Title: The applicability of non-parametric methods of statistical analysis to metrology.
Abstract: There are classes of problems in metrology for which little or no distributional knowledge is available concerning the values of the input quantities to a model of measurement. Consequently, non-parametric methods have value when applied to such problems. So-called ‘re-sampling’ methods are discussed and applied to two problems, one concerning environmental and the other dimensional measurement. These problems have very different character, and the re-sampling approaches used are selected accordingly. Further, consideration is given to an approach for the provision of a coverage region for the values of multivariate quantities that makes no assumption about the distribution for the values of these quantities. The approach is applied to a problem in electrical metrology.
Publication Year: 2004
Publication Date: 2004-03-01
Language: en
Type: article
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Cited By Count: 2
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