Title: Substrate temperature compensation for microbolometric focal plane array without TEC
Abstract: For a normal microbolometric focal plane array, the microbolometric infrared responsivity varies with its substrate temperature fluctuations because of the semiconductor characteristics of the microbolometer array. The relationship between the microbolometric infrared responsivity and substrate temperature is theoretically discussed in this paper. Above the discussion, a new substrate temperature compensation method is proposed for microbolometric focal plane array without TEC. The microbolometric focal plane array is based on a kind of high-speed CMOS readout integrated circuit, of which the microbolometric infrared response voltage signal can be directly read out without infrared response current integration. The bias current for the microbolometer with the proposed substrate temperature compensation method can be adjusted according to the substrate temperature change to achieve a steady microbolometric infrared responsivity. This kind of substrate temperature compensation method is theoretically strict and has been experimentally verified in our laboratory, which is potential for future high-speed, lower-power and small-pixel microbolometric focal plane array.
Publication Year: 2019
Publication Date: 2019-05-13
Language: en
Type: article
Indexed In: ['crossref']
Access and Citation
Cited By Count: 3
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