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{'id': 'https://openalex.org/W4385733096', 'doi': 'https://doi.org/10.1109/ted.2023.3299907', 'title': 'An Over 140 dB Dynamic Range CMOS Image Sensor Combined DCG and Logarithmic Response', 'display_name': 'An Over 140 dB Dynamic Range CMOS Image Sensor Combined DCG and Logarithmic Response', 'publication_year': 2023, 'publication_date': '2023-08-10', 'ids': {'openalex': 'https://openalex.org/W4385733096', 'doi': 'https://doi.org/10.1109/ted.2023.3299907'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/ted.2023.3299907', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S162355128', 'display_name': 'IEEE Transactions on Electron Devices', 'issn_l': '0018-9383', 'issn': ['0018-9383', '1557-9646'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5055373012', 'display_name': 'Shanshan Lou', 'orcid': 'https://orcid.org/0000-0002-1300-118X'}, 'institutions': [{'id': 'https://openalex.org/I4210092944', 'display_name': 'Dalian University', 'ror': 'https://ror.org/00g2ypp58', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I4210092944']}, {'id': 'https://openalex.org/I27357992', 'display_name': 'Dalian University of Technology', 'ror': 'https://ror.org/023hj5876', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I27357992']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Shanshan Lou', 'raw_affiliation_strings': ['School of Microelectronics, Dalian University of Technology, Dalian, China'], 'affiliations': [{'raw_affiliation_string': 'School of Microelectronics, Dalian University of Technology, Dalian, China', 'institution_ids': ['https://openalex.org/I4210092944', 'https://openalex.org/I27357992']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5104114124', 'display_name': 'Yang Qu', 'orcid': 'https://orcid.org/0009-0001-0963-6852'}, 'institutions': [{'id': 'https://openalex.org/I4210092944', 'display_name': 'Dalian University', 'ror': 'https://ror.org/00g2ypp58', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I4210092944']}, {'id': 'https://openalex.org/I27357992', 'display_name': 'Dalian University of Technology', 'ror': 'https://ror.org/023hj5876', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I27357992']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Yang Qu', 'raw_affiliation_strings': ['School of Microelectronics, Dalian University of Technology, Dalian, China'], 'affiliations': [{'raw_affiliation_string': 'School of Microelectronics, Dalian University of Technology, Dalian, China', 'institution_ids': ['https://openalex.org/I4210092944', 'https://openalex.org/I27357992']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5100703700', 'display_name': 'Guoqiang Zhong', 'orcid': 'https://orcid.org/0000-0002-5470-1940'}, 'institutions': [{'id': 'https://openalex.org/I27357992', 'display_name': 'Dalian University of Technology', 'ror': 'https://ror.org/023hj5876', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I27357992']}, {'id': 'https://openalex.org/I4210092944', 'display_name': 'Dalian University', 'ror': 'https://ror.org/00g2ypp58', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I4210092944']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Guoqiang Zhong', 'raw_affiliation_strings': ['School of Microelectronics, Dalian University of Technology, Dalian, China'], 'affiliations': [{'raw_affiliation_string': 'School of Microelectronics, Dalian University of Technology, Dalian, China', 'institution_ids': ['https://openalex.org/I27357992', 'https://openalex.org/I4210092944']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5101859681', 'display_name': 'Yu Chen Cheng', 'orcid': 'https://orcid.org/0009-0001-9606-5436'}, 'institutions': [{'id': 'https://openalex.org/I4210092944', 'display_name': 'Dalian University', 'ror': 'https://ror.org/00g2ypp58', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I4210092944']}, {'id': 'https://openalex.org/I27357992', 'display_name': 'Dalian University of Technology', 'ror': 'https://ror.org/023hj5876', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I27357992']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Yu Cheng', 'raw_affiliation_strings': ['School of Microelectronics, Dalian University of Technology, Dalian, China'], 'affiliations': [{'raw_affiliation_string': 'School of Microelectronics, Dalian University of Technology, Dalian, China', 'institution_ids': ['https://openalex.org/I4210092944', 'https://openalex.org/I27357992']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5011729620', 'display_name': 'Botao Xiong', 'orcid': 'https://orcid.org/0000-0003-4336-9732'}, 'institutions': [{'id': 'https://openalex.org/I4210092944', 'display_name': 'Dalian University', 'ror': 'https://ror.org/00g2ypp58', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I4210092944']}, {'id': 'https://openalex.org/I27357992', 'display_name': 'Dalian University of Technology', 'ror': 'https://ror.org/023hj5876', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I27357992']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Botao Xiong', 'raw_affiliation_strings': ['School of Microelectronics, Dalian University of Technology, Dalian, China'], 'affiliations': [{'raw_affiliation_string': 'School of Microelectronics, Dalian University of Technology, Dalian, China', 'institution_ids': ['https://openalex.org/I4210092944', 'https://openalex.org/I27357992']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5101500401', 'display_name': 'Quan Zhou', 'orcid': 'https://orcid.org/0000-0003-2605-6304'}, 'institutions': [], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Quan Zhou', 'raw_affiliation_strings': ['Gpixel Inc., Changchun, China'], 'affiliations': [{'raw_affiliation_string': 'Gpixel Inc., Changchun, China', 'institution_ids': []}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5031201228', 'display_name': 'Yang Li', 'orcid': 'https://orcid.org/0000-0001-8145-3834'}, 'institutions': [], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Yang Li', 'raw_affiliation_strings': ['Gpixel Inc., Changchun, China'], 'affiliations': [{'raw_affiliation_string': 'Gpixel Inc., Changchun, China', 'institution_ids': []}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5108696289', 'display_name': 'Xinyang Wang', 'orcid': None}, 'institutions': [], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Xinyang Wang', 'raw_affiliation_strings': ['Gpixel Inc., Changchun, China'], 'affiliations': [{'raw_affiliation_string': 'Gpixel Inc., Changchun, China', 'institution_ids': []}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5101733311', 'display_name': 'Yuchun Chang', 'orcid': 'https://orcid.org/0000-0001-9270-8839'}, 'institutions': [{'id': 'https://openalex.org/I4210092944', 'display_name': 'Dalian University', 'ror': 'https://ror.org/00g2ypp58', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I4210092944']}, {'id': 'https://openalex.org/I27357992', 'display_name': 'Dalian University of Technology', 'ror': 'https://ror.org/023hj5876', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I27357992']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Yuchun Chang', 'raw_affiliation_strings': ['School of Microelectronics, Dalian University of Technology, Dalian, China'], 'affiliations': [{'raw_affiliation_string': 'School of Microelectronics, Dalian University of Technology, Dalian, China', 'institution_ids': ['https://openalex.org/I4210092944', 'https://openalex.org/I27357992']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 1.298, 'has_fulltext': False, 'cited_by_count': 5, 'citation_normalized_percentile': {'value': 0.999985, 'is_in_top_1_percent': True, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 90, 'max': 92}, 'biblio': {'volume': '70', 'issue': '9', 'first_page': '4719', 'last_page': '4724'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T11992', 'display_name': 'CCD and CMOS Imaging Sensors', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T11992', 'display_name': 'CCD and CMOS Imaging Sensors', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11472', 'display_name': 'Analytical Chemistry and Sensors', 'score': 0.9944, 'subfield': {'id': 'https://openalex.org/subfields/1502', 'display_name': 'Bioengineering'}, 'field': {'id': 'https://openalex.org/fields/15', 'display_name': 'Chemical Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13114', 'display_name': 'Image Processing Techniques and Applications', 'score': 0.9941, 'subfield': {'id': 'https://openalex.org/subfields/2214', 'display_name': 'Media Technology'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/wide-dynamic-range', 'display_name': 'Wide dynamic range', 'score': 0.7551172}, {'id': 'https://openalex.org/keywords/photodiode', 'display_name': 'Photodiode', 'score': 0.7166206}, {'id': 'https://openalex.org/keywords/fixed-pattern-noise', 'display_name': 'Fixed-pattern noise', 'score': 0.48697862}], 'concepts': [{'id': 'https://openalex.org/C87133666', 'wikidata': 'https://www.wikidata.org/wiki/Q1161699', 'display_name': 'Dynamic range', 'level': 2, 'score': 0.93952215}, {'id': 'https://openalex.org/C76935873', 'wikidata': 'https://www.wikidata.org/wiki/Q209121', 'display_name': 'Image sensor', 'level': 2, 'score': 0.7566774}, {'id': 'https://openalex.org/C2776179129', 'wikidata': 'https://www.wikidata.org/wiki/Q7998640', 'display_name': 'Wide dynamic range', 'level': 2, 'score': 0.7551172}, {'id': 'https://openalex.org/C751236', 'wikidata': 'https://www.wikidata.org/wiki/Q175943', 'display_name': 'Photodiode', 'level': 2, 'score': 0.7166206}, {'id': 'https://openalex.org/C39927690', 'wikidata': 'https://www.wikidata.org/wiki/Q11197', 'display_name': 'Logarithm', 'level': 2, 'score': 0.6690171}, {'id': 'https://openalex.org/C160633673', 'wikidata': 'https://www.wikidata.org/wiki/Q355198', 'display_name': 'Pixel', 'level': 2, 'score': 0.6423652}, {'id': 'https://openalex.org/C2780056265', 'wikidata': 'https://www.wikidata.org/wiki/Q106239881', 'display_name': 'High dynamic range', 'level': 3, 'score': 0.6004487}, {'id': 'https://openalex.org/C46362747', 'wikidata': 'https://www.wikidata.org/wiki/Q173431', 'display_name': 'CMOS', 'level': 2, 'score': 0.54550564}, {'id': 'https://openalex.org/C96566525', 'wikidata': 'https://www.wikidata.org/wiki/Q7805282', 'display_name': 'Time delay and integration', 'level': 2, 'score': 0.5111342}, {'id': 'https://openalex.org/C2778368474', 'wikidata': 'https://www.wikidata.org/wiki/Q5456322', 'display_name': 'Fixed-pattern noise', 'level': 3, 'score': 0.48697862}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.46116796}, {'id': 'https://openalex.org/C99498987', 'wikidata': 'https://www.wikidata.org/wiki/Q2210247', 'display_name': 'Noise (video)', 'level': 3, 'score': 0.45571944}, {'id': 'https://openalex.org/C13944312', 'wikidata': 'https://www.wikidata.org/wiki/Q7512748', 'display_name': 'Signal-to-noise ratio (imaging)', 'level': 2, 'score': 0.43768644}, {'id': 'https://openalex.org/C24326235', 'wikidata': 'https://www.wikidata.org/wiki/Q126095', 'display_name': 'Electronic engineering', 'level': 1, 'score': 0.37271345}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.3531689}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.34063706}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.33365437}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.30796945}, {'id': 'https://openalex.org/C115961682', 'wikidata': 'https://www.wikidata.org/wiki/Q860623', 'display_name': 'Image (mathematics)', 'level': 2, 'score': 0.2869796}, {'id': 'https://openalex.org/C154945302', 'wikidata': 'https://www.wikidata.org/wiki/Q11660', 'display_name': 'Artificial intelligence', 'level': 1, 'score': 0.23777363}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.17720908}, {'id': 'https://openalex.org/C33923547', 'wikidata': 'https://www.wikidata.org/wiki/Q395', 'display_name': 'Mathematics', 'level': 0, 'score': 0.17628336}, {'id': 'https://openalex.org/C134306372', 'wikidata': 'https://www.wikidata.org/wiki/Q7754', 'display_name': 'Mathematical analysis', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/ted.2023.3299907', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S162355128', 'display_name': 'IEEE Transactions on Electron Devices', 'issn_l': '0018-9383', 'issn': ['0018-9383', '1557-9646'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'score': 0.71, 'id': 'https://metadata.un.org/sdg/7', 'display_name': 'Affordable and clean energy'}], 'grants': [{'funder': 'https://openalex.org/F4320321001', 'funder_display_name': 'National Natural Science Foundation of China', 'award_id': '11975066'}, {'funder': 'https://openalex.org/F4320335777', 'funder_display_name': 'National Key Research and Development Program of China', 'award_id': '2019YFB2204101'}], 'datasets': [], 'versions': [], 'referenced_works_count': 10, 'referenced_works': ['https://openalex.org/W1573077480', 'https://openalex.org/W2023857160', 'https://openalex.org/W2137587482', 'https://openalex.org/W2729765224', 'https://openalex.org/W2899390963', 'https://openalex.org/W2914578648', 'https://openalex.org/W3012350577', 'https://openalex.org/W3016228989', 'https://openalex.org/W3112867989', 'https://openalex.org/W3138839066'], 'related_works': ['https://openalex.org/W70641700', 'https://openalex.org/W4390783470', 'https://openalex.org/W4385733096', 'https://openalex.org/W3188917671', 'https://openalex.org/W2507300456', 'https://openalex.org/W2338834551', 'https://openalex.org/W2112116115', 'https://openalex.org/W2101061064', 'https://openalex.org/W2092904721', 'https://openalex.org/W2001799089'], 'abstract_inverted_index': {'A': [0], 'dynamic': [1, 67, 91, 99], 'range': [2, 68, 92], 'enhancement': [3], 'pixel': [4], 'architecture': [5], 'based': [6], 'on': [7], 'a': [8, 16, 32, 42, 61], 'standard': [9], 'CMOS': [10], 'image': [11, 69, 84], 'sensor': [12, 85], '(CIS)': [13], 'process': [14], 'with': [15, 49], 'pinned': [17], 'photodiode': [18], '(PPD)': [19], 'is': [20, 70], 'proposed,': [21], 'combining': [22], 'dual': [23], 'conversion': [24], 'gain': [25], '(DCG)': [26], 'and': [27, 93], 'logarithmic': [28, 98], 'response.': [29], 'Due': [30], 'to': [31, 55, 72], 'unique': [33], 'charge': [34], 'compensation': [35], 'mechanism': [36], 'of': [37], 'the': [38, 50, 83], 'proposed': [39], 'pixel,': [40], 'in': [41], 'single': [43], 'exposure,': [44], 'three': [45], 'images': [46], 'are': [47], 'captured': [48], 'same': [51], 'integration': [52], 'time,': [53], 'related': [54], 'different': [56], 'incident': [57], 'light': [58, 109], 'levels.': [59], 'As': [60], 'result,': [62], 'an': [63], 'over': [64, 87], '140': [65], 'dB': [66, 89, 97], 'able': [71], 'be': [73], 'obtained': [74], 'by': [75], 'merging': [76], 'these': [77], 'images.': [78], 'Photo': [79], 'response': [80], 'measurements': [81], 'show': [82], 'exhibits': [86], '92': [88], 'linear': [90], 'more': [94], 'than': [95], '51': [96], 'range,': [100], 'without': [101], 'signal-to-noise': [102], 'ratio': [103], '(SNR)': [104], 'performance': [105], 'degradation': [106], 'under': [107], 'low': [108], 'conditions.': [110]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W4385733096', 'counts_by_year': [{'year': 2024, 'cited_by_count': 4}, {'year': 2023, 'cited_by_count': 1}], 'updated_date': '2024-12-22T05:46:18.823993', 'created_date': '2023-08-11'}