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{'id': 'https://openalex.org/W2971457444', 'doi': 'https://doi.org/10.1134/s1061830919060081', 'title': 'Computer Aided Radiograph Interpretation Tool for Defect Characterization from Weld Plates', 'display_name': 'Computer Aided Radiograph Interpretation Tool for Defect Characterization from Weld Plates', 'publication_year': 2019, 'publication_date': '2019-06-01', 'ids': {'openalex': 'https://openalex.org/W2971457444', 'doi': 'https://doi.org/10.1134/s1061830919060081', 'mag': '2971457444'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1134/s1061830919060081', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S67326217', 'display_name': 'Russian Journal of Nondestructive Testing', 'issn_l': '1061-8309', 'issn': ['1061-8309', '1608-3385'], 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/P4310320267', 'host_organization_name': 'Pleiades Publishing', 'host_organization_lineage': ['https://openalex.org/P4310320267', 'https://openalex.org/P4310319965'], 'host_organization_lineage_names': ['Pleiades Publishing', 'Springer Nature'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5043366854', 'display_name': 'K. Sudheera', 'orcid': 'https://orcid.org/0000-0002-9246-1669'}, 'institutions': [{'id': 'https://openalex.org/I43814544', 'display_name': 'Sathyabama Institute of Science and Technology', 'ror': 'https://ror.org/01defpn95', 'country_code': 'IN', 'type': 'education', 'lineage': ['https://openalex.org/I43814544']}], 'countries': ['IN'], 'is_corresponding': True, 'raw_author_name': 'K. Sudheera', 'raw_affiliation_strings': ['Sathyabama University, Chennai, India'], 'affiliations': [{'raw_affiliation_string': 'Sathyabama University, Chennai, India', 'institution_ids': ['https://openalex.org/I43814544']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5015910612', 'display_name': 'N. M. Nandhitha', 'orcid': 'https://orcid.org/0000-0002-5256-708X'}, 'institutions': [{'id': 'https://openalex.org/I43814544', 'display_name': 'Sathyabama Institute of Science and Technology', 'ror': 'https://ror.org/01defpn95', 'country_code': 'IN', 'type': 'education', 'lineage': ['https://openalex.org/I43814544']}], 'countries': ['IN'], 'is_corresponding': True, 'raw_author_name': 'N. M. Nandhitha', 'raw_affiliation_strings': ['Faculty of Electrical and Electronics, Sathyabama University, Chennai, India'], 'affiliations': [{'raw_affiliation_string': 'Faculty of Electrical and Electronics, Sathyabama University, Chennai, India', 'institution_ids': ['https://openalex.org/I43814544']}]}], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': ['https://openalex.org/A5043366854', 'https://openalex.org/A5015910612'], 'corresponding_institution_ids': ['https://openalex.org/I43814544', 'https://openalex.org/I43814544'], 'apc_list': None, 'apc_paid': None, 'fwci': 0.684, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 4, 'citation_normalized_percentile': {'value': 0.539102, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 78, 'max': 80}, 'biblio': {'volume': '55', 'issue': '6', 'first_page': '481', 'last_page': '488'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10662', 'display_name': 'Guided Wave Structural Health Monitoring in Materials', 'score': 0.9993, 'subfield': {'id': 'https://openalex.org/subfields/2211', 'display_name': 'Mechanics of Materials'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10662', 'display_name': 'Guided Wave Structural Health Monitoring in Materials', 'score': 0.9993, 'subfield': {'id': 'https://openalex.org/subfields/2211', 'display_name': 'Mechanics of Materials'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10834', 'display_name': 'Welding Techniques and Residual Stresses', 'score': 0.9986, 'subfield': {'id': 'https://openalex.org/subfields/2210', 'display_name': 'Mechanical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12169', 'display_name': 'Non-Destructive Techniques Based on Eddy Current Testing', 'score': 0.9984, 'subfield': {'id': 'https://openalex.org/subfields/2210', 'display_name': 'Mechanical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/defect-detection', 'display_name': 'Defect Detection', 'score': 0.606998}, {'id': 'https://openalex.org/keywords/damage-detection', 'display_name': 'Damage Detection', 'score': 0.561881}, {'id': 'https://openalex.org/keywords/characterization', 'display_name': 'Characterization (materials science)', 'score': 0.559452}, {'id': 'https://openalex.org/keywords/radiographic-testing', 'display_name': 'Radiographic testing', 'score': 0.5415876}, {'id': 'https://openalex.org/keywords/laser-welding', 'display_name': 'Laser Welding', 'score': 0.505779}, {'id': 'https://openalex.org/keywords/material-characterization', 'display_name': 'Material Characterization', 'score': 0.503405}, {'id': 'https://openalex.org/keywords/digital-radiography', 'display_name': 'Digital radiography', 'score': 0.42301407}], 'concepts': [{'id': 'https://openalex.org/C56529433', 'wikidata': 'https://www.wikidata.org/wiki/Q626700', 'display_name': 'Nondestructive testing', 'level': 2, 'score': 0.6990901}, {'id': 'https://openalex.org/C47432892', 'wikidata': 'https://www.wikidata.org/wiki/Q831390', 'display_name': 'Wavelet', 'level': 2, 'score': 0.674868}, {'id': 'https://openalex.org/C2780841128', 'wikidata': 'https://www.wikidata.org/wiki/Q5073781', 'display_name': 'Characterization (materials science)', 'level': 2, 'score': 0.559452}, {'id': 'https://openalex.org/C36454342', 'wikidata': 'https://www.wikidata.org/wiki/Q245341', 'display_name': 'Radiography', 'level': 2, 'score': 0.5546535}, {'id': 'https://openalex.org/C102758585', 'wikidata': 'https://www.wikidata.org/wiki/Q649912', 'display_name': 'Radiographic testing', 'level': 3, 'score': 0.5415876}, {'id': 'https://openalex.org/C89600930', 'wikidata': 'https://www.wikidata.org/wiki/Q1423946', 'display_name': 'Segmentation', 'level': 2, 'score': 0.53149647}, {'id': 'https://openalex.org/C191178318', 'wikidata': 'https://www.wikidata.org/wiki/Q2256906', 'display_name': 'Thresholding', 'level': 3, 'score': 0.5251503}, {'id': 'https://openalex.org/C19474535', 'wikidata': 'https://www.wikidata.org/wiki/Q131172', 'display_name': 'Welding', 'level': 2, 'score': 0.5002465}, {'id': 'https://openalex.org/C2776502983', 'wikidata': 'https://www.wikidata.org/wiki/Q690182', 'display_name': 'Contrast (vision)', 'level': 2, 'score': 0.4872893}, {'id': 'https://openalex.org/C154945302', 'wikidata': 'https://www.wikidata.org/wiki/Q11660', 'display_name': 'Artificial intelligence', 'level': 1, 'score': 0.4810993}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.42694634}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.4265411}, {'id': 'https://openalex.org/C2781305912', 'wikidata': 'https://www.wikidata.org/wiki/Q1225030', 'display_name': 'Digital radiography', 'level': 3, 'score': 0.42301407}, {'id': 'https://openalex.org/C126838900', 'wikidata': 'https://www.wikidata.org/wiki/Q77604', 'display_name': 'Radiology', 'level': 1, 'score': 0.20010072}, {'id': 'https://openalex.org/C71924100', 'wikidata': 'https://www.wikidata.org/wiki/Q11190', 'display_name': 'Medicine', 'level': 0, 'score': 0.11736363}, {'id': 'https://openalex.org/C191897082', 'wikidata': 'https://www.wikidata.org/wiki/Q11467', 'display_name': 'Metallurgy', 'level': 1, 'score': 0.09466231}, {'id': 'https://openalex.org/C115961682', 'wikidata': 'https://www.wikidata.org/wiki/Q860623', 'display_name': 'Image (mathematics)', 'level': 2, 'score': 0.07780734}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1134/s1061830919060081', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S67326217', 'display_name': 'Russian Journal of Nondestructive Testing', 'issn_l': '1061-8309', 'issn': ['1061-8309', '1608-3385'], 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/P4310320267', 'host_organization_name': 'Pleiades Publishing', 'host_organization_lineage': ['https://openalex.org/P4310320267', 'https://openalex.org/P4310319965'], 'host_organization_lineage_names': ['Pleiades Publishing', 'Springer Nature'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 18, 'referenced_works': ['https://openalex.org/W1893349180', 'https://openalex.org/W1979804891', 'https://openalex.org/W2044357364', 'https://openalex.org/W2065866067', 'https://openalex.org/W2079325712', 'https://openalex.org/W2089888586', 'https://openalex.org/W2171827999', 'https://openalex.org/W2213792642', 'https://openalex.org/W2257440622', 'https://openalex.org/W2291225066', 'https://openalex.org/W2291372708', 'https://openalex.org/W2292441838', 'https://openalex.org/W2364133906', 'https://openalex.org/W2395759543', 'https://openalex.org/W2549196305', 'https://openalex.org/W2775546317', 'https://openalex.org/W2977556318', 'https://openalex.org/W4248152114'], 'related_works': ['https://openalex.org/W4239831717', 'https://openalex.org/W4237712972', 'https://openalex.org/W4212979763', 'https://openalex.org/W2561554841', 'https://openalex.org/W2509252529', 'https://openalex.org/W2389079283', 'https://openalex.org/W2376178232', 'https://openalex.org/W2367709627', 'https://openalex.org/W1991875450', 'https://openalex.org/W1499455855'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2971457444', 'counts_by_year': [{'year': 2022, 'cited_by_count': 1}, {'year': 2020, 'cited_by_count': 3}], 'updated_date': '2024-08-14T14:55:39.224259', 'created_date': '2019-09-12'}