Title: Atomic-Resolution Imaging of Graphene Using an Ultrahigh-vacuum Microscope with a High-brightness Electron Gun
Abstract: Journal Article Atomic-Resolution Imaging of Graphene Using an Ultrahigh-vacuum Microscope with a High-brightness Electron Gun Get access Hidetaka Sawada, Hidetaka Sawada JEOL Ltd., Akishima, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Shigeyuki Morishita, Shigeyuki Morishita JEOL Ltd., Akishima, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Yuji Kohno, Yuji Kohno JEOL Ltd., Akishima, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Takeo Sasaki, Takeo Sasaki JEOL Ltd., Welwyn Garden City, England, United Kingdom Search for other works by this author on: Oxford Academic Google Scholar Masaki Mukai, Masaki Mukai JEOL Ltd., Akishima, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Yung-Chang Lin, Yung-Chang Lin AIST, Tsukuba, Ibaraki, Japan Search for other works by this author on: Oxford Academic Google Scholar Ryosuke Senga, Ryosuke Senga AIST, Tsukuba, Ibaraki, Japan Search for other works by this author on: Oxford Academic Google Scholar Kazu Suenaga Kazu Suenaga AIST, Tsukuba, Ibaraki, Japan Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 2358–2359, https://doi.org/10.1017/S1431927620021315 Published: 01 August 2020