Get quick answers to your questions about the article from our AI researcher chatbot
{'id': 'https://openalex.org/W3199277231', 'doi': 'https://doi.org/10.17577/ijertv10is090056', 'title': 'Software Reliability Prediction : A Review', 'display_name': 'Software Reliability Prediction : A Review', 'publication_year': 2021, 'publication_date': '2021-09-15', 'ids': {'openalex': 'https://openalex.org/W3199277231', 'doi': 'https://doi.org/10.17577/ijertv10is090056', 'mag': '3199277231'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://www.ijert.org/research/software-reliability-prediction-a-review-IJERTV10IS090056.pdf', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S2764531433', 'display_name': 'International Journal of Engineering Research and', 'issn_l': '2278-0181', 'issn': ['2278-0181'], 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/P4322544606', 'host_organization_name': 'International Research Publication House', 'host_organization_lineage': ['https://openalex.org/P4322544606'], 'host_organization_lineage_names': ['International Research Publication House'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'review', 'type_crossref': 'journal-article', 'indexed_in': [], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5039974513', 'display_name': 'Suneel Kumar Rath', 'orcid': 'https://orcid.org/0000-0001-5960-830X'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Suneel Kumar Rath', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5038463691', 'display_name': 'Madhusmita Sahu', 'orcid': 'https://orcid.org/0000-0002-3994-2914'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Madhusmita Sahu', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5068992322', 'display_name': 'Shom Prasad Das', 'orcid': 'https://orcid.org/0000-0003-4980-7756'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Shom Prasad Das', 'raw_affiliation_strings': [], 'affiliations': []}], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': False, 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 59}, 'biblio': {'volume': '10', 'issue': '9', 'first_page': None, 'last_page': None}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12423', 'display_name': 'Software Reliability Assessment and Prediction', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12423', 'display_name': 'Software Reliability Assessment and Prediction', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10780', 'display_name': 'Reliability Engineering and Maintenance Optimization', 'score': 0.9971, 'subfield': {'id': 'https://openalex.org/subfields/2213', 'display_name': 'Safety, Risk, Reliability and Quality'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11005', 'display_name': 'Fault Tolerance in Electronic Systems', 'score': 0.9805, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/software-reliability-modeling', 'display_name': 'Software Reliability Modeling', 'score': 0.787444}, {'id': 'https://openalex.org/keywords/system-reliability', 'display_name': 'System Reliability', 'score': 0.774613}, {'id': 'https://openalex.org/keywords/reliability-evaluation', 'display_name': 'Reliability Evaluation', 'score': 0.756831}, {'id': 'https://openalex.org/keywords/reliability-engineering', 'display_name': 'Reliability Engineering', 'score': 0.698241}, {'id': 'https://openalex.org/keywords/fault-detection-and-correction', 'display_name': 'Fault Detection and Correction', 'score': 0.588139}], 'concepts': [{'id': 'https://openalex.org/C200601418', 'wikidata': 'https://www.wikidata.org/wiki/Q2193887', 'display_name': 'Reliability engineering', 'level': 1, 'score': 0.68504786}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.64408016}, {'id': 'https://openalex.org/C117447612', 'wikidata': 'https://www.wikidata.org/wiki/Q1412670', 'display_name': 'Software quality', 'level': 4, 'score': 0.5689136}, {'id': 'https://openalex.org/C43214815', 'wikidata': 'https://www.wikidata.org/wiki/Q7310987', 'display_name': 'Reliability (semiconductor)', 'level': 3, 'score': 0.54784375}, {'id': 'https://openalex.org/C2777904410', 'wikidata': 'https://www.wikidata.org/wiki/Q7397', 'display_name': 'Software', 'level': 2, 'score': 0.41597277}, {'id': 'https://openalex.org/C199360897', 'wikidata': 'https://www.wikidata.org/wiki/Q9143', 'display_name': 'Programming language', 'level': 1, 'score': 0.13970464}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.13439405}, {'id': 'https://openalex.org/C529173508', 'wikidata': 'https://www.wikidata.org/wiki/Q638608', 'display_name': 'Software development', 'level': 3, 'score': 0.11944774}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.03288883}, {'id': 'https://openalex.org/C163258240', 'wikidata': 'https://www.wikidata.org/wiki/Q25342', 'display_name': 'Power (physics)', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://www.ijert.org/research/software-reliability-prediction-a-review-IJERTV10IS090056.pdf', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S2764531433', 'display_name': 'International Journal of Engineering Research and', 'issn_l': '2278-0181', 'issn': ['2278-0181'], 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/P4322544606', 'host_organization_name': 'International Research Publication House', 'host_organization_lineage': ['https://openalex.org/P4322544606'], 'host_organization_lineage_names': ['International Research Publication House'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 10, 'referenced_works': ['https://openalex.org/W134828221', 'https://openalex.org/W1521513408', 'https://openalex.org/W1980595883', 'https://openalex.org/W2015699956', 'https://openalex.org/W2034676482', 'https://openalex.org/W2116822028', 'https://openalex.org/W2123753253', 'https://openalex.org/W2145346981', 'https://openalex.org/W2163778112', 'https://openalex.org/W71376590'], 'related_works': ['https://openalex.org/W84310704', 'https://openalex.org/W764710008', 'https://openalex.org/W3209679731', 'https://openalex.org/W3142139407', 'https://openalex.org/W3133794755', 'https://openalex.org/W2968834800', 'https://openalex.org/W2939081395', 'https://openalex.org/W2900592108', 'https://openalex.org/W2871250901', 'https://openalex.org/W2735057054', 'https://openalex.org/W2497150891', 'https://openalex.org/W2482077605', 'https://openalex.org/W2481453318', 'https://openalex.org/W2477104497', 'https://openalex.org/W2383116142', 'https://openalex.org/W2354586700', 'https://openalex.org/W2153242493', 'https://openalex.org/W2021778008', 'https://openalex.org/W132177554', 'https://openalex.org/W10212557'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W3199277231', 'counts_by_year': [], 'updated_date': '2024-08-21T08:30:10.771104', 'created_date': '2021-09-27'}