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{'id': 'https://openalex.org/W4250906269', 'doi': 'https://doi.org/10.6028/nist.ir.7381', 'title': 'A roadmap for metrology interoperability', 'display_name': 'A roadmap for metrology interoperability', 'publication_year': 2006, 'publication_date': '2006-01-01', 'ids': {'openalex': 'https://openalex.org/W4250906269', 'doi': 'https://doi.org/10.6028/nist.ir.7381'}, 'language': 'en', 'primary_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.6028/nist.ir.7381', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'type': 'report', 'type_crossref': 'report', 'indexed_in': ['crossref'], 'open_access': {'is_oa': True, 'oa_status': 'bronze', 'oa_url': 'https://doi.org/10.6028/nist.ir.7381', 'any_repository_has_fulltext': True}, 'authorships': [], 'institution_assertions': [], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': None, 'has_fulltext': True, 'fulltext_origin': 'pdf', 'cited_by_count': 2, 'citation_normalized_percentile': {'value': 0.673981, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 68, 'max': 72}, 'biblio': {'volume': None, 'issue': None, 'first_page': None, 'last_page': None}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T11583', 'display_name': 'Dimensional Metrology and Error Compensation', 'score': 0.8763, 'subfield': {'id': 'https://openalex.org/subfields/2210', 'display_name': 'Mechanical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T11583', 'display_name': 'Dimensional Metrology and Error Compensation', 'score': 0.8763, 'subfield': {'id': 'https://openalex.org/subfields/2210', 'display_name': 'Mechanical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12111', 'display_name': 'Fabric Defect Detection in Industrial Applications', 'score': 0.8281, 'subfield': {'id': 'https://openalex.org/subfields/2209', 'display_name': 'Industrial and Manufacturing Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11159', 'display_name': 'Design for Manufacture and Assembly in Manufacturing', 'score': 0.7942, 'subfield': {'id': 'https://openalex.org/subfields/2209', 'display_name': 'Industrial and Manufacturing Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/virtual-metrology', 'display_name': 'Virtual Metrology', 'score': 0.648989}, {'id': 'https://openalex.org/keywords/dimensional-metrology', 'display_name': 'Dimensional Metrology', 'score': 0.622279}, {'id': 'https://openalex.org/keywords/large-scale-metrology', 'display_name': 'Large-Scale Metrology', 'score': 0.616811}, {'id': 'https://openalex.org/keywords/coordinate-measuring-machines', 'display_name': 'Coordinate Measuring Machines', 'score': 0.586671}, {'id': 'https://openalex.org/keywords/geometric-error-identification', 'display_name': 'Geometric Error Identification', 'score': 0.563805}], 'concepts': [{'id': 'https://openalex.org/C20136886', 'wikidata': 'https://www.wikidata.org/wiki/Q749647', 'display_name': 'Interoperability', 'level': 2, 'score': 0.858974}, {'id': 'https://openalex.org/C195766429', 'wikidata': 'https://www.wikidata.org/wiki/Q394', 'display_name': 'Metrology', 'level': 2, 'score': 0.71154404}, {'id': 'https://openalex.org/C201995342', 'wikidata': 'https://www.wikidata.org/wiki/Q682496', 'display_name': 'Systems engineering', 'level': 1, 'score': 0.4905054}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.46391004}, {'id': 'https://openalex.org/C115903868', 'wikidata': 'https://www.wikidata.org/wiki/Q80993', 'display_name': 'Software engineering', 'level': 1, 'score': 0.41148567}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.31943065}, {'id': 'https://openalex.org/C136764020', 'wikidata': 'https://www.wikidata.org/wiki/Q466', 'display_name': 'World Wide Web', 'level': 1, 'score': 0.12407923}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.11174694}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': True, 'landing_page_url': 'https://doi.org/10.6028/nist.ir.7381', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}], 'best_oa_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.6028/nist.ir.7381', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W913131694', 'https://openalex.org/W650116260', 'https://openalex.org/W3209454962', 'https://openalex.org/W2378329187', 'https://openalex.org/W2372386009', 'https://openalex.org/W2365800294', 'https://openalex.org/W2314257840', 'https://openalex.org/W2123131699', 'https://openalex.org/W2093262417', 'https://openalex.org/W1998546186'], 'abstract_inverted_index': {'In': [0], 'nt': [1], 'te': [2], 'er': [3, 7, 39], 'ro': [4], 'op': [5], 'pe': [6], 'ra': [8], 'ab': [9], 'bi': [10], 'il': [11], 'li': [12], 'it': [13], 'ty': [14], 'y': [15], 'R': [16], 'Ro': [17], 'oa': [18], 'ad': [19], 'dm': [20], 'ma': [21], 'ap': [22], 'p': [23], 'P': [24], 'Pa': [25], 'ag': [26], 'ge': [27], 'e': [28], '2': [29], 'D': [30], 'Di': [31], 'is': [32], 'sc': [33], 'cl': [34], 'la': [35], 'ai': [36], 'im': [37], 'me': [38]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W4250906269', 'counts_by_year': [], 'updated_date': '2024-09-19T23:39:35.968369', 'created_date': '2022-05-12'}