Title: Hyperfine interaction of defects in semiconductors
Abstract: Preface. 1. Mossbauer spectroscopy (D.L. Williamson, L. Niesen, G. Weyer, R. Sielemann and G. Langouche). 2. Perturbed angular correlation (Th. Wichert, N. Achtziger, H. Metzner and R. Sielemann). 3. Emission channeling (S. Winter, H. Hofsass, S.G. Jahn, G. Lindner, U. Wahl and E. Recknagel). 4. Muon spin rotation and muon level-crossing resonance (T.L. Estle and R.F. Kiefl). 5. Electron paramagnetic resonance (W. Gehlhoff, M. Hohne and J. Schmidt). 6. Electron-nuclear double resonance (C.A.J. Ammerlaan and J.R. Niklas). 7. Optical detection of magnetic resonance (J.M. Spaeth and G.D. Watkins). 8. Special nuclear magnetic resonance techniques (H. Ackermann, N.T. B Agraev, R.T. Harley and J. Schneider). 9. Theory (M. Lannoo, A. Svane, H. Overhof and H. Katayama-Yoshida).
Publication Year: 1992
Publication Date: 1992-01-01
Language: en
Type: book
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Cited By Count: 46
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