Get quick answers to your questions about the article from our AI researcher chatbot
{'id': 'https://openalex.org/W4223460700', 'doi': 'https://doi.org/10.3390/electronics11081200', 'title': 'Hybrid Architecture Based on CNN and Transformer for Strip Steel Surface Defect Classification', 'display_name': 'Hybrid Architecture Based on CNN and Transformer for Strip Steel Surface Defect Classification', 'publication_year': 2022, 'publication_date': '2022-04-09', 'ids': {'openalex': 'https://openalex.org/W4223460700', 'doi': 'https://doi.org/10.3390/electronics11081200'}, 'language': 'en', 'primary_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.3390/electronics11081200', 'pdf_url': 'https://www.mdpi.com/2079-9292/11/8/1200/pdf?version=1649500003', 'source': {'id': 'https://openalex.org/S4210202905', 'display_name': 'Electronics', 'issn_l': '2079-9292', 'issn': ['2079-9292'], 'is_oa': True, 'is_in_doaj': True, 'is_core': True, 'host_organization': 'https://openalex.org/P4310310987', 'host_organization_name': 'Multidisciplinary Digital Publishing Institute', 'host_organization_lineage': ['https://openalex.org/P4310310987'], 'host_organization_lineage_names': ['Multidisciplinary Digital Publishing Institute'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref', 'doaj'], 'open_access': {'is_oa': True, 'oa_status': 'gold', 'oa_url': 'https://www.mdpi.com/2079-9292/11/8/1200/pdf?version=1649500003', 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5027900365', 'display_name': 'Shufeng Li', 'orcid': 'https://orcid.org/0000-0003-4348-8491'}, 'institutions': [{'id': 'https://openalex.org/I148128674', 'display_name': 'University of Shanghai for Science and Technology', 'ror': 'https://ror.org/00ay9v204', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I148128674']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Shunfeng Li', 'raw_affiliation_strings': ['School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China'], 'affiliations': [{'raw_affiliation_string': 'School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China', 'institution_ids': ['https://openalex.org/I148128674']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5040502396', 'display_name': 'Chunxue Wu', 'orcid': 'https://orcid.org/0000-0001-8498-3881'}, 'institutions': [{'id': 'https://openalex.org/I148128674', 'display_name': 'University of Shanghai for Science and Technology', 'ror': 'https://ror.org/00ay9v204', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I148128674']}], 'countries': ['CN'], 'is_corresponding': True, 'raw_author_name': 'Chunxue Wu', 'raw_affiliation_strings': ['School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China'], 'affiliations': [{'raw_affiliation_string': 'School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China', 'institution_ids': ['https://openalex.org/I148128674']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5103216531', 'display_name': 'Naixue Xiong', 'orcid': 'https://orcid.org/0000-0002-0394-4635'}, 'institutions': [{'id': 'https://openalex.org/I162709352', 'display_name': 'Sul Ross State University', 'ror': 'https://ror.org/03x7qhw59', 'country_code': 'US', 'type': 'education', 'lineage': ['https://openalex.org/I162709352']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'Naixue Xiong', 'raw_affiliation_strings': ['Department of Computer Science and Mathematics, Sul Ross State University, Alpine, TX 79830, USA'], 'affiliations': [{'raw_affiliation_string': 'Department of Computer Science and Mathematics, Sul Ross State University, Alpine, TX 79830, USA', 'institution_ids': ['https://openalex.org/I162709352']}]}], 'institution_assertions': [], 'countries_distinct_count': 2, 'institutions_distinct_count': 2, 'corresponding_author_ids': ['https://openalex.org/A5040502396'], 'corresponding_institution_ids': ['https://openalex.org/I148128674'], 'apc_list': {'value': 2000, 'currency': 'CHF', 'value_usd': 2165, 'provenance': 'doaj'}, 'apc_paid': {'value': 2000, 'currency': 'CHF', 'value_usd': 2165, 'provenance': 'doaj'}, 'fwci': 8.087, 'has_fulltext': True, 'fulltext_origin': 'pdf', 'cited_by_count': 43, 'citation_normalized_percentile': {'value': 0.999896, 'is_in_top_1_percent': True, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 98, 'max': 99}, 'biblio': {'volume': '11', 'issue': '8', 'first_page': '1200', 'last_page': '1200'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12111', 'display_name': 'Industrial Vision Systems and Defect Detection', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/2209', 'display_name': 'Industrial and Manufacturing Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12111', 'display_name': 'Industrial Vision Systems and Defect Detection', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/2209', 'display_name': 'Industrial and Manufacturing Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13049', 'display_name': 'Surface Roughness and Optical Measurements', 'score': 0.9949, 'subfield': {'id': 'https://openalex.org/subfields/2206', 'display_name': 'Computational Mechanics'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12169', 'display_name': 'Non-Destructive Testing Techniques', 'score': 0.994, 'subfield': {'id': 'https://openalex.org/subfields/2210', 'display_name': 'Mechanical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [], 'concepts': [{'id': 'https://openalex.org/C81363708', 'wikidata': 'https://www.wikidata.org/wiki/Q17084460', 'display_name': 'Convolutional neural network', 'level': 2, 'score': 0.75180674}, {'id': 'https://openalex.org/C66322947', 'wikidata': 'https://www.wikidata.org/wiki/Q11658', 'display_name': 'Transformer', 'level': 3, 'score': 0.6422539}, {'id': 'https://openalex.org/C153180895', 'wikidata': 'https://www.wikidata.org/wiki/Q7148389', 'display_name': 'Pattern recognition (psychology)', 'level': 2, 'score': 0.6267979}, {'id': 'https://openalex.org/C154945302', 'wikidata': 'https://www.wikidata.org/wiki/Q11660', 'display_name': 'Artificial intelligence', 'level': 1, 'score': 0.62593794}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.62419754}, {'id': 'https://openalex.org/C118505674', 'wikidata': 'https://www.wikidata.org/wiki/Q42586063', 'display_name': 'Encoder', 'level': 2, 'score': 0.6017234}, {'id': 'https://openalex.org/C108583219', 'wikidata': 'https://www.wikidata.org/wiki/Q197536', 'display_name': 'Deep learning', 'level': 2, 'score': 0.5474785}, {'id': 'https://openalex.org/C95623464', 'wikidata': 'https://www.wikidata.org/wiki/Q1096149', 'display_name': 'Classifier (UML)', 'level': 2, 'score': 0.53340745}, {'id': 'https://openalex.org/C123657996', 'wikidata': 'https://www.wikidata.org/wiki/Q12271', 'display_name': 'Architecture', 'level': 2, 'score': 0.4156503}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.1935935}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.106518775}, {'id': 'https://openalex.org/C165801399', 'wikidata': 'https://www.wikidata.org/wiki/Q25428', 'display_name': 'Voltage', 'level': 2, 'score': 0.09182203}, {'id': 'https://openalex.org/C142362112', 'wikidata': 'https://www.wikidata.org/wiki/Q735', 'display_name': 'Art', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C153349607', 'wikidata': 'https://www.wikidata.org/wiki/Q36649', 'display_name': 'Visual arts', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C111919701', 'wikidata': 'https://www.wikidata.org/wiki/Q9135', 'display_name': 'Operating system', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 2, 'locations': [{'is_oa': True, 'landing_page_url': 'https://doi.org/10.3390/electronics11081200', 'pdf_url': 'https://www.mdpi.com/2079-9292/11/8/1200/pdf?version=1649500003', 'source': {'id': 'https://openalex.org/S4210202905', 'display_name': 'Electronics', 'issn_l': '2079-9292', 'issn': ['2079-9292'], 'is_oa': True, 'is_in_doaj': True, 'is_core': True, 'host_organization': 'https://openalex.org/P4310310987', 'host_organization_name': 'Multidisciplinary Digital Publishing Institute', 'host_organization_lineage': ['https://openalex.org/P4310310987'], 'host_organization_lineage_names': ['Multidisciplinary Digital Publishing Institute'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, {'is_oa': False, 'landing_page_url': 'https://doaj.org/article/53c3d853c11647209bc4a5bb9f072f89', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306401280', 'display_name': 'DOAJ (DOAJ: Directory of Open Access Journals)', 'issn_l': None, 'issn': None, 'is_oa': True, 'is_in_doaj': False, 'is_core': False, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'repository'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.3390/electronics11081200', 'pdf_url': 'https://www.mdpi.com/2079-9292/11/8/1200/pdf?version=1649500003', 'source': {'id': 'https://openalex.org/S4210202905', 'display_name': 'Electronics', 'issn_l': '2079-9292', 'issn': ['2079-9292'], 'is_oa': True, 'is_in_doaj': True, 'is_core': True, 'host_organization': 'https://openalex.org/P4310310987', 'host_organization_name': 'Multidisciplinary Digital Publishing Institute', 'host_organization_lineage': ['https://openalex.org/P4310310987'], 'host_organization_lineage_names': ['Multidisciplinary Digital Publishing Institute'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'sustainable_development_goals': [], 'grants': [{'funder': 'https://openalex.org/F4320335777', 'funder_display_name': 'National Key Research and Development Program of China', 'award_id': '2018YFB1702601'}, {'funder': 'https://openalex.org/F4320335777', 'funder_display_name': 'National Key Research and Development Program of China', 'award_id': '2018YFC0810204'}], 'datasets': [], 'versions': [], 'referenced_works_count': 33, 'referenced_works': ['https://openalex.org/W1884395441', 'https://openalex.org/W2090615502', 'https://openalex.org/W2097117768', 'https://openalex.org/W2163605009', 'https://openalex.org/W2194775991', 'https://openalex.org/W2199453144', 'https://openalex.org/W2774759294', 'https://openalex.org/W2807520932', 'https://openalex.org/W2890209713', 'https://openalex.org/W2899187527', 'https://openalex.org/W2901435809', 'https://openalex.org/W2905416267', 'https://openalex.org/W2911581663', 'https://openalex.org/W2912873949', 'https://openalex.org/W2913594657', 'https://openalex.org/W2942322192', 'https://openalex.org/W2943134116', 'https://openalex.org/W2945708832', 'https://openalex.org/W2948698927', 'https://openalex.org/W2963125010', 'https://openalex.org/W2964536243', 'https://openalex.org/W2969534742', 'https://openalex.org/W2982781781', 'https://openalex.org/W3000584535', 'https://openalex.org/W3012133245', 'https://openalex.org/W3012458836', 'https://openalex.org/W3021597592', 'https://openalex.org/W3043071284', 'https://openalex.org/W3048060641', 'https://openalex.org/W3154167053', 'https://openalex.org/W3194839486', 'https://openalex.org/W4210657921', 'https://openalex.org/W4214493665'], 'related_works': ['https://openalex.org/W4390516098', 'https://openalex.org/W4375867731', 'https://openalex.org/W4312417841', 'https://openalex.org/W4293226380', 'https://openalex.org/W4226493464', 'https://openalex.org/W3193565141', 'https://openalex.org/W3167935049', 'https://openalex.org/W3133861977', 'https://openalex.org/W3029198973', 'https://openalex.org/W2181948922'], 'abstract_inverted_index': {'Strip': [0], 'steel': [1, 42], 'surface': [2, 32, 43], 'defects': [3, 12, 33, 44], 'occur': [4], 'frequently': [5], 'during': [6], 'the': [7, 17, 29, 112, 133, 143, 160], 'manufacturing': [8], 'process,': [9], 'and': [10, 35, 84, 99, 108, 124, 128, 152, 179], 'these': [11, 120], 'cause': [13], 'hidden': [14], 'risks': [15], 'in': [16, 67, 171], 'use': [18], 'of': [19, 40, 146], 'subsequent': [20], 'strip': [21, 30, 41], 'products.': [22], 'Therefore,': [23], 'it': [24], 'is': [25, 165], 'crucial': [26], 'to': [27, 132], 'classify': [28], 'steel’s': [31], 'accurately': [34], 'efficiently.': [36], 'Most': [37], 'classification': [38, 69, 144, 172], 'models': [39, 119], 'are': [45], 'generally': [46], 'based': [47], 'on': [48, 159], 'convolutional': [49], 'neural': [50], 'networks': [51, 151], '(CNNs).': [52], 'However,': [53], 'CNNs,': [54], 'with': [55, 167, 174], 'local': [56, 109], 'receptive': [57], 'fields,': [58], 'do': [59], 'not': [60], 'have': [61], 'admirable': [62], 'global': [63, 100], 'representation': [64], 'ability,': [65], 'resulting': [66], 'poor': [68], 'performance.': [70], 'To': [71], 'this': [72], 'end,': [73], 'we': [74], 'proposed': [75], 'a': [76, 168], 'hybrid': [77], 'network': [78, 89], 'architecture': [79], '(CNN-T),': [80], 'which': [81], 'merges': [82], 'CNN': [83, 104], 'Transformer': [85, 115, 150], 'encoder.': [86], 'The': [87, 114], 'CNN-T': [88, 147], 'has': [90], 'both': [91], 'strong': [92], 'inductive': [93], 'biases': [94], '(e.g.,': [95, 154], 'translation': [96], 'invariance,': [97], 'locality)': [98], 'modeling': [101], 'capability.': [102], 'Specifically,': [103], 'first': [105], 'extracts': [106], 'low-level': [107], 'features': [110], 'from': [111], 'images.': [113], 'encoder': [116], 'then': [117], 'globally': [118], 'features,': [121], 'extracting': [122], 'abstract': [123], 'high-level': [125], 'semantic': [126], 'information': [127], 'finally': [129], 'sending': [130], 'them': [131], 'multilayer': [134], 'perceptron': [135], 'classifier': [136], 'for': [137], 'classification.': [138], 'Extensive': [139], 'experiments': [140], 'show': [141], 'that': [142], 'performance': [145], 'outperforms': [148], 'pure': [149], 'CNNs': [153], 'GoogLeNet,': [155], 'MobileNet': [156], 'v2,': [157], 'ResNet18)': [158], 'NEU-CLS': [161], 'dataset': [162], '(training': [163], 'ratio': [164], '80%)': [166], '0.28–2.23%': [169], 'improvement': [170], 'accuracy,': [173], 'fewer': [175], 'parameters': [176], '(0.45': [177], 'M)': [178], 'floating-point': [180], 'operations': [181], '(0.12': [182], 'G).': [183]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W4223460700', 'counts_by_year': [{'year': 2024, 'cited_by_count': 25}, {'year': 2023, 'cited_by_count': 11}, {'year': 2022, 'cited_by_count': 5}], 'updated_date': '2024-12-18T18:34:54.318723', 'created_date': '2022-04-15'}