: 3D shape reconstruction with optical microscopy and AFM-based elasticity imaging and height compensation to solve these problems partially.Read More
Publication Year: 2015
Publication Date: 2015-03-23
Language: en
Type: other
Indexed In: ['crossref']
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