Title: Deterministic test pattern generation techniques for sequential circuits
Abstract: This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation algorithms. To be able to assess the effectiveness of the proposed techniques, we have developed a new ATPG system for sequential circuits, called ATOMS, and we have incorporated these techniques into the test generator ATOMS achieved very high fault coverages in a short amount of time for the ISCAS89 sequential benchmark circuits, demonstrating the effectiveness of these techniques on the test generation performance.
Publication Year: 2002
Publication Date: 2002-11-07
Language: en
Type: article
Indexed In: ['crossref']
Access and Citation
Cited By Count: 10
AI Researcher Chatbot
Get quick answers to your questions about the article from our AI researcher chatbot