Get quick answers to your questions about the article from our AI researcher chatbot
{'id': 'https://openalex.org/W4248078888', 'doi': 'https://doi.org/10.1016/0026-2714(94)90211-9', 'title': 'A reliability and cost analysis of an automatic prototype generator test paradigm', 'display_name': 'A reliability and cost analysis of an automatic prototype generator test paradigm', 'publication_year': 1994, 'publication_date': '1994-08-01', 'ids': {'openalex': 'https://openalex.org/W4248078888', 'doi': 'https://doi.org/10.1016/0026-2714(94)90211-9'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1016/0026-2714(94)90211-9', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S133646729', 'display_name': 'Microelectronics Reliability', 'issn_l': '0026-2714', 'issn': ['0026-2714', '1872-941X'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320990', 'host_organization_name': 'Elsevier BV', 'host_organization_lineage': ['https://openalex.org/P4310320990'], 'host_organization_lineage_names': ['Elsevier BV'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [], 'institution_assertions': [], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': {'value': 2190, 'currency': 'USD', 'value_usd': 2190, 'provenance': 'doaj'}, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 53}, 'biblio': {'volume': '34', 'issue': '8', 'first_page': '1417', 'last_page': '1417'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12169', 'display_name': 'Non-Destructive Techniques Based on Eddy Current Testing', 'score': 0.9386, 'subfield': {'id': 'https://openalex.org/subfields/2210', 'display_name': 'Mechanical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12169', 'display_name': 'Non-Destructive Techniques Based on Eddy Current Testing', 'score': 0.9386, 'subfield': {'id': 'https://openalex.org/subfields/2210', 'display_name': 'Mechanical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/non-destructive-evaluation', 'display_name': 'Non-Destructive Evaluation', 'score': 0.472686}], 'concepts': [{'id': 'https://openalex.org/C200601418', 'wikidata': 'https://www.wikidata.org/wiki/Q2193887', 'display_name': 'Reliability engineering', 'level': 1, 'score': 0.73532474}, {'id': 'https://openalex.org/C43214815', 'wikidata': 'https://www.wikidata.org/wiki/Q7310987', 'display_name': 'Reliability (semiconductor)', 'level': 3, 'score': 0.6764913}, {'id': 'https://openalex.org/C2780992000', 'wikidata': 'https://www.wikidata.org/wiki/Q17016113', 'display_name': 'Generator (circuit theory)', 'level': 3, 'score': 0.56340444}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.56084585}, {'id': 'https://openalex.org/C2777267654', 'wikidata': 'https://www.wikidata.org/wiki/Q3519023', 'display_name': 'Test (biology)', 'level': 2, 'score': 0.52903575}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.24417111}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.057083696}, {'id': 'https://openalex.org/C151730666', 'wikidata': 'https://www.wikidata.org/wiki/Q7205', 'display_name': 'Paleontology', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C163258240', 'wikidata': 'https://www.wikidata.org/wiki/Q25342', 'display_name': 'Power (physics)', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C86803240', 'wikidata': 'https://www.wikidata.org/wiki/Q420', 'display_name': 'Biology', 'level': 0, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1016/0026-2714(94)90211-9', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S133646729', 'display_name': 'Microelectronics Reliability', 'issn_l': '0026-2714', 'issn': ['0026-2714', '1872-941X'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320990', 'host_organization_name': 'Elsevier BV', 'host_organization_lineage': ['https://openalex.org/P4310320990'], 'host_organization_lineage_names': ['Elsevier BV'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W90755', 'https://openalex.org/W7596276', 'https://openalex.org/W5101698', 'https://openalex.org/W4372155', 'https://openalex.org/W2854026', 'https://openalex.org/W17527260', 'https://openalex.org/W12501218', 'https://openalex.org/W11641522', 'https://openalex.org/W11536176', 'https://openalex.org/W10355961'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W4248078888', 'counts_by_year': [], 'updated_date': '2024-09-18T05:55:49.055235', 'created_date': '2022-05-12'}