Get quick answers to your questions about the article from our AI researcher chatbot
{'id': 'https://openalex.org/W3089035980', 'doi': 'https://doi.org/10.1109/access.2020.3025153', 'title': 'A 12-Bit Column-Parallel Two-Step Single-Slope ADC With a Foreground Calibration for CMOS Image Sensors', 'display_name': 'A 12-Bit Column-Parallel Two-Step Single-Slope ADC With a Foreground Calibration for CMOS Image Sensors', 'publication_year': 2020, 'publication_date': '2020-01-01', 'ids': {'openalex': 'https://openalex.org/W3089035980', 'doi': 'https://doi.org/10.1109/access.2020.3025153', 'mag': '3089035980'}, 'language': 'en', 'primary_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.1109/access.2020.3025153', 'pdf_url': 'https://ieeexplore.ieee.org/ielx7/6287639/8948470/09201088.pdf', 'source': {'id': 'https://openalex.org/S2485537415', 'display_name': 'IEEE Access', 'issn_l': '2169-3536', 'issn': ['2169-3536'], 'is_oa': True, 'is_in_doaj': True, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': 'cc-by', 'license_id': 'https://openalex.org/licenses/cc-by', 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref', 'doaj'], 'open_access': {'is_oa': True, 'oa_status': 'gold', 'oa_url': 'https://ieeexplore.ieee.org/ielx7/6287639/8948470/09201088.pdf', 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5101622962', 'display_name': 'Qihui Zhang', 'orcid': 'https://orcid.org/0000-0001-7015-2059'}, 'institutions': [{'id': 'https://openalex.org/I4210124847', 'display_name': 'National Engineering Research Center of Electromagnetic Radiation Control Materials', 'ror': 'https://ror.org/02k4dcs46', 'country_code': 'CN', 'type': 'facility', 'lineage': ['https://openalex.org/I4210124847']}, {'id': 'https://openalex.org/I150229711', 'display_name': 'University of Electronic Science and Technology of China', 'ror': 'https://ror.org/04qr3zq92', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I150229711']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Qihui Zhang', 'raw_affiliation_strings': ['State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China'], 'affiliations': [{'raw_affiliation_string': 'State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China', 'institution_ids': ['https://openalex.org/I4210124847', 'https://openalex.org/I150229711']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5100749757', 'display_name': 'Ning Ning', 'orcid': 'https://orcid.org/0000-0001-7893-1428'}, 'institutions': [{'id': 'https://openalex.org/I4210124847', 'display_name': 'National Engineering Research Center of Electromagnetic Radiation Control Materials', 'ror': 'https://ror.org/02k4dcs46', 'country_code': 'CN', 'type': 'facility', 'lineage': ['https://openalex.org/I4210124847']}, {'id': 'https://openalex.org/I150229711', 'display_name': 'University of Electronic Science and Technology of China', 'ror': 'https://ror.org/04qr3zq92', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I150229711']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Ning Ning', 'raw_affiliation_strings': ['State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China'], 'affiliations': [{'raw_affiliation_string': 'State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China', 'institution_ids': ['https://openalex.org/I4210124847', 'https://openalex.org/I150229711']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5100336850', 'display_name': 'Jing Li', 'orcid': 'https://orcid.org/0000-0001-9980-0224'}, 'institutions': [{'id': 'https://openalex.org/I4210124847', 'display_name': 'National Engineering Research Center of Electromagnetic Radiation Control Materials', 'ror': 'https://ror.org/02k4dcs46', 'country_code': 'CN', 'type': 'facility', 'lineage': ['https://openalex.org/I4210124847']}, {'id': 'https://openalex.org/I150229711', 'display_name': 'University of Electronic Science and Technology of China', 'ror': 'https://ror.org/04qr3zq92', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I150229711']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Jing Li', 'raw_affiliation_strings': ['State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China'], 'affiliations': [{'raw_affiliation_string': 'State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China', 'institution_ids': ['https://openalex.org/I4210124847', 'https://openalex.org/I150229711']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5100377679', 'display_name': 'Qi Yu', 'orcid': 'https://orcid.org/0000-0002-0490-0749'}, 'institutions': [{'id': 'https://openalex.org/I4210124847', 'display_name': 'National Engineering Research Center of Electromagnetic Radiation Control Materials', 'ror': 'https://ror.org/02k4dcs46', 'country_code': 'CN', 'type': 'facility', 'lineage': ['https://openalex.org/I4210124847']}, {'id': 'https://openalex.org/I150229711', 'display_name': 'University of Electronic Science and Technology of China', 'ror': 'https://ror.org/04qr3zq92', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I150229711']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Qi Yu', 'raw_affiliation_strings': ['State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China'], 'affiliations': [{'raw_affiliation_string': 'State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China', 'institution_ids': ['https://openalex.org/I4210124847', 'https://openalex.org/I150229711']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5067510762', 'display_name': 'Kejun Wu', 'orcid': 'https://orcid.org/0000-0001-5472-0570'}, 'institutions': [{'id': 'https://openalex.org/I4210124847', 'display_name': 'National Engineering Research Center of Electromagnetic Radiation Control Materials', 'ror': 'https://ror.org/02k4dcs46', 'country_code': 'CN', 'type': 'facility', 'lineage': ['https://openalex.org/I4210124847']}, {'id': 'https://openalex.org/I150229711', 'display_name': 'University of Electronic Science and Technology of China', 'ror': 'https://ror.org/04qr3zq92', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I150229711']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Kejun Wu', 'raw_affiliation_strings': ['State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China'], 'affiliations': [{'raw_affiliation_string': 'State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China', 'institution_ids': ['https://openalex.org/I4210124847', 'https://openalex.org/I150229711']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5100350975', 'display_name': 'Zhong Zhang', 'orcid': 'https://orcid.org/0000-0003-2611-9424'}, 'institutions': [{'id': 'https://openalex.org/I4210124847', 'display_name': 'National Engineering Research Center of Electromagnetic Radiation Control Materials', 'ror': 'https://ror.org/02k4dcs46', 'country_code': 'CN', 'type': 'facility', 'lineage': ['https://openalex.org/I4210124847']}, {'id': 'https://openalex.org/I150229711', 'display_name': 'University of Electronic Science and Technology of China', 'ror': 'https://ror.org/04qr3zq92', 'country_code': 'CN', 'type': 'education', 'lineage': ['https://openalex.org/I150229711']}], 'countries': ['CN'], 'is_corresponding': False, 'raw_author_name': 'Zhong Zhang', 'raw_affiliation_strings': ['State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China'], 'affiliations': [{'raw_affiliation_string': 'State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China', 'institution_ids': ['https://openalex.org/I4210124847', 'https://openalex.org/I150229711']}]}], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': {'value': 1850, 'currency': 'USD', 'value_usd': 1850, 'provenance': 'doaj'}, 'apc_paid': {'value': 1850, 'currency': 'USD', 'value_usd': 1850, 'provenance': 'doaj'}, 'fwci': 0.738, 'has_fulltext': True, 'fulltext_origin': 'pdf', 'cited_by_count': 14, 'citation_normalized_percentile': {'value': 0.763945, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 90, 'max': 91}, 'biblio': {'volume': '8', 'issue': None, 'first_page': '172467', 'last_page': '172480'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T11992', 'display_name': 'CMOS Image Sensor Technology', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T11992', 'display_name': 'CMOS Image Sensor Technology', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10323', 'display_name': 'Analog Circuit Design for Biomedical Applications', 'score': 0.9953, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11472', 'display_name': 'Advances in Chemical Sensor Technologies', 'score': 0.9889, 'subfield': {'id': 'https://openalex.org/subfields/1502', 'display_name': 'Bioengineering'}, 'field': {'id': 'https://openalex.org/fields/15', 'display_name': 'Chemical Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/differential-nonlinearity', 'display_name': 'Differential nonlinearity', 'score': 0.82123256}, {'id': 'https://openalex.org/keywords/integral-nonlinearity', 'display_name': 'Integral nonlinearity', 'score': 0.7927756}, {'id': 'https://openalex.org/keywords/cmos-image-sensors', 'display_name': 'CMOS Image Sensors', 'score': 0.592351}, {'id': 'https://openalex.org/keywords/pixel-level-adc', 'display_name': 'Pixel-Level ADC', 'score': 0.592036}, {'id': 'https://openalex.org/keywords/cmos', 'display_name': 'CMOS', 'score': 0.531211}, {'id': 'https://openalex.org/keywords/low-noise-sensors', 'display_name': 'Low-Noise Sensors', 'score': 0.500061}, {'id': 'https://openalex.org/keywords/fixed-pattern-noise', 'display_name': 'Fixed-pattern noise', 'score': 0.4995191}, {'id': 'https://openalex.org/keywords/successive-approximation-adc', 'display_name': 'Successive approximation ADC', 'score': 0.43829137}], 'concepts': [{'id': 'https://openalex.org/C155745195', 'wikidata': 'https://www.wikidata.org/wiki/Q1164179', 'display_name': 'Comparator', 'level': 3, 'score': 0.87666464}, {'id': 'https://openalex.org/C71217194', 'wikidata': 'https://www.wikidata.org/wiki/Q575958', 'display_name': 'Differential nonlinearity', 'level': 3, 'score': 0.82123256}, {'id': 'https://openalex.org/C130829357', 'wikidata': 'https://www.wikidata.org/wiki/Q1665386', 'display_name': 'Integral nonlinearity', 'level': 4, 'score': 0.7927756}, {'id': 'https://openalex.org/C16671190', 'wikidata': 'https://www.wikidata.org/wiki/Q505579', 'display_name': 'Effective number of bits', 'level': 3, 'score': 0.7858429}, {'id': 'https://openalex.org/C4305246', 'wikidata': 'https://www.wikidata.org/wiki/Q3885225', 'display_name': 'Least significant bit', 'level': 2, 'score': 0.704931}, {'id': 'https://openalex.org/C46362747', 'wikidata': 'https://www.wikidata.org/wiki/Q173431', 'display_name': 'CMOS', 'level': 2, 'score': 0.67001987}, {'id': 'https://openalex.org/C175291020', 'wikidata': 'https://www.wikidata.org/wiki/Q1156822', 'display_name': 'Offset (computer science)', 'level': 2, 'score': 0.626975}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.5028822}, {'id': 'https://openalex.org/C2778368474', 'wikidata': 'https://www.wikidata.org/wiki/Q5456322', 'display_name': 'Fixed-pattern noise', 'level': 3, 'score': 0.4995191}, {'id': 'https://openalex.org/C165838908', 'wikidata': 'https://www.wikidata.org/wiki/Q736777', 'display_name': 'Calibration', 'level': 2, 'score': 0.49583396}, {'id': 'https://openalex.org/C60154766', 'wikidata': 'https://www.wikidata.org/wiki/Q2650458', 'display_name': 'Successive approximation ADC', 'level': 4, 'score': 0.43829137}, {'id': 'https://openalex.org/C140779682', 'wikidata': 'https://www.wikidata.org/wiki/Q210868', 'display_name': 'Sampling (signal processing)', 'level': 3, 'score': 0.43722668}, {'id': 'https://openalex.org/C76935873', 'wikidata': 'https://www.wikidata.org/wiki/Q209121', 'display_name': 'Image sensor', 'level': 2, 'score': 0.41635743}, {'id': 'https://openalex.org/C160633673', 'wikidata': 'https://www.wikidata.org/wiki/Q355198', 'display_name': 'Pixel', 'level': 2, 'score': 0.413751}, {'id': 'https://openalex.org/C24326235', 'wikidata': 'https://www.wikidata.org/wiki/Q126095', 'display_name': 'Electronic engineering', 'level': 1, 'score': 0.31343454}, {'id': 'https://openalex.org/C33923547', 'wikidata': 'https://www.wikidata.org/wiki/Q395', 'display_name': 'Mathematics', 'level': 0, 'score': 0.22361279}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.22004062}, {'id': 'https://openalex.org/C165801399', 'wikidata': 'https://www.wikidata.org/wiki/Q25428', 'display_name': 'Voltage', 'level': 2, 'score': 0.16083172}, {'id': 'https://openalex.org/C154945302', 'wikidata': 'https://www.wikidata.org/wiki/Q11660', 'display_name': 'Artificial intelligence', 'level': 1, 'score': 0.15501189}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.15009972}, {'id': 'https://openalex.org/C94915269', 'wikidata': 'https://www.wikidata.org/wiki/Q1834857', 'display_name': 'Detector', 'level': 2, 'score': 0.14071104}, {'id': 'https://openalex.org/C2778422915', 'wikidata': 'https://www.wikidata.org/wiki/Q10302051', 'display_name': 'Converters', 'level': 3, 'score': 0.12042788}, {'id': 'https://openalex.org/C76155785', 'wikidata': 'https://www.wikidata.org/wiki/Q418', 'display_name': 'Telecommunications', 'level': 1, 'score': 0.0874244}, {'id': 'https://openalex.org/C105795698', 'wikidata': 'https://www.wikidata.org/wiki/Q12483', 'display_name': 'Statistics', 'level': 1, 'score': 0.07747635}, {'id': 'https://openalex.org/C199360897', 'wikidata': 'https://www.wikidata.org/wiki/Q9143', 'display_name': 'Programming language', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C111919701', 'wikidata': 'https://www.wikidata.org/wiki/Q9135', 'display_name': 'Operating system', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 2, 'locations': [{'is_oa': True, 'landing_page_url': 'https://doi.org/10.1109/access.2020.3025153', 'pdf_url': 'https://ieeexplore.ieee.org/ielx7/6287639/8948470/09201088.pdf', 'source': {'id': 'https://openalex.org/S2485537415', 'display_name': 'IEEE Access', 'issn_l': '2169-3536', 'issn': ['2169-3536'], 'is_oa': True, 'is_in_doaj': True, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': 'cc-by', 'license_id': 'https://openalex.org/licenses/cc-by', 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, {'is_oa': False, 'landing_page_url': 'https://doaj.org/article/9b27528ad67e463fb1e3fa75c7481434', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306401280', 'display_name': 'DOAJ (DOAJ: Directory of Open Access Journals)', 'issn_l': None, 'issn': None, 'is_oa': True, 'is_in_doaj': False, 'is_core': False, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'repository'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.1109/access.2020.3025153', 'pdf_url': 'https://ieeexplore.ieee.org/ielx7/6287639/8948470/09201088.pdf', 'source': {'id': 'https://openalex.org/S2485537415', 'display_name': 'IEEE Access', 'issn_l': '2169-3536', 'issn': ['2169-3536'], 'is_oa': True, 'is_in_doaj': True, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': 'cc-by', 'license_id': 'https://openalex.org/licenses/cc-by', 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'sustainable_development_goals': [{'score': 0.86, 'display_name': 'Affordable and clean energy', 'id': 'https://metadata.un.org/sdg/7'}], 'grants': [{'funder': 'https://openalex.org/F4320321001', 'funder_display_name': 'National Natural Science Foundation of China', 'award_id': '61774028'}, {'funder': 'https://openalex.org/F4320321001', 'funder_display_name': 'National Natural Science Foundation of China', 'award_id': '61404022'}], 'datasets': [], 'versions': [], 'referenced_works_count': 33, 'referenced_works': ['https://openalex.org/W1503479382', 'https://openalex.org/W1541091770', 'https://openalex.org/W1607639185', 'https://openalex.org/W1636491923', 'https://openalex.org/W1975545060', 'https://openalex.org/W1985290029', 'https://openalex.org/W1994123466', 'https://openalex.org/W1999393635', 'https://openalex.org/W2015041420', 'https://openalex.org/W2036851601', 'https://openalex.org/W2042081546', 'https://openalex.org/W2053943475', 'https://openalex.org/W2082334180', 'https://openalex.org/W2094024001', 'https://openalex.org/W2104086223', 'https://openalex.org/W2113025650', 'https://openalex.org/W2122425004', 'https://openalex.org/W2136376206', 'https://openalex.org/W2145158355', 'https://openalex.org/W2147887812', 'https://openalex.org/W2150423223', 'https://openalex.org/W2164819109', 'https://openalex.org/W2175009324', 'https://openalex.org/W2200449959', 'https://openalex.org/W2568520569', 'https://openalex.org/W2655381514', 'https://openalex.org/W2883878442', 'https://openalex.org/W2966341337', 'https://openalex.org/W2993883558', 'https://openalex.org/W2996765167', 'https://openalex.org/W3012438093', 'https://openalex.org/W3034711398', 'https://openalex.org/W4231501498'], 'related_works': ['https://openalex.org/W4290755255', 'https://openalex.org/W3089035980', 'https://openalex.org/W2804896529', 'https://openalex.org/W2546069210', 'https://openalex.org/W2536327642', 'https://openalex.org/W2166674979', 'https://openalex.org/W2135048255', 'https://openalex.org/W2048428008', 'https://openalex.org/W2021405064', 'https://openalex.org/W1907199348'], 'abstract_inverted_index': {'This': [0], 'paper': [1], 'proposes': [2], 'a': [3, 26, 71, 91, 115], 'novel': [4], '12-bit': [5], 'column-parallel': [6], 'two-step': [7], 'single-slope': [8], '(SS)': [9], 'analog-to-digital': [10], 'converter': [11], '(ADC)': [12], 'for': [13], 'high-speed': [14], 'CMOS': [15, 93], 'image': [16], 'sensors.': [17], 'Cooperating': [18], 'with': [19, 121], 'the': [20, 36, 42, 45, 49, 54, 60, 65, 74, 77, 81, 95, 99, 107, 122, 155], 'output': [21], 'offset': [22, 62], 'storage': [23], '(OOS)': [24], 'technique,': [25], 'new': [27], 'correlated': [28], 'double': [29], 'sampling': [30, 116], '(CDS)': [31], 'is': [32, 51, 68, 130, 158], 'adopted': [33], 'to': [34, 136], 'reduce': [35], 'non-uniformity': [37], 'in': [38, 90], 'column-level': [39], 'ADCs.': [40], 'In': [41], 'proposed': [43, 96], 'structure,': [44], 'decision': [46], 'point': [47], 'of': [48, 53, 59, 103, 111, 118, 127, 146], 'comparator': [50, 61], 'independent': [52], 'input': [55, 66], 'signal.': [56], 'The': [57, 124, 139], 'variation': [58], 'caused': [63], 'by': [64], 'level': [67], 'eliminated.': [69], 'Through': [70], 'foreground': [72], 'calibration,': [73], 'non-idealities': [75], 'from': [76, 133], 'ramp': [78], 'generator': [79], 'and': [80, 88, 106, 154], 'column': [82], 'ADC': [83, 97, 141], 'are': [84], 'both': [85], 'corrected.': [86], 'Design': [87], 'simulation': [89], '130nm': [92], 'process,': [94], 'achieves': [98], 'differential': [100], 'nonlinearity': [101, 109], '(DNL)': [102], '+0.76/-0.8': [104], 'LSB': [105, 113], 'integral': [108], '(INL)': [110], '+1.06/-0.84': [112], 'at': [114], 'frequency': [117], '100': [119], 'KS/s': [120], 'calibration.': [123], 'effective': [125], 'number': [126], 'bits': [128, 135], '(ENOB)': [129], 'also': [131], 'improved': [132], '4.66': [134], '11.25': [137], 'bits.': [138], 'single': [140], 'occupies': [142], 'an': [143], 'active': [144], 'area': [145], '7.5': [147], '×': [148], '775': [149], 'μm': [150], '<sup': [151], 'xmlns:mml="http://www.w3.org/1998/Math/MathML"': [152], 'xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>': [153], 'power': [156], 'consumption': [157], '72': [159], 'μW': [160], '.': [161]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W3089035980', 'counts_by_year': [{'year': 2024, 'cited_by_count': 4}, {'year': 2023, 'cited_by_count': 5}, {'year': 2022, 'cited_by_count': 4}, {'year': 2021, 'cited_by_count': 1}], 'updated_date': '2024-09-11T06:28:15.850030', 'created_date': '2020-10-01'}