Publication Information

{'id': 'https://openalex.org/W4210912696', 'doi': 'https://doi.org/10.1109/wcmeim54377.2021.00039', 'title': 'Design of dynamic data acquisition system based on mechanical fault diagnosis', 'display_name': 'Design of dynamic data acquisition system based on mechanical fault diagnosis', 'publication_year': 2021, 'publication_date': '2021-11-01', 'ids': {'openalex': 'https://openalex.org/W4210912696', 'doi': 'https://doi.org/10.1109/wcmeim54377.2021.00039'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/wcmeim54377.2021.00039', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4363607944', 'display_name': '2022 5th World Conference on Mechanical Engineering and Intelligent Manufacturing (WCMEIM)', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'conference'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'proceedings-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5078524146', 'display_name': 'Mengdi Shi', 'orcid': 'https://orcid.org/0000-0002-0137-048X'}, 'institutions': [{'id': 'https://openalex.org/I4210152042', 'display_name': 'Beijing Polytechnic', 'ror': 'https://ror.org/03xgzn792', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I4210152042']}], 'countries': ['CN'], 'is_corresponding': True, 'raw_author_name': 'MengDi Shi', 'raw_affiliation_strings': ['Department of Mechanical and Electrical Technology, College of Automation Engineering, Beijing Polytechnic, Beijing, China'], 'affiliations': [{'raw_affiliation_string': 'Department of Mechanical and Electrical Technology, College of Automation Engineering, Beijing Polytechnic, Beijing, China', 'institution_ids': ['https://openalex.org/I4210152042']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': ['https://openalex.org/A5078524146'], 'corresponding_institution_ids': ['https://openalex.org/I4210152042'], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': False, 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 57}, 'biblio': {'volume': None, 'issue': None, 'first_page': '146', 'last_page': '149'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T14225', 'display_name': 'Advanced Sensor and Control Systems', 'score': 0.9513, 'subfield': {'id': 'https://openalex.org/subfields/2207', 'display_name': 'Control and Systems Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T14225', 'display_name': 'Advanced Sensor and Control Systems', 'score': 0.9513, 'subfield': {'id': 'https://openalex.org/subfields/2207', 'display_name': 'Control and Systems Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12564', 'display_name': 'Sensor Technology and Measurement Systems', 'score': 0.9414, 'subfield': {'id': 'https://openalex.org/subfields/1705', 'display_name': 'Computer Networks and Communications'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/microelectronics', 'display_name': 'Microelectronics', 'score': 0.44530198}, {'id': 'https://openalex.org/keywords/data-processing', 'display_name': 'Data Processing', 'score': 0.41075376}], 'concepts': [{'id': 'https://openalex.org/C163985040', 'wikidata': 'https://www.wikidata.org/wiki/Q1172399', 'display_name': 'Data acquisition', 'level': 2, 'score': 0.9471352}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.65351915}, {'id': 'https://openalex.org/C175551986', 'wikidata': 'https://www.wikidata.org/wiki/Q47089', 'display_name': 'Fault (geology)', 'level': 2, 'score': 0.56338286}, {'id': 'https://openalex.org/C2777904410', 'wikidata': 'https://www.wikidata.org/wiki/Q7397', 'display_name': 'Software', 'level': 2, 'score': 0.5410683}, {'id': 'https://openalex.org/C9390403', 'wikidata': 'https://www.wikidata.org/wiki/Q3966', 'display_name': 'Computer hardware', 'level': 1, 'score': 0.5038194}, {'id': 'https://openalex.org/C187937830', 'wikidata': 'https://www.wikidata.org/wiki/Q175403', 'display_name': 'Microelectronics', 'level': 2, 'score': 0.44530198}, {'id': 'https://openalex.org/C79403827', 'wikidata': 'https://www.wikidata.org/wiki/Q3988', 'display_name': 'Real-time computing', 'level': 1, 'score': 0.43207768}, {'id': 'https://openalex.org/C138827492', 'wikidata': 'https://www.wikidata.org/wiki/Q6661985', 'display_name': 'Data processing', 'level': 2, 'score': 0.41075376}, {'id': 'https://openalex.org/C149635348', 'wikidata': 'https://www.wikidata.org/wiki/Q193040', 'display_name': 'Embedded system', 'level': 1, 'score': 0.3866671}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.25637576}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.10022959}, {'id': 'https://openalex.org/C165205528', 'wikidata': 'https://www.wikidata.org/wiki/Q83371', 'display_name': 'Seismology', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C199360897', 'wikidata': 'https://www.wikidata.org/wiki/Q9143', 'display_name': 'Programming language', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C127313418', 'wikidata': 'https://www.wikidata.org/wiki/Q1069', 'display_name': 'Geology', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C111919701', 'wikidata': 'https://www.wikidata.org/wiki/Q9135', 'display_name': 'Operating system', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/wcmeim54377.2021.00039', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4363607944', 'display_name': '2022 5th World Conference on Mechanical Engineering and Intelligent Manufacturing (WCMEIM)', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'conference'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'display_name': 'Industry, innovation and infrastructure', 'score': 0.5, 'id': 'https://metadata.un.org/sdg/9'}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W3174413644', 'https://openalex.org/W2994099990', 'https://openalex.org/W2541891035', 'https://openalex.org/W2510354731', 'https://openalex.org/W2393637862', 'https://openalex.org/W2379226019', 'https://openalex.org/W2351458975', 'https://openalex.org/W2140335784', 'https://openalex.org/W2061862719', 'https://openalex.org/W2054430068'], 'abstract_inverted_index': {'With': [0], 'the': [1, 9, 15, 34, 45, 75, 114], 'wide': [2], 'application': [3, 52], 'of': [4, 11, 17, 40, 61, 77, 110], 'computer': [5, 55], 'and': [6, 22, 24, 29, 37, 51, 64, 66, 85, 95, 97, 106], 'microelectronics': [7], 'in': [8], 'field': [10], 'mechanical': [12], 'fault': [13, 104], 'diagnosis,': [14], 'combination': [16], 'data': [18, 42, 68, 88, 92, 100, 111], 'acquisition': [19, 43, 49, 69, 89], 'system,': [20, 70], 'sensor': [21], 'analysis': [23], 'processing': [25], 'system': [26, 115], 'becomes': [27], 'more': [28, 30], 'close.': [31], 'Based': [32], 'on': [33], 'working': [35], 'principle': [36], 'parameter': [38], 'selection': [39], 'NI-DAQ': [41], 'board,': [44], 'paper': [46], 'integrates': [47], 'hardware': [48], 'equipment': [50, 65], 'software': [53], 'through': [54], 'to': [56, 73], 'establish': [57], 'a': [58], 'complete': [59], 'set': [60], 'practical': [62], 'instruments': [63], 'dynamic': [67], 'so': [71], 'as': [72], 'realize': [74, 91], 'solution': [76], 'obtaining': [78], 'information': [79], 'with': [80], 'high': [81, 83], 'speed,': [82], 'precision': [84], 'multi-channel.': [86], 'The': [87, 108], 'can': [90], 'acquisition,': [93], 'integration': [94], 'storage,': [96], 'provide': [98], 'important': [99], 'basis': [101], 'for': [102], 'subsequent': [103], 'diagnosis': [105], 'analysis.': [107], 'veracity': [109], 'collected': [112], 'by': [113, 118], 'is': [116], 'verified': [117], 'vibration': [119], 'test.': [120]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W4210912696', 'counts_by_year': [], 'updated_date': '2024-12-10T23:37:21.428892', 'created_date': '2022-02-09'}