Title: Circuit Reliability of Low-Power RRAM-Based Logic-in-Memory Architectures
Abstract:Logic circuits based on Resistive RAM (RRAM) devices and the material implication logic (IMPLY) are promising solutions for low-power logic-in-memory (LiM) architectures. Still, their diffusion is lim...Logic circuits based on Resistive RAM (RRAM) devices and the material implication logic (IMPLY) are promising solutions for low-power logic-in-memory (LiM) architectures. Still, their diffusion is limited by their high design complexity resulting from device and circuit non-idealities. These non-idealities are usually overlooked in the design phase when using simplified RRAM models, thus leading to unreliable designs. In this work, we derive correct design strategies for reliability of RRAM-based LiM circuits and quantitatively evaluate circuit performances using a physics-based compact model.Read More
Publication Year: 2019
Publication Date: 2019-10-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 9
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