Title: Specimen preparation for transmission electron microscopy
Abstract: This chapter is intended as a convenience to those readers actively engaged in the investigation of high Tc superconductors by transmission electron microscopy (TEM). A future possible application of the newly discovered high Tc superconductors is their use in electronic devices. The electrical properties of a device strongly depend on their microstructure, since grain boundaries in these materials can behave as weak links as reported by Dimos et al. [4.1]. Therefore, TEM is an important tool in the study of the relationship between the microstructure and the electrical properties.
Publication Year: 2000
Publication Date: 2000-07-06
Language: en
Type: book-chapter
Indexed In: ['crossref']
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Cited By Count: 12
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