Publication Information

{'id': 'https://openalex.org/W3191134606', 'doi': None, 'title': 'Time Dependence of Radiation Damage in Bipolar Operational Amplifiers', 'display_name': 'Time Dependence of Radiation Damage in Bipolar Operational Amplifiers', 'publication_year': 2006, 'publication_date': '2006-01-01', 'ids': {'openalex': 'https://openalex.org/W3191134606', 'mag': '3191134606'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'http://www.jos.ac.cn/article/id/e8d87c47-ae55-4ab0-9645-c1a233775f70', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S52834336', 'display_name': 'Journal of Semiconductors', 'issn_l': '1674-4926', 'issn': ['1674-4926', '2058-6140'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320083', 'host_organization_name': 'IOP Publishing', 'host_organization_lineage': ['https://openalex.org/P4310311669', 'https://openalex.org/P4310320083'], 'host_organization_lineage_names': ['Institute of Physics', 'IOP Publishing'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': [], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5056163545', 'display_name': 'Song Gao', 'orcid': 'https://orcid.org/0000-0002-3367-2546'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Gao Song', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5030917506', 'display_name': 'Wu Lu', 'orcid': 'https://orcid.org/0000-0001-6776-9082'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Lu Wu', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5100561430', 'display_name': 'Ren Diyuan', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Ren Diyuan', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5033103099', 'display_name': 'Niu Zhenhong', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Niu Zhenhong', 'raw_affiliation_strings': [], 'affiliations': []}], 'institution_assertions': [], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': False, 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 61}, 'biblio': {'volume': '27', 'issue': '7', 'first_page': '1280', 'last_page': '1284'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T11005', 'display_name': 'Radiation Effects in Electronics', 'score': 0.9997, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T11005', 'display_name': 'Radiation Effects in Electronics', 'score': 0.9997, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10558', 'display_name': 'Advancements in Semiconductor Devices and Circuit Design', 'score': 0.9987, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10472', 'display_name': 'Semiconductor materials and devices', 'score': 0.9979, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/radiation-damage', 'display_name': 'radiation damage', 'score': 0.80999106}, {'id': 'https://openalex.org/keywords/dose-rate', 'display_name': 'Dose rate', 'score': 0.41291964}], 'concepts': [{'id': 'https://openalex.org/C153428861', 'wikidata': 'https://www.wikidata.org/wiki/Q152749', 'display_name': 'Radiation damage', 'level': 3, 'score': 0.80999106}, {'id': 'https://openalex.org/C153385146', 'wikidata': 'https://www.wikidata.org/wiki/Q18335', 'display_name': 'Radiation', 'level': 2, 'score': 0.78783077}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.5495039}, {'id': 'https://openalex.org/C2777855556', 'wikidata': 'https://www.wikidata.org/wiki/Q4339544', 'display_name': 'Annealing (glass)', 'level': 2, 'score': 0.5327988}, {'id': 'https://openalex.org/C3017588741', 'wikidata': 'https://www.wikidata.org/wiki/Q3042357', 'display_name': 'Dose rate', 'level': 2, 'score': 0.41291964}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.33659762}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.291524}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.24019647}, {'id': 'https://openalex.org/C19527891', 'wikidata': 'https://www.wikidata.org/wiki/Q1120908', 'display_name': 'Medical physics', 'level': 1, 'score': 0.19237363}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.13429931}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'http://www.jos.ac.cn/article/id/e8d87c47-ae55-4ab0-9645-c1a233775f70', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S52834336', 'display_name': 'Journal of Semiconductors', 'issn_l': '1674-4926', 'issn': ['1674-4926', '2058-6140'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320083', 'host_organization_name': 'IOP Publishing', 'host_organization_lineage': ['https://openalex.org/P4310311669', 'https://openalex.org/P4310320083'], 'host_organization_lineage_names': ['Institute of Physics', 'IOP Publishing'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W3144934764', 'https://openalex.org/W2945831573', 'https://openalex.org/W2906344445', 'https://openalex.org/W2379808522', 'https://openalex.org/W2374456295', 'https://openalex.org/W2354205805', 'https://openalex.org/W2352087785', 'https://openalex.org/W2333615782', 'https://openalex.org/W2329741021', 'https://openalex.org/W2238577671', 'https://openalex.org/W2169970226', 'https://openalex.org/W2167740170', 'https://openalex.org/W2154353032', 'https://openalex.org/W2139264638', 'https://openalex.org/W2123009367', 'https://openalex.org/W2116674031', 'https://openalex.org/W2110448916', 'https://openalex.org/W2044850217', 'https://openalex.org/W1984998814', 'https://openalex.org/W140310009'], 'abstract_inverted_index': {'The': [0], 'time': [1, 47], 'dependence': [2], 'of': [3, 14, 59, 63], 'radiation': [4, 15, 20, 35, 64], 'damage': [5, 21, 36, 65], 'in': [6, 22, 37], 'bipolar': [7, 23], 'op-amps': [8, 24], 'is': [9, 25], 'studied': [10], 'through': [11], 'a': [12], 'series': [13], 'experiments.The': [16], 'results': [17], 'show': [18], 'that': [19], 'closely': [26], 'related': [27], 'to': [28, 49], 'time,and': [29], 'we': [30], 'can': [31], 'evaluate': [32], 'low-dose': [33], 'rate': [34], 'devices': [38], 'by': [39], 'adjusting': [40], 'radiating': [41], 'the': [42, 55], 'dose': [43], 'rate,annealing': [44], 'temperature,and': [45], 'annealing': [46], 'parameters': [48], 'experiment': [51], 'on': [52], 'circulating': [53], 'radiation-anneal.From': [54], 'interface': [56], 'states': [57], 'point': [58], 'view,the': [60], 'possible': [61], 'mechanisms': [62], 'are': [66], 'also': [67], 'analyzed.': [68]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W3191134606', 'counts_by_year': [], 'updated_date': '2024-12-09T10:51:12.858307', 'created_date': '2021-08-16'}